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351
book article
Sequential test set compaction in LFSR reseeding
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
Design and test technology for dependable systems-on-chip
2011
/
p. 476-493 : ill
https://ieeexplore.ieee.org/document/4738292
book article
352
book article
7-valued algebra for transition delay fault analysis
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
2014
/
p. 89-92 : ill
book article
353
book article
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway
2015
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2015.7364406
book article
354
book article
Shift register based TPG for at-speed interconnect BIST
Jutman, Artur
MIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 2
2004
/
p. 751-754 : ill
https://ieeexplore.ieee.org/document/1314941?signout=success
book article
355
journal article
Short-circuit protection circuits for silicon-carbide power transistors
Sadik, Diane-Perle
;
Colmenares, Juan
;
Tolstoy, Georg
;
Rabkowski, Jacek
IEEE transactions on industrial electronics
2016
/
p. 1995-2004 : ill
https://doi.org/10.1109/TIE.2015.2506628
journal article
356
book article
Signal processing and machine learning techniques for predictive maintenance of rotor bars in induction machine
Kudelina, Karolina
;
Raja, Hadi Ashraf
;
Rjabtšikov, Viktor
;
Naseer, Muhammad Usman
;
Vaimann, Toomas
;
Kallaste, Ants
2023 International Conference on Electrical Drives and Power Electronics (EDPE)
2023
/
7 p. : ill
https://doi.org/10.1109/EDPE58625.2023.10274030
book article
Related publications
1
Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil
357
journal article
Simple relationship between the breakdown voltage, concentration and junction depth pn diffused junctions
Rang, Toomas
Physica status solidi. A, Applied research
1982
/
p. K117-K119 : tab., joon
https://www.ester.ee/record=b1562026*est
journal article
358
book article
Software-level TMR approach for on-board data processing in space applications
Janson, Karl
;
Treudler, Carl Johann
;
Hollstein, Thomas
;
Raik, Jaan
;
Jenihhin, Maksim
;
Fey, Goerschwin
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 147-152 : ill
https://doi.org/10.1109/DDECS.2018.00033
book article
359
book article
Sonda tektooniline rike Põhja-Kiviõli karjääris
Sõstra, Ülo
;
Vaher, Rein
XV aprillikonverentsi "Geoloogilise kaardistamise poolsajand" teesid : [30. märts 2007, Tallinn]
2007
/
lk. 37-39 : ill
book article
360
book article EST
/
book article ENG
Special session : approximation and fault resiliency of DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Barbareschi, Mario
;
Barone, Salvatore
;
Bosio, Alberto
;
Daneshtalab, Masoud
;
Torca, Salvatore Della
;
Gavarini, Gabriele
;
Jenihhin, Maksim
;
Raik, Jaan
;
Taheri, Mahdi
2023 IEEE 41st VLSI Test Symposium (VTS) : proceedings
2023
/
10 p. : ill
https://doi.org/10.1109/VTS56346.2023.10140043
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
361
book article EST
/
book article ENG
Special session: reliability assessment recipes for DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Bosio, Alberto
;
Deveautour, Bastien
;
Dos Santos, Fernando Fernandes
;
Guerrero-Balaguera, Juan-David
;
Jenihhin, Maksim
;
Kritikakou, Angeliki
;
Sierra, Robert Limas
;
Raik, Jaan
;
Taheri, Mahdi
42nd IEEE VLSI Test Symposium, VTS 2024
2024
/
11 p. : ill
https://doi.org/10.1109/VTS60656.2024.10538707
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
362
book article
Spectrum analysis additional vibrations of Cartesian robot by different control modes
Autsou, Siarhei
;
Vaimann, Toomas
;
Rassõlkin, Anton
;
Kudelina, Karolina
2022 18th Biennial Baltic Electronics Conference (BEC)
2022
/
5 l.
https://doi.org/10.1109/BEC56180.2022.9935595
book article
Related publications
1
Fault tolerant control and diagnosis strategies for cartesian industrial robot motion control planning system = Tõrketaluvusega juhtimis- ja diagnostikastrateegiad tööstusliku karteesianroboti liikumise planeerimise juhtimissüsteemi jaoks
363
book article
SSBDDs and double topology for multiple fault reasoning
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 2012
2012
/
p. 23-28
https://www.semanticscholar.org/paper/SSBDDs-and-Double-Topology-for-Multiple-Fault-Ubar-Kostin/8ba04611a41768f0c277a4ba46ca666132fc2f65
book article
364
book article
Stator voltage analysis of frequency converter fed induction generator with broken rotor bars
Vaimann, Toomas
;
Belahcen, Anouar
;
Martinez, Javier
;
Kilk, Aleksander
13th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 14-19, 2013
2013
/
p. 249-251 : ill
book article
365
book article
Studing the impact of gearbox faults on the operations of the cartesian robot
Autsou, Siarhei
22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III : Pärnu, Estonia, August 23-26, 2023
2023
/
p. 17-18 : ill
https://www.ester.ee/record=b5570906*est
book article
366
book article
Study of overvoltages upon single-phase ground fault initialisation and arcing processes on MV networks with isolated neutral
Kütt, Lauri
;
Järvik, Jaan
;
Sepping, Eino
The 4th International Conference Electric Power Quality and Supply Reliability : August 29...31, 2004, Pedase, Estonia : proceedings
2004
/
p. 139-143 : ill
book article
367
book article
Study of the effects of single phase ground faults to the voltage transformers in the 10 kV medium voltage power networks
Janson, Kuno
;
Järvik, Jaan
;
Külm, Evald
;
Kütt, Lauri
;
Šklovski, Jevgeni
48. Internationales Wissenschaftliches Kolloquium, 22.-25.09.2003, Technische Universität Ilmenau, Germany
2003
/
p. 583-584 : ill
book article
368
book article
Study of the effects of single phase ground faults to the voltage transformers in the 10 kV medium voltage power networks [Electronic resource]
Janson, Kuno
;
Järvik, Jaan
;
Külm, Evald
;
Kütt, Lauri
;
Šklovski, Jevgeni
48. Internationales Wissenschaftliches Kolloquium, 22.-25.09.2003, Technische Universität Ilmenau, Germany : proceedings and our portrait
2003
/
[10] p. : ill. [CD-ROM]
book article
369
book article
Study of transformer overvoltages under single-phase earth faults in 6...35 kV networks with insulated neutral point [Electronic resource]
Janson, Kuno
;
Järvik, Jaan
;
Kalda, Heljut
;
Külm, Evald
;
Šklovski, Jevgeni
Electric Power Engineering 2003 : 5th International Scientific Conference : January 28-29, 2003, Beskydy Pension, Visalaje, Czech Republic : held by occasion of 25th Anniversary of Department of Electrical
2003
/
[17] p. : ill. [CD-ROM]
book article
370
book article
Suppression of voltage flicker by saturable reactor operating under forced magnetization [Electronic resource]
Bolgov, Viktor
;
Järvik, Jaan
EUROCON 2007 : the International Conference on Computer as a Tool : September 9-12, 2007, Warsaw, Poland : proceedings
2007
/
p. 1417-1422 : ill. [CD-ROM]
https://ieeexplore.ieee.org/document/4400513
book article
371
journal article
A survey of broken rotor bar fault diagnostic methods of induction motor
Asad, Bilal
;
Vaimann, Toomas
;
Rassõlkin, Anton
;
Kallaste, Ants
;
Belahcen, Anouar
Scientific Journal of Riga Technical University. Electrical, control and communication engineering
2018
/
p. 117–124 : ill
https://doi.org/10.2478/ecce-2018-0014
journal article
372
journal article EST
/
journal article ENG
A survey on UAV computing platforms : a hardware reliability perspective
Ahmed, Foisal
;
Jenihhin, Maksim
Sensors
2022
/
art. 6286
https://doi.org/10.3390/s22166286
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
373
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
374
dissertation
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
Balakrishnan, Aneesh
2022
https://doi.org/10.23658/taltech.11/2022
https://digikogu.taltech.ee/et/Item/a594d3ec-0e6b-4a78-819a-fe1f47992612
dissertation
Related publications
9
Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors
On the estimation of complex circuits functional failure rate by machine learning techniques
Challenges of reliability assessment and enhancement in autonomous systems
The validation of graph model-based, gate level low-dimensional feature data for machine learning applications
Understanding multidimensional verification : where functional meets non-functional
Enabling cross-layer reliability and functional safety assessment through ML-based compact models
Composing graph theory and deep neural networks to evaluate SEU type soft error effects
Gate-level graph representation learning : a step towards the improved stuck-at faults analysis
Modeling soft-error reliability under variability
375
book article
System modelling and measurement under the view of design of testability and fault diagnosis of analog circuits
Liu, Ji-Gou
;
Frühauf, Uwe
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 295-298: ill
book article
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