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book article
Combined pseudo-exhaustive and deterministic testing of array multipliers
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings
2018
/
6 p. : ill
https://doi.org/10.1109/AQTR.2018.8402708
book article
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keyword
127
1.
extended fault class
2.
adaptive chaotic class topper optimization (AC-CTO)
3.
ameliorated quantum class topper optimization (A-QCTO)
4.
class
5.
class imbalance
6.
class imbalance problem
7.
class topper optimization
8.
class topper optimization (CTO)
9.
class-AB
10.
energy class
11.
ice class
12.
ideal-determined class
13.
latent class mixed logit
14.
multi-class support vector machine (m-SVM)
15.
capacitor assisted extended boost qZSI
16.
diode assisted extended boost qZSI
17.
extended BBR
18.
extended bending beam rheometer
19.
extended boost qZSI
20.
extended coordinate change
21.
extended coordinate transformation
22.
extended enterprise
23.
Extended Kalman Filter (EKF)
24.
extended observer form
25.
extended producer responsibility
26.
extended reality
27.
extended regressions
28.
process modeling and information systems within the extended enterprise
29.
AI-based fault detection
30.
asynchronous fault detection
31.
automatic fault diagnosis
32.
bearing fault diagnosis
33.
bi-directional fault monitoring devices
34.
conditional fault collapsing
35.
control fault models
36.
critical path fault tracing
37.
cross-layer fault tolerance
38.
cross-layered fault management
39.
fault currents
40.
fault analysis
41.
fault analysis model
42.
fault classification
43.
fault classification
44.
fault collapsing
45.
fault compensation
46.
fault coverage
47.
fault current and voltage measurements
48.
Fault current limite
49.
fault current limiter
50.
fault detection
51.
fault detection and classification
52.
fault detection and diagnoses
53.
fault detection and diagnosis
54.
fault detection and diagnostics (FDD)
55.
fault diagnosis
56.
fault diagnostic
57.
fault diagnostic resolution
58.
fault diagnostics
59.
fault dignosis
60.
fault effects
61.
fault emulation
62.
fault equivalence and dominance
63.
fault handling
64.
fault handling strategy
65.
fault indicator
66.
fault injection
67.
Fault Injection Simulation
68.
fault Interruption
69.
fault localization
70.
fault location
71.
fault management
72.
fault masking
73.
fault modeling
74.
fault models
75.
fault monitoring
76.
fault prediction
77.
fault protection
78.
fault redundancy
79.
fault resilience
80.
fault ride through
81.
Fault ride through enhancement
82.
fault seeding
83.
fault signal
84.
fault simulastion
85.
fault simulation
86.
fault simulation with critical path tracing
87.
fault tolerance
88.
fault tolerant
89.
fault tolerant computer systems
90.
fault tolerant control
91.
fault tolerant operation
92.
fault tolerant router design
93.
fault tolerant systems
94.
fault tree analysis
95.
fault-injection attack
96.
fault-plane solution
97.
fault-resilience
98.
fault-resistant
99.
fault-ride-through (FRT)
100.
fault-tolerance
101.
fault-tolerant
102.
Fault-tolerant (FT) converters
103.
fault-tolerant control
104.
fault-tolerant converter
105.
functional fault model
106.
high-level control fault model
107.
high-level fault coverage
108.
high-level fault model
109.
high-level fault simulation
110.
high-level functional fault model
111.
hybrid fault detection
112.
Katun fault
113.
low-level fault redundancy
114.
no fault found
115.
No-Fault-Found
116.
open circuit fault
117.
Parallel Fault Simulation with Critical Path Backtracing
118.
parallel fault-simulation
119.
photovoltaic fault detection algorithms
120.
PV fault classification
121.
short circuit fault
122.
spectrum-based fault localization
123.
stacking fault
124.
stuck-at fault model
125.
test generation and fault diagnosis
126.
transient fault mitigation
127.
transmission lines fault
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