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1

book article

Accelerating transient fault injection campaigns by using Dynamic HDL SlicingBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2019.8906932

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2

journal article EST / journal article ENG

Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
3

book article

Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
4

book article

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
5

book article

Efficient fault injection based on dynamic HDL slicing techniqueBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 52-53 : ill https://doi.org/10.1109/IOLTS.2019.8854419

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
6

journal article EST / journal article ENG

EFIC-ME : a fast emulation based fault injection control and monitoring enhancementAbideen, Zain Ul; Rashid, Muhammad HaroonIEEE Access2020 / p. 207705-207716 https://doi.org/10.1109/ACCESS.2020.3038198 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
7

book article

Machine learning to tackle the challenges of transient and soft errors in complex circuitsLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece2019 / p. 7-14 : ill https://doi.org/10.1109/IOLTS.2019.8854423

book article
8

book article

On the estimation of complex circuits functional failure rate by machine learning techniquesLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings2019 / p. 35-41 : ill https://doi.org/10.1109/DSN-S.2019.00021

book article
Related publications 1
- A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
9

book article

Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
10

journal article

SALSy : security-aware layout synthesisEslami, Mohammad; Perez, Tiago Diadami; Pagliarini, Samuel NascimentoarXiv.org2024 / 13 p. : ill https://doi.org/10.48550/arXiv.2308.06201

journal article
Related publications 1
- On the use of defensive schemes for hardware security = Kaitseskeemid riistvara turvalisuse tagamiseks
11

journal article EST / journal article ENG

A systematic literature review on hardware reliability assessment methods for deep neural networksAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimACM Computing Surveys2024 / art. 141, 39 p. : ill https://doi.org/10.1145/3638242 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Related publications 2
- Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
- Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
12

book article

Use of formal methods for verification and optimization of fault lists in the scope of ISO26262Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://repository.tudelft.nl/islandora/object/uuid%3Adbd7f22d-0324-45f5-9180-8fe3fc95a9ce

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

Number of records 12, displaying 1 - 12

1. fault injection
2. Fault Injection Simulation
3. fault-injection attack
4. false data injection attack
5. fiber-reinforced composites and injection molding
6. Gate Injection Transistor (GIT)
7. gating-aware error injection
8. ghost injection attack
9. injection molding
10. injection of technical water
11. manual hydrodynamic injection
12. power injection
13. reactive power injection
14. zero injection phase
15. AI-based fault detection
16. asynchronous fault detection
17. automatic fault diagnosis
18. bearing fault diagnosis
19. bi-directional fault monitoring devices
20. conditional fault collapsing
21. control fault models
22. critical path fault tracing
23. cross-layer fault tolerance
24. cross-layered fault management
25. extended fault class
26. fault currents
27. fault analysis
28. fault analysis model
29. fault classification
30. fault classification
31. fault collapsing
32. fault compensation
33. fault coverage
34. fault current and voltage measurements
35. Fault current limite
36. fault current limiter
37. fault detection
38. fault detection and classification
39. fault detection and diagnoses
40. fault detection and diagnosis
41. fault detection and diagnostics (FDD)
42. fault diagnosis
43. fault diagnostic
44. fault diagnostic resolution
45. fault diagnostics
46. fault dignosis
47. fault effects
48. fault emulation
49. fault equivalence and dominance
50. fault handling
51. fault handling strategy
52. fault indicator
53. fault Interruption
54. fault localization
55. fault location
56. fault management
57. fault masking
58. fault modeling
59. fault models
60. fault monitoring
61. fault prediction
62. fault protection
63. fault redundancy
64. fault resilience
65. fault ride through
66. Fault ride through enhancement
67. fault signal
68. fault simulastion
69. fault simulation
70. fault simulation with critical path tracing
71. fault tolerance
72. fault tolerant
73. fault tolerant control
74. fault tolerant operation
75. fault tolerant router design
76. fault tolerant systems
77. fault tree analysis
78. fault-plane solution
79. fault-resilience
80. fault-resistant
81. fault-ride-through (FRT)
82. fault-tolerance
83. fault-tolerant
84. Fault-tolerant (FT) converters
85. fault-tolerant control
86. fault-tolerant converter
87. functional fault model
88. high-level control fault model
89. high-level fault coverage
90. high-level fault model
91. high-level fault simulation
92. high-level functional fault model
93. hybrid fault detection
94. Katun fault
95. low-level fault redundancy
96. no fault found
97. No-Fault-Found
98. open circuit fault
99. Parallel Fault Simulation with Critical Path Backtracing
100. parallel fault-simulation
101. photovoltaic fault detection algorithms
102. PV fault classification
103. short circuit fault
104. spectrum-based fault localization
105. stacking fault
106. stuck-at fault model
107. test generation and fault diagnosis
108. transient fault mitigation
109. transmission lines fault

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