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book article
A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routers
Saltarelli, Pietro
;
Niazmand, Behrad
;
Raik, Jaan
;
Govind, Vineeth
;
Hollstein, Thomas
;
Jervan, Gert
;
Hariharan, Ranganathan
NOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 2015
2015
/
[8] p. : ill
http://dx.doi.org/10.1145/2786572.2788713
book article
Number of records 1, displaying
1 - 1
keyword
163
1.
embedded test
2.
dependable embedded systems
3.
digital embedded work
4.
distributed embedded systems
5.
embedded control
6.
embedded deep learning
7.
embedded devices
8.
embedded electronics
9.
Embedded hardware
10.
embedded instrumentation
11.
embedded instruments
12.
embedded networks/NoC
13.
embedded platform
14.
embedded sensor
15.
embedded sensors
16.
embedded software
17.
embedded system
18.
embedded systems
19.
FPGA-Embedded Instrument
20.
laminate embedded printed circuit board
21.
lowpower embedded system
22.
accelerated shelf-life test
23.
adaptive test strategy generation
24.
antigen test
25.
Applications in Test Engineering
26.
ASTM G65 dry sand rubber wheel abrasion test
27.
Automated Synthesis of Software-based Self-test
28.
automated test environment
29.
automated test pattern generation
30.
automatic test case generation
31.
automatic test pattern generation
32.
automatic test program generation
33.
Auvergne test-bed
34.
battery test
35.
behavioral test
36.
behaviour level test generation
37.
bending test
38.
bit-error rate test
39.
Board and System Test
40.
board test
41.
bounds test
42.
built-in self-test
43.
capillary condensation redistribution test
44.
chi-square test
45.
closed bottle test
46.
cognitive screening test
47.
compartment fire test
48.
compartment test
49.
cone penetration test (CPT)
50.
COVID-19 antigen test
51.
cutting test
52.
cybersecurity test bed
53.
DDR4 interconnect test
54.
design and test
55.
design-for-test
56.
deterministic test sequences
57.
diagnostic test
58.
digital test
59.
Digital test and testable design
60.
double-pulse test
61.
drawing test
62.
dry droplet antimicrobial test
63.
fan pressurisation test
64.
final test result prediction
65.
four-point bending test
66.
FPGA based test
67.
FPGA-Assisted Test
68.
FPGA-centric test
69.
functional self-test
70.
functional test generation
71.
Granger causality test
72.
hardness test
73.
Hierarchical Multi-level Test Generation
74.
high-level synthesis for test
75.
high-level test data generation
76.
highlevel test generation
77.
high-speed serial link test
78.
IEEE 9 bus test system
79.
implementation-independent test generation
80.
in situ tensile test in SEM
81.
industrial field test
82.
in-situ tensile test in SEM
83.
Johansen cointegration test
84.
Kolmogorov-Smirnov test
85.
load test
86.
logic built-in self-test
87.
Luria alternating series test
88.
Mann–Kendall test
89.
Mann-Kendall trend test
90.
memory interconnect test
91.
microprocessor test
92.
Model test
93.
multiplier test
94.
offline test generation
95.
orthogonal test
96.
package test analysis
97.
parallel design and test
98.
performance test
99.
piezocone penetration test (CPTu)
100.
Point Load Test index
101.
pressurisation test
102.
processor-centric board test
103.
progressive damage test
104.
provably correct test generation
105.
pseudo-exhaustive test
106.
purity test
107.
real-time room temperature test
108.
rolling thin film oven test
109.
rtioco-based timed test sequences
110.
seasonal Mann Kendall test
111.
seismic piezocone penetration test
112.
self-test
113.
self-test architectures
114.
sentence writing test
115.
serial sevens test
116.
ship towing test tank
117.
similar material simulation test
118.
small-scale fire test
119.
small‐scale test
120.
software based self-test
121.
software-based self-test
122.
software-based self-test (SBST)
123.
soil phosphorus (P) test
124.
standard test method
125.
static load test
126.
static-dynamic probing test (SDT)
127.
stress test
128.
system level test
129.
teaching design and test of systems
130.
tensile test
131.
tensile test
132.
test
133.
test and evaluation platform
134.
test automation
135.
test bench
136.
test coverage
137.
test driven development
138.
test driven modelling
139.
test embankment
140.
test equipment
141.
test generation
142.
test generation and fault diagnosis
143.
Test Group Generation for Detecting Multiple Faults
144.
test groups
145.
test model design
146.
test optimization
147.
test packets
148.
test path synthesis
149.
test patterns
150.
test point insertion
151.
test program generation
152.
test reference year
153.
test replication
154.
test scenario description language
155.
test-bed
156.
test-chips
157.
test-house
158.
test-pattern
159.
test-suite reduction
160.
Three-point bending test
161.
unit root test
162.
usability platform test
163.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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