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processor core testing (keyword)
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1
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
113
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor architecture
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
air core
17.
air core coupled coils
18.
core collection
19.
core loss
20.
core losses
21.
core shell heterostructures
22.
core short-circuit
23.
core/shell
24.
core-less induction furnace
25.
core-shell nanoparticles
26.
core-shell particle
27.
cpu core
28.
crypto core
29.
DPP core ontology
30.
ferromagnetic core
31.
firn core
32.
many-core
33.
Ohesaare core
34.
sediment core
35.
sediment core records
36.
soft magnetic core
37.
toroidal magnetic core
38.
accelerated testing
39.
acoustomechanical testing
40.
anaerobic testing
41.
aspect-oriented testing
42.
at-speed testing
43.
benchmark testing
44.
Berridge testing
45.
burst testing
46.
cancer genomic testing
47.
compliance testing
48.
compositional testing
49.
computer aided testing
50.
conformance testing
51.
courses on electronic testing and design
52.
cybersecurity testing
53.
D. non-destructive testing
54.
deformation testing
55.
design field testing
56.
destructive testing
57.
eddy current testing
58.
eddy current testing (ECT)
59.
erosion testing
60.
fatigue testing
61.
fire testing
62.
hierarchical testing
63.
hypotheses testing
64.
Implementation-Independent Testing of Microprocessors
65.
integration testing
66.
laboratory scale testing
67.
load testing
68.
macro mechanical testing and green surface tribology
69.
material testing
70.
materials testing
71.
measurement and testing
72.
mechanical testing
73.
memory testing
74.
metamorphic testing
75.
microprocessor testing
76.
model based testing
77.
model-based mutation testing
78.
model-based testing
79.
mutation testing
80.
network-testing
81.
non destructive testing
82.
nondestructive testing
83.
non-destructive testing
84.
on-site testing
85.
pin on disc wear testing
86.
PMU calibration testing
87.
PMU testing
88.
point-of-care testing
89.
real-time HiL testing
90.
regression testing
91.
robustness testing
92.
safety and security testing
93.
scenario testing
94.
scratch testing
95.
security testing
96.
small-scale fire testing
97.
software testing
98.
software-in-the-loop (SIL) testing
99.
stand-alone testing
100.
stress-testing
101.
substation testing methods
102.
system testing
103.
tensile testing
104.
testing
105.
testing methods
106.
testing of digital devices
107.
testing of generator
108.
testing of phasor measurement units
109.
two-dimensional array testing
110.
wafer testing
111.
wear testing
112.
vibration testing
113.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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