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processor core testing (keyword)
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1
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
112
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor architecture
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
air core coupled coils
17.
core collection
18.
core loss
19.
core losses
20.
core shell heterostructures
21.
core short-circuit
22.
core/shell
23.
core-less induction furnace
24.
core-shell nanoparticles
25.
core-shell particle
26.
cpu core
27.
crypto core
28.
DPP core ontology
29.
ferromagnetic core
30.
firn core
31.
many-core
32.
Ohesaare core
33.
sediment core
34.
sediment core records
35.
soft magnetic core
36.
toroidal magnetic core
37.
accelerated testing
38.
acoustomechanical testing
39.
anaerobic testing
40.
aspect-oriented testing
41.
at-speed testing
42.
benchmark testing
43.
Berridge testing
44.
burst testing
45.
cancer genomic testing
46.
compliance testing
47.
compositional testing
48.
computer aided testing
49.
conformance testing
50.
courses on electronic testing and design
51.
cybersecurity testing
52.
D. non-destructive testing
53.
deformation testing
54.
design field testing
55.
destructive testing
56.
eddy current testing
57.
eddy current testing (ECT)
58.
erosion testing
59.
fatigue testing
60.
fire testing
61.
hierarchical testing
62.
hypotheses testing
63.
Implementation-Independent Testing of Microprocessors
64.
integration testing
65.
laboratory scale testing
66.
load testing
67.
macro mechanical testing and green surface tribology
68.
material testing
69.
materials testing
70.
measurement and testing
71.
mechanical testing
72.
memory testing
73.
metamorphic testing
74.
microprocessor testing
75.
model based testing
76.
model-based mutation testing
77.
model-based testing
78.
mutation testing
79.
network-testing
80.
non destructive testing
81.
nondestructive testing
82.
non-destructive testing
83.
on-site testing
84.
pin on disc wear testing
85.
PMU calibration testing
86.
PMU testing
87.
point-of-care testing
88.
real-time HiL testing
89.
regression testing
90.
robustness testing
91.
safety and security testing
92.
scenario testing
93.
scratch testing
94.
security testing
95.
small-scale fire testing
96.
software testing
97.
software-in-the-loop (SIL) testing
98.
stand-alone testing
99.
stress-testing
100.
substation testing methods
101.
system testing
102.
tensile testing
103.
testing
104.
testing methods
105.
testing of digital devices
106.
testing of generator
107.
testing of phasor measurement units
108.
two-dimensional array testing
109.
wafer testing
110.
wear testing
111.
vibration testing
112.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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