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journal article EST / journal article ENG

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
2

book article

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

book article
3

book article

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

book article
4

book article

Mixed-level identification of fault redundancy in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, JaanLATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 20192019 / 6 p. : ill https://doi.org/10.1109/LATW.2019.8704591

book article
5

book article

True path tracing in structurally synthesized BDDs for testability analysis of digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Oyeniran, Adeboye Stephen; Jenihhin, MaksimEuromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings2019 / p. 492-499 : ill https://doi.org/10.1109/DSD.2019.00077

book article

Number of records 5, displaying 1 - 5

1. fault redundancy
2. low-level fault redundancy
3. active redundancy
4. redundancy
5. triple modular redundancy
6. (N+1) redundancy
7. asynchronous fault detection
8. automatic fault diagnosis
9. bearing fault diagnosis
10. bi-directional fault monitoring devices
11. conditional fault collapsing
12. control fault models
13. critical path fault tracing
14. cross-layer fault tolerance
15. cross-layered fault management
16. extended fault class
17. fault currents
18. fault analysis
19. fault analysis model
20. fault classification
21. fault classification
22. fault collapsing
23. fault compensation
24. fault coverage
25. fault current and voltage measurements
26. Fault current limite
27. fault current limiter
28. fault detection
29. fault detection and diagnoses
30. fault detection and diagnosis
31. fault diagnosis
32. fault diagnostic
33. fault diagnostic resolution
34. fault diagnostics
35. fault dignosis
36. fault effects
37. fault emulation
38. fault equivalence and dominance
39. fault handling
40. fault handling strategy
41. fault indicator
42. fault injection
43. Fault Injection Simulation
44. fault Interruption
45. fault localization
46. fault location
47. fault management
48. fault masking
49. fault modeling
50. fault models
51. fault monitoring
52. fault prediction
53. fault protection
54. fault resilience
55. fault ride through
56. Fault ride through enhancement
57. fault signal
58. fault simulastion
59. fault simulation
60. fault simulation with critical path tracing
61. fault tolerance
62. fault tolerant
63. fault tolerant control
64. fault tolerant operation
65. fault tolerant router design
66. fault tolerant systems
67. fault tree analysis
68. fault-injection attack
69. fault-plane solution
70. fault-resilience
71. fault-resistant
72. fault-ride-through (FRT)
73. fault-tolerance
74. fault-tolerant
75. Fault-tolerant (FT) converters
76. fault-tolerant control
77. fault-tolerant converter
78. functional fault model
79. high-level control fault model
80. high-level fault coverage
81. high-level fault model
82. high-level fault simulation
83. high-level functional fault model
84. Katun fault
85. no fault found
86. No-Fault-Found
87. open circuit fault
88. Parallel Fault Simulation with Critical Path Backtracing
89. parallel fault-simulation
90. short circuit fault
91. spectrum-based fault localization
92. stacking fault
93. stuck-at fault model
94. test generation and fault diagnosis
95. transient fault mitigation
96. transmission lines fault

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