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processor core testing (keyword)
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book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
99
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
crypto processor
5.
digital signal processor (DSP)
6.
multicore processor
7.
multi-processor
8.
multi-processor system-on-chip
9.
multi-processor system-on-chips (MPSoCs)
10.
Muti-Processor System on Chip (MPSoC)
11.
processor designs
12.
processor-centric board
13.
processor-centric board test
14.
core collection
15.
core loss
16.
core losses
17.
core shell heterostructures
18.
core short-circuit
19.
core/shell
20.
core-less induction furnace
21.
core-shell nanoparticles
22.
cpu core
23.
crypto core
24.
ferromagnetic core
25.
firn core
26.
many-core
27.
Ohesaare core
28.
sediment core records
29.
toroidal magnetic core
30.
accelerated testing
31.
acoustomechanical testing
32.
anaerobic testing
33.
aspect-oriented testing
34.
at-speed testing
35.
benchmark testing
36.
Berridge testing
37.
cancer genomic testing
38.
compliance testing
39.
compositional testing
40.
computer aided testing
41.
conformance testing
42.
courses on electronic testing and design
43.
cybersecurity testing
44.
D. non-destructive testing
45.
design field testing
46.
eddy current testing
47.
erosion testing
48.
fatigue testing
49.
fire testing
50.
hierarchical testing
51.
hypotheses testing
52.
integration testing
53.
laboratory scale testing
54.
load testing
55.
macro mechanical testing and green surface tribology
56.
material testing
57.
materials testing
58.
measurement and testing
59.
mechanical testing
60.
memory testing
61.
metamorphic testing
62.
microprocessor testing
63.
model based testing
64.
model-based mutation testing
65.
model-based testing
66.
mutation testing
67.
network-testing
68.
non destructive testing
69.
nondestructive testing
70.
non-destructive testing
71.
on-site testing
72.
pin on disc wear testing
73.
PMU calibration testing
74.
PMU testing
75.
point-of-care testing
76.
real-time HiL testing
77.
regression testing
78.
robustness testing
79.
scenario testing
80.
scratch testing
81.
security testing
82.
small-scale fire testing
83.
software testing
84.
software-in-the-loop (SIL) testing
85.
stand-alone testing
86.
stress-testing
87.
substation testing methods
88.
system testing
89.
tensile testing
90.
testing
91.
testing methods
92.
testing of digital devices
93.
testing of generator
94.
testing of phasor measurement units
95.
two-dimensional array testing
96.
wafer testing
97.
wear testing
98.
vibration testing
99.
virtual testing
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