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fault simulation (keyword)
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1
book article
Accelerating transient fault injection campaigns by using Dynamic HDL Slicing
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore
2019
/
7 p. : ill
https://doi.org/10.1109/NORCHIP.2019.8906932
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2
book article
Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600967
book article
3
book article
DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN accelerators
Taheri, Mahdi
;
Riazati, Mohamad
;
Ahmadilivani, Mohammad Hasan
;
Jenihhin, Maksim
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Sjödin, Mikael
;
Lisper, Björn
2023 24th International Symposium on Quality Electronic Design (ISQED)
2023
/
8 p. : ill
https://doi.org/10.1109/ISQED57927.2023.10129353
book article
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
4
journal article
Distributed approach for parallel exact critical path tracing fault simulation
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
International journal of microelectronics and computer science
2010
/
p. 165-174 : ill
journal article
5
journal article
Distributed fault simulation with collaborative load balancing for VLSI circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Scalable computing : practice and experience
2011
/
p. 153-163 : ill
journal article
6
book article
Efficient fault injection based on dynamic HDL slicing technique
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece
2019
/
p. 52-53 : ill
https://doi.org/10.1109/IOLTS.2019.8854419
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
7
book article EST
/
book article ENG
Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
Taheri, Mahdi
;
Cherezova, Natalia
;
Ansari, Mohammad Saeed
;
Jenihhin, Maksim
;
Mahani, Ali
;
Daneshtalab, Masoud
;
Raik, Jaan
Proceedings of the Twenty Fifth International Symposium on Quality ElectronicDesign : ISQED 2024
2024
/
8 p. : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372
https://doi.org/10.1109/ISQED60706.2024.10528372
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
8
book article
Fast RTL fault simulation using decision diagrams and bitwise set operations
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada
2011
/
p. 164-170
https://ieeexplore.ieee.org/document/6104440
book article
9
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
10
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
11
book article
Modeling sequential circuits with shared structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Marenkov, Mihhail
;
Mironov, Dmitri
;
Viies, Vladimir
Proceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 2014
2014
/
p. 130-135 : ill
book article
12
book article
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators
Taheri, Mahdi
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Jenihhin, Maksim
;
Pappalardo, Salvatore
;
Jimenez, Paul
;
Deveautour, Bastien
;
Bosio, Alberto
2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) : 03-05 April 2024, Kielce, Poland
2024
/
p. 19–24 : ill
https://doi.org/10.1109/DDECS60919.2024.10508925
Article at Scopus
Article at WOS
book article
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
13
book article
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway
2015
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2015.7364406
book article
14
book article EST
/
book article ENG
Special session: reliability assessment recipes for DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Bosio, Alberto
;
Deveautour, Bastien
;
Dos Santos, Fernando Fernandes
;
Guerrero-Balaguera, Juan-David
;
Jenihhin, Maksim
;
Kritikakou, Angeliki
;
Sierra, Robert Limas
;
Raik, Jaan
;
Taheri, Mahdi
42nd IEEE VLSI Test Symposium, VTS 2024 : proceedings
2024
/
11 p. : ill
https://doi.org/10.1109/VTS60656.2024.10538707
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
15
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
16
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 16, displaying
1 - 16
keyword
199
1.
fault simulation
2.
fault simulation with critical path tracing
3.
high-level fault simulation
4.
Parallel Fault Simulation with Critical Path Backtracing
5.
parallel fault-simulation
6.
Fault Injection Simulation
7.
AI-based fault detection
8.
asynchronous fault detection
9.
automatic fault diagnosis
10.
bearing fault diagnosis
11.
bi-directional fault monitoring devices
12.
conditional fault collapsing
13.
control fault models
14.
critical path fault tracing
15.
cross-layer fault tolerance
16.
cross-layered fault management
17.
extended fault class
18.
fault currents
19.
fault analysis
20.
fault analysis model
21.
fault classification
22.
fault classification
23.
fault collapsing
24.
fault compensation
25.
fault coverage
26.
fault current and voltage measurements
27.
Fault current limite
28.
fault current limiter
29.
fault detection
30.
fault detection and classification
31.
fault detection and diagnoses
32.
fault detection and diagnosis
33.
fault detection and diagnostics (FDD)
34.
fault diagnosis
35.
fault diagnostic
36.
fault diagnostic resolution
37.
fault diagnostics
38.
fault dignosis
39.
fault effects
40.
fault emulation
41.
fault equivalence and dominance
42.
fault handling
43.
fault handling strategy
44.
fault indicator
45.
fault injection
46.
fault Interruption
47.
fault localization
48.
fault location
49.
fault management
50.
fault masking
51.
fault modeling
52.
fault models
53.
fault monitoring
54.
fault prediction
55.
fault protection
56.
fault redundancy
57.
fault resilience
58.
fault ride through
59.
Fault ride through enhancement
60.
fault seeding
61.
fault signal
62.
fault simulastion
63.
fault tolerance
64.
fault tolerant
65.
fault tolerant control
66.
fault tolerant operation
67.
fault tolerant router design
68.
fault tolerant systems
69.
fault tree analysis
70.
fault-injection attack
71.
fault-plane solution
72.
fault-resilience
73.
fault-resistant
74.
fault-ride-through (FRT)
75.
fault-tolerance
76.
fault-tolerant
77.
Fault-tolerant (FT) converters
78.
fault-tolerant control
79.
fault-tolerant converter
80.
functional fault model
81.
high-level control fault model
82.
high-level fault coverage
83.
high-level fault model
84.
high-level functional fault model
85.
hybrid fault detection
86.
Katun fault
87.
low-level fault redundancy
88.
no fault found
89.
No-Fault-Found
90.
open circuit fault
91.
photovoltaic fault detection algorithms
92.
PV fault classification
93.
short circuit fault
94.
spectrum-based fault localization
95.
stacking fault
96.
stuck-at fault model
97.
test generation and fault diagnosis
98.
transient fault mitigation
99.
transmission lines fault
100.
annual energy simulation
101.
back traced simulation
102.
building energy simulation
103.
building simulation
104.
casting simulation
105.
CFD simulation
106.
circuit simulation
107.
CoCoViLa simulation environment
108.
computer simulation
109.
computer simulation environments
110.
cooling simulation
111.
co-simulation
112.
data simulation
113.
digital real time simulation
114.
digital shipping simulation
115.
dynamic simulation
116.
electric field simulation
117.
emergency simulation
118.
energy simulation
119.
energy simulation software
120.
environmental performance assessment and simulation
121.
finite element method (FEM) simulation
122.
finite element simulation
123.
fluid flow simulation
124.
FMS modelling and simulation
125.
fullscale simulation
126.
gait simulation
127.
hardware-in-the loop simulation
128.
Hardware-in-the-Loop simulation
129.
hospital simulation
130.
hot/cold pressing and finite element model simulation
131.
hygrothermal simulation
132.
impact scenario simulation
133.
impact-abrasive simulation
134.
intelligent simulation
135.
intelligent simulation environment
136.
LES (large eddy simulation) method
137.
logic models and simulation
138.
logic simulation
139.
long-term simulation
140.
magnetics field simulation
141.
Mathematical simulation
142.
MATLAB simulation
143.
medical simulation
144.
meso-scale simulation
145.
MICA2 simulation
146.
model building and simulation
147.
modeling and simulation
148.
modelling and simulation
149.
Monte Carlo simulation
150.
Monte Carlo simulation (MCS)
151.
multi agent simulation
152.
multiscale simulation
153.
Multi-valued Simulation for Hazard Detection in Digital Circuits
154.
numerical simulation
155.
parallel simulation
156.
phase diagram simulation
157.
power system simulation
158.
process simulation
159.
ray-tracing simulation
160.
real time simulation
161.
real-time simulation
162.
register transfer and gate level simulation
163.
response simulation
164.
rheology simulation
165.
Siemens Tecnomatix Plant Simulation (STPS) platform
166.
signal simulation
167.
signal simulation and modeling
168.
similar material simulation test
169.
simulation
170.
simulation analysis
171.
simulation and analysis
172.
simulation applications
173.
simulation based static optimization
174.
simulation based TMY
175.
simulation model
176.
simulation modeling
177.
simulation models
178.
simulation of air change
179.
simulation of energy consumption
180.
simulation software "Delphin"
181.
simulation trace
182.
simulation training
183.
simulationbased decision support
184.
simulation-based verification
185.
spinach simulation
186.
SUMO simulation
187.
supply chain simulation
188.
system level simulation
189.
systems simulation
190.
TD-DFT simulation
191.
urban simulation
192.
validation of simulation model
193.
wear simulation
194.
vehicle simulation
195.
whole building simulation
196.
visual simulation
197.
3D simulation
198.
5G New Radio simulation
199.
(co-)simulation
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