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book article
A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routers
Saltarelli, Pietro
;
Niazmand, Behrad
;
Raik, Jaan
;
Govind, Vineeth
;
Hollstein, Thomas
;
Jervan, Gert
;
Hariharan, Ranganathan
NOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 2015
2015
/
[8] p. : ill
http://dx.doi.org/10.1145/2786572.2788713
book article
Number of records 1, displaying
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keyword
166
1.
embedded test
2.
Embedded figures test
3.
dependable embedded systems
4.
digital embedded work
5.
distributed embedded systems
6.
embedded control
7.
embedded deep learning
8.
embedded devices
9.
embedded electronics
10.
Embedded hardware
11.
embedded instrumentation
12.
embedded instruments
13.
embedded networks/NoC
14.
embedded platform
15.
embedded sensor
16.
embedded sensors
17.
embedded software
18.
embedded system
19.
embedded systems
20.
FPGA-Embedded Instrument
21.
laminate embedded printed circuit board
22.
lowpower embedded system
23.
accelerated shelf-life test
24.
adaptive test strategy generation
25.
antigen test
26.
Applications in Test Engineering
27.
ASTM G65 dry sand rubber wheel abrasion test
28.
Automated Synthesis of Software-based Self-test
29.
automated test environment
30.
automated test pattern generation
31.
automatic test case generation
32.
automatic test pattern generation
33.
automatic test program generation
34.
Auvergne test-bed
35.
battery test
36.
behavioral test
37.
behaviour level test generation
38.
bending test
39.
bit-error rate test
40.
Board and System Test
41.
board test
42.
bounds test
43.
built-in self-test
44.
capillary condensation redistribution test
45.
chi-square test
46.
closed bottle test
47.
cognitive screening test
48.
compartment fire test
49.
compartment test
50.
cone penetration test (CPT)
51.
COVID-19 antigen test
52.
cutting test
53.
cybersecurity test bed
54.
DDR4 interconnect test
55.
design and test
56.
design-for-test
57.
deterministic test sequences
58.
diagnostic test
59.
digital test
60.
Digital test and testable design
61.
double-pulse test
62.
drawing test
63.
dry droplet antimicrobial test
64.
fan pressurisation test
65.
final test result prediction
66.
four-point bending test
67.
FPGA based test
68.
FPGA-Assisted Test
69.
FPGA-centric test
70.
functional self-test
71.
functional test generation
72.
Granger causality test
73.
hardness test
74.
Hierarchical Multi-level Test Generation
75.
high-level synthesis for test
76.
high-level test data generation
77.
highlevel test generation
78.
high-speed serial link test
79.
IEEE 9 bus test system
80.
implementation-independent test generation
81.
in situ tensile test in SEM
82.
industrial field test
83.
in-situ tensile test in SEM
84.
Johansen cointegration test
85.
Kolmogorov-Smirnov test
86.
load test
87.
logic built-in self-test
88.
Luria alternating series test
89.
Mann–Kendall test
90.
Mann-Kendall trend test
91.
memory interconnect test
92.
microprocessor test
93.
Model test
94.
multiplier test
95.
offline test generation
96.
orthogonal test
97.
package test analysis
98.
parallel design and test
99.
performance test
100.
piezocone penetration test (CPTu)
101.
Point Load Test index
102.
pressurisation test
103.
processor-centric board test
104.
progressive damage test
105.
Provably Correct Test Development
106.
provably correct test generation
107.
pseudo-exhaustive test
108.
purity test
109.
real-time room temperature test
110.
rolling thin film oven test
111.
rtioco-based timed test sequences
112.
seasonal Mann Kendall test
113.
seismic piezocone penetration test
114.
self-test
115.
self-test architectures
116.
sentence writing test
117.
serial sevens test
118.
ship towing test tank
119.
similar material simulation test
120.
small-scale fire test
121.
small‐scale test
122.
software based self-test
123.
software-based self-test
124.
software-based self-test (SBST)
125.
soil phosphorus (P) test
126.
standard test method
127.
static load test
128.
static-dynamic probing test (SDT)
129.
stress test
130.
system level test
131.
teaching design and test of systems
132.
tensile test
133.
tensile test
134.
test
135.
Test Adapters
136.
test and evaluation platform
137.
test automation
138.
test bench
139.
test coverage
140.
test driven development
141.
test driven modelling
142.
test embankment
143.
test equipment
144.
test generation
145.
test generation and fault diagnosis
146.
Test Group Generation for Detecting Multiple Faults
147.
test groups
148.
test model design
149.
test optimization
150.
test packets
151.
test path synthesis
152.
test patterns
153.
test point insertion
154.
test program generation
155.
test reference year
156.
test replication
157.
test scenario description language
158.
test-bed
159.
test-chips
160.
test-house
161.
test-pattern
162.
test-suite reduction
163.
Three-point bending test
164.
unit root test
165.
usability platform test
166.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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