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journal article EST / journal article ENG

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
2

book article

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

book article
3

book article

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

book article
4

book article

Mixed-level identification of fault redundancy in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, JaanLATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 20192019 / 6 p. : ill https://doi.org/10.1109/LATW.2019.8704591

book article
5

book article

True path tracing in structurally synthesized BDDs for testability analysis of digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Oyeniran, Adeboye Stephen; Jenihhin, MaksimEuromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings2019 / p. 492-499 : ill https://doi.org/10.1109/DSD.2019.00077

book article

Number of records 5, displaying 1 - 5

1. fault redundancy
2. low-level fault redundancy
3. active redundancy
4. redundancy
5. triple modular redundancy
6. (N+1) redundancy
7. AI-based fault detection
8. asynchronous fault detection
9. automatic fault diagnosis
10. bearing fault diagnosis
11. bi-directional fault monitoring devices
12. conditional fault collapsing
13. control fault models
14. critical path fault tracing
15. cross-layer fault tolerance
16. cross-layered fault management
17. extended fault class
18. fault currents
19. fault analysis
20. fault analysis model
21. fault classification
22. fault classification
23. fault collapsing
24. fault compensation
25. fault coverage
26. fault current and voltage measurements
27. Fault current limite
28. fault current limiter
29. fault detection
30. fault detection and classification
31. fault detection and diagnoses
32. fault detection and diagnosis
33. fault detection and diagnostics (FDD)
34. fault diagnosis
35. fault diagnostic
36. fault diagnostic resolution
37. fault diagnostics
38. fault dignosis
39. fault effects
40. fault emulation
41. fault equivalence and dominance
42. fault handling
43. fault handling strategy
44. fault indicator
45. fault injection
46. Fault Injection Simulation
47. fault Interruption
48. fault localization
49. fault location
50. fault management
51. fault masking
52. fault modeling
53. fault models
54. fault monitoring
55. fault prediction
56. fault protection
57. fault resilience
58. fault ride through
59. Fault ride through enhancement
60. fault signal
61. fault simulastion
62. fault simulation
63. fault simulation with critical path tracing
64. fault tolerance
65. fault tolerant
66. fault tolerant control
67. fault tolerant operation
68. fault tolerant router design
69. fault tolerant systems
70. fault tree analysis
71. fault-injection attack
72. fault-plane solution
73. fault-resilience
74. fault-resistant
75. fault-ride-through (FRT)
76. fault-tolerance
77. fault-tolerant
78. Fault-tolerant (FT) converters
79. fault-tolerant control
80. fault-tolerant converter
81. functional fault model
82. high-level control fault model
83. high-level fault coverage
84. high-level fault model
85. high-level fault simulation
86. high-level functional fault model
87. hybrid fault detection
88. Katun fault
89. no fault found
90. No-Fault-Found
91. open circuit fault
92. Parallel Fault Simulation with Critical Path Backtracing
93. parallel fault-simulation
94. photovoltaic fault detection algorithms
95. PV fault classification
96. short circuit fault
97. spectrum-based fault localization
98. stacking fault
99. stuck-at fault model
100. test generation and fault diagnosis
101. transient fault mitigation
102. transmission lines fault

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