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processor core testing (keyword)
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book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
104
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor architecture
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
air core coupled coils
17.
core collection
18.
core loss
19.
core losses
20.
core shell heterostructures
21.
core short-circuit
22.
core/shell
23.
core-less induction furnace
24.
core-shell nanoparticles
25.
cpu core
26.
crypto core
27.
ferromagnetic core
28.
firn core
29.
many-core
30.
Ohesaare core
31.
sediment core records
32.
toroidal magnetic core
33.
accelerated testing
34.
acoustomechanical testing
35.
anaerobic testing
36.
aspect-oriented testing
37.
at-speed testing
38.
benchmark testing
39.
Berridge testing
40.
cancer genomic testing
41.
compliance testing
42.
compositional testing
43.
computer aided testing
44.
conformance testing
45.
courses on electronic testing and design
46.
cybersecurity testing
47.
D. non-destructive testing
48.
design field testing
49.
destructive testing
50.
eddy current testing
51.
eddy current testing (ECT)
52.
erosion testing
53.
fatigue testing
54.
fire testing
55.
hierarchical testing
56.
hypotheses testing
57.
integration testing
58.
laboratory scale testing
59.
load testing
60.
macro mechanical testing and green surface tribology
61.
material testing
62.
materials testing
63.
measurement and testing
64.
mechanical testing
65.
memory testing
66.
metamorphic testing
67.
microprocessor testing
68.
model based testing
69.
model-based mutation testing
70.
model-based testing
71.
mutation testing
72.
network-testing
73.
non destructive testing
74.
nondestructive testing
75.
non-destructive testing
76.
on-site testing
77.
pin on disc wear testing
78.
PMU calibration testing
79.
PMU testing
80.
point-of-care testing
81.
real-time HiL testing
82.
regression testing
83.
robustness testing
84.
scenario testing
85.
scratch testing
86.
security testing
87.
small-scale fire testing
88.
software testing
89.
software-in-the-loop (SIL) testing
90.
stand-alone testing
91.
stress-testing
92.
substation testing methods
93.
system testing
94.
tensile testing
95.
testing
96.
testing methods
97.
testing of digital devices
98.
testing of generator
99.
testing of phasor measurement units
100.
two-dimensional array testing
101.
wafer testing
102.
wear testing
103.
vibration testing
104.
virtual testing
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