Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
fault simulation (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
14
Look more..
(1/184)
Export
export all inquiry results
(14)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Accelerating transient fault injection campaigns by using Dynamic HDL Slicing
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore
2019
/
7 p. : ill
https://doi.org/10.1109/NORCHIP.2019.8906932
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2
book article
Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600967
book article
3
journal article
DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN accelerators
Taheri, Mahdi
;
Riazati, Mohamad
;
Ahmadilivani, Mohammad Hasan
;
Jenihhin, Maksim
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Sjödin, Mikael
;
Lisper, Björn
arXiv.org
2023
/
8 p. : ill
https://doi.org/10.48550/arXiv.2303.08226
journal article
4
journal article
Distributed approach for parallel exact critical path tracing fault simulation
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
International journal of microelectronics and computer science
2010
/
p. 165-174 : ill
journal article
5
journal article
Distributed fault simulation with collaborative load balancing for VLSI circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Scalable computing : practice and experience
2011
/
p. 153-163 : ill
journal article
6
book article
Efficient fault injection based on dynamic HDL slicing technique
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece
2019
/
p. 52-53 : ill
https://doi.org/10.1109/IOLTS.2019.8854419
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
7
book article
Fast RTL fault simulation using decision diagrams and bitwise set operations
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada
2011
/
p. 164-170
https://ieeexplore.ieee.org/document/6104440
book article
8
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
9
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
10
book article
Modeling sequential circuits with shared structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Marenkov, Mihhail
;
Mironov, Dmitri
;
Viies, Vladimir
Proceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 2014
2014
/
p. 130-135 : ill
book article
11
book article
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway
2015
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2015.7364406
book article
12
book article EST
/
book article ENG
Special session: reliability assessment recipes for DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Bosio, Alberto
;
Deveautour, Bastien
;
Dos Santos, Fernando Fernandes
;
Guerrero-Balaguera, Juan-David
;
Jenihhin, Maksim
;
Kritikakou, Angeliki
;
Sierra, Robert Limas
;
Raik, Jaan
;
Taheri, Mahdi
42nd IEEE VLSI Test Symposium, VTS 2024
2024
/
11 p. : ill
https://doi.org/10.1109/VTS60656.2024.10538707
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
13
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
14
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 14, displaying
1 - 14
keyword
184
1.
fault simulation
2.
fault simulation with critical path tracing
3.
high-level fault simulation
4.
Parallel Fault Simulation with Critical Path Backtracing
5.
parallel fault-simulation
6.
Fault Injection Simulation
7.
asynchronous fault detection
8.
automatic fault diagnosis
9.
bearing fault diagnosis
10.
bi-directional fault monitoring devices
11.
conditional fault collapsing
12.
control fault models
13.
critical path fault tracing
14.
cross-layer fault tolerance
15.
cross-layered fault management
16.
extended fault class
17.
fault currents
18.
fault analysis
19.
fault analysis model
20.
fault classification
21.
fault classification
22.
fault collapsing
23.
fault compensation
24.
fault coverage
25.
fault current and voltage measurements
26.
Fault current limite
27.
fault current limiter
28.
fault detection
29.
fault detection and diagnoses
30.
fault detection and diagnosis
31.
fault diagnosis
32.
fault diagnostic
33.
fault diagnostic resolution
34.
fault diagnostics
35.
fault dignosis
36.
fault effects
37.
fault emulation
38.
fault equivalence and dominance
39.
fault handling
40.
fault handling strategy
41.
fault indicator
42.
fault injection
43.
fault Interruption
44.
fault localization
45.
fault location
46.
fault management
47.
fault masking
48.
fault modeling
49.
fault models
50.
fault monitoring
51.
fault prediction
52.
fault protection
53.
fault redundancy
54.
fault resilience
55.
fault ride through
56.
Fault ride through enhancement
57.
fault signal
58.
fault simulastion
59.
fault tolerance
60.
fault tolerant
61.
fault tolerant control
62.
fault tolerant operation
63.
fault tolerant router design
64.
fault tolerant systems
65.
fault tree analysis
66.
fault-injection attack
67.
fault-plane solution
68.
fault-resilience
69.
fault-resistant
70.
fault-ride-through (FRT)
71.
fault-tolerance
72.
fault-tolerant
73.
Fault-tolerant (FT) converters
74.
fault-tolerant control
75.
fault-tolerant converter
76.
functional fault model
77.
high-level control fault model
78.
high-level fault coverage
79.
high-level fault model
80.
high-level functional fault model
81.
Katun fault
82.
low-level fault redundancy
83.
no fault found
84.
No-Fault-Found
85.
open circuit fault
86.
short circuit fault
87.
spectrum-based fault localization
88.
stacking fault
89.
stuck-at fault model
90.
test generation and fault diagnosis
91.
transient fault mitigation
92.
transmission lines fault
93.
annual energy simulation
94.
back traced simulation
95.
building energy simulation
96.
building simulation
97.
casting simulation
98.
CFD simulation
99.
circuit simulation
100.
CoCoViLa simulation environment
101.
computer simulation
102.
computer simulation environments
103.
cooling simulation
104.
co-simulation
105.
data simulation
106.
digital real time simulation
107.
dynamic simulation
108.
electric field simulation
109.
emergency simulation
110.
energy simulation
111.
energy simulation software
112.
environmental performance assessment and simulation
113.
finite element method (FEM) simulation
114.
finite element simulation
115.
fluid flow simulation
116.
FMS modelling and simulation
117.
fullscale simulation
118.
gait simulation
119.
hardware-in-the loop simulation
120.
Hardware-in-the-Loop simulation
121.
hospital simulation
122.
hot/cold pressing and finite element model simulation
123.
hygrothermal simulation
124.
impact scenario simulation
125.
impact-abrasive simulation
126.
intelligent simulation
127.
intelligent simulation environment
128.
LES (large eddy simulation) method
129.
logic models and simulation
130.
logic simulation
131.
magnetics field simulation
132.
Mathematical simulation
133.
MATLAB simulation
134.
medical simulation
135.
meso-scale simulation
136.
MICA2 simulation
137.
modeling and simulation
138.
modelling and simulation
139.
Monte Carlo simulation
140.
Monte Carlo simulation (MCS)
141.
multi agent simulation
142.
multiscale simulation
143.
Multi-valued Simulation for Hazard Detection in Digital Circuits
144.
numerical simulation
145.
parallel simulation
146.
phase diagram simulation
147.
power system simulation
148.
ray-tracing simulation
149.
real time simulation
150.
real-time simulation
151.
register transfer and gate level simulation
152.
response simulation
153.
rheology simulation
154.
signal simulation
155.
signal simulation and modeling
156.
similar material simulation test
157.
simulation
158.
simulation analysis
159.
simulation applications
160.
simulation based static optimization
161.
simulation based TMY
162.
simulation model
163.
simulation modeling
164.
simulation models
165.
simulation of air change
166.
simulation of energy consumption
167.
simulation software "Delphin"
168.
simulation training
169.
simulationbased decision support
170.
simulation-based verification
171.
spinach simulation
172.
SUMO simulation
173.
supply chain simulation
174.
systems simulation
175.
TD-DFT simulation
176.
urban simulation
177.
validation of simulation model
178.
wear simulation
179.
vehicle simulation
180.
whole building simulation
181.
visual simulation
182.
3D simulation
183.
5G New Radio simulation
184.
(co-)simulation
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT