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processor core testing (keyword)
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book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
107
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor architecture
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
air core coupled coils
17.
core collection
18.
core loss
19.
core losses
20.
core shell heterostructures
21.
core short-circuit
22.
core/shell
23.
core-less induction furnace
24.
core-shell nanoparticles
25.
core-shell particle
26.
cpu core
27.
crypto core
28.
ferromagnetic core
29.
firn core
30.
many-core
31.
Ohesaare core
32.
sediment core
33.
sediment core records
34.
toroidal magnetic core
35.
accelerated testing
36.
acoustomechanical testing
37.
anaerobic testing
38.
aspect-oriented testing
39.
at-speed testing
40.
benchmark testing
41.
Berridge testing
42.
cancer genomic testing
43.
compliance testing
44.
compositional testing
45.
computer aided testing
46.
conformance testing
47.
courses on electronic testing and design
48.
cybersecurity testing
49.
D. non-destructive testing
50.
design field testing
51.
destructive testing
52.
eddy current testing
53.
eddy current testing (ECT)
54.
erosion testing
55.
fatigue testing
56.
fire testing
57.
hierarchical testing
58.
hypotheses testing
59.
integration testing
60.
laboratory scale testing
61.
load testing
62.
macro mechanical testing and green surface tribology
63.
material testing
64.
materials testing
65.
measurement and testing
66.
mechanical testing
67.
memory testing
68.
metamorphic testing
69.
microprocessor testing
70.
model based testing
71.
model-based mutation testing
72.
model-based testing
73.
mutation testing
74.
network-testing
75.
non destructive testing
76.
nondestructive testing
77.
non-destructive testing
78.
on-site testing
79.
pin on disc wear testing
80.
PMU calibration testing
81.
PMU testing
82.
point-of-care testing
83.
real-time HiL testing
84.
regression testing
85.
robustness testing
86.
safety and security testing
87.
scenario testing
88.
scratch testing
89.
security testing
90.
small-scale fire testing
91.
software testing
92.
software-in-the-loop (SIL) testing
93.
stand-alone testing
94.
stress-testing
95.
substation testing methods
96.
system testing
97.
tensile testing
98.
testing
99.
testing methods
100.
testing of digital devices
101.
testing of generator
102.
testing of phasor measurement units
103.
two-dimensional array testing
104.
wafer testing
105.
wear testing
106.
vibration testing
107.
virtual testing
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