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276
book article
Preliminary analysis of mechanical bearing faults for predictive maintenance of electrical machines
Kudelina, Karolina
;
Raja, Hadi Ashraf
;
Autsou, Siarhei
;
Naseer, Muhammad Usman
;
Vaimann, Toomas
;
Kallaste, Ants
;
Pomamacki, Raimondas
;
Hyunh, Van Khang
2023 IEEE 14th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)
2023
/
p. 430-435 : ill
https://doi.org/10.1109/SDEMPED54949.2023.10271451
book article
Seotud publikatsioonid
1
Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil
277
book article
Protection of bidirectional Step-Up/Down partial power converter against short circuit and open circuit faults and mode transition issues
Hassanpour, Naser
;
Chub, Andrii
;
Blinov, Andrei
;
Yadav, Neelesh
;
Hasan, Sayeed
;
Vinnikov, Dmitri
2024 IEEE 18th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)
2024
/
6 p
https://doi.org/10.1109/CPE-POWERENG60842.2024.10604315
book article
278
journal article EST
/
journal article ENG
A public dataset for synchronous motor electrical faults diagnosis with CNN and LSTM reference classifiers
Sun, Zhenglong
;
Machlev, Ram
;
Wang, Qianchao
;
Belikov, Juri
;
Levron, Yoash
;
Baimel, Dmitry
Energy and AI
2023
/
art. 100274
https://doi.org/10.1016/j.egyai.2023.100274
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
279
book article
Register-transfer level deductive fault simulation using decision diagrams
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 193-196 : ill
book article
280
book article
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG
Palermo, N.
;
Tihhomirov, Valentin
;
Copetti, Thiago
;
Jenihhin, Maksim
;
Raik, Jaan
;
Kostin, Sergei
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
2015
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2015.7102405
book article
281
book article
Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687
Jutman, Artur
;
Shibin, Konstantin
;
Devadze, Sergei
IEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings
2016
/
p. 240-249 : ill
https://doi.org/10.1109/AUTEST.2016.7589605
book article
282
book article
Research and training environment for digital design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Proceedings of the Eighth IASTED International Conference on Computers and Advanced Technology in Education : August 29-31, 2005, Oranjestad, Aruba
2005
/
p. 232-237 : ill
https://ieeexplore.ieee.org/document/1408779
book article
283
book article
Research environment for teaching digital test
Ivask, Eero
;
Jutman, Artur
;
Orasson, Elmet
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Synergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 2
2004
/
p. 468-473 : ill
https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf
book article
284
journal article
Reversible electrowetting on silanized silicon nitride
Cahill, Brian
;
Giannitsis, Athanasios
;
Land, Raul
;
Gastrock, Gunter
;
Pliquett, Uwe
;
Frense, Dieter
;
Min, Mart
;
Beckmann, Dieter
Sensors and actuators B. Chemical
2010
/
p. 380-386 : ill
https://www.sciencedirect.com/science/article/pii/S092540050800885X
journal article
285
newspaper article
Riigijuhid, kuhu jääb elektritootmise strateegia?
Rajangu, Väino
Eesti Päevaleht
2023
/
Lk. 3
https://dea.digar.ee/article/eestipaevaleht/2023/01/10/3.5
Riigijuhid, kuhu jääb elektritootmise strateegia?
newspaper article
286
book
Rikkevoolukaitse
Teemets, Raivo
2004
https://www.ester.ee/record=b1961658*est
book
287
journal article
Rikkevoolukaitse
Teemets, Raivo
Ehitaja
1996
/
8, lk. 69-70: ill
journal article
288
journal article
Rikkevoolukaitse lülitite paigaldamine
Teemets, Raivo
Ehitaja
1996
/
9, lk. 73-74: ill
journal article
289
book article
Rotor fault diagnostic of inverter fed induction motor using frequency analysis
Asad, Bilal
;
Vaimann, Toomas
;
Belahcen, Anouar
;
Kallaste, Ants
;
Rassõlkin, Anton
2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), 27-30 Aug. 2019, Toulouse, France : proceedings
2019
/
p. 127-133 : ill
https://doi.org/10.1109/DEMPED.2019.8864903
book article
290
book article
RT-level identification of potentially testable initialization faults
Raik, Jaan
;
Fujiwara, Hideo
;
Krivenko, Anna
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
2008
/
[6] p
https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults
book article
291
book article
RT-level test point insertion for sequential circuits
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings
2004
/
p. 34-40 : ill
https://ieeexplore.ieee.org/document/1428412
book article
292
dissertation
110 kV õhuliinide isolatsiooni töökindluse analüüs ja töökindluse tõstmise meetodid = The study of 110 kV power grid reliability and the measures to decrease insulation failure
Taklaja, Paul
2012
http://www.ester.ee/record=b2857612*est
dissertation
293
journal article
SALSy : security-aware layout synthesis
Eslami, Mohammad
;
Perez, Tiago Diadami
;
Pagliarini, Samuel Nascimento
arXiv.org
2024
/
13 p. : ill
https://doi.org/10.48550/arXiv.2308.06201
journal article
Seotud publikatsioonid
1
On the use of defensive schemes for hardware security = Kaitseskeemid riistvara turvalisuse tagamiseks
294
book article
Scalable algorithm for structural fault collapsing in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Orasson, Elmet
;
Raik, Jaan
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea
2015
/
p. 171-176 : ill
book article
295
book article
A scalable technique to identify true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
2017
/
p. 152-157 : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
book article
296
dissertation
Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemid
Kostin, Sergei
2012
https://www.ester.ee/record=b2757857*est
dissertation
297
book article
Sequential test set compaction in LFSR reseeding
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
Design and test technology for dependable systems-on-chip
2011
/
p. 476-493 : ill
https://ieeexplore.ieee.org/document/4738292
book article
298
book article
7-valued algebra for transition delay fault analysis
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
2014
/
p. 89-92 : ill
book article
299
book article
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway
2015
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2015.7364406
book article
300
book article
Shift register based TPG for at-speed interconnect BIST
Jutman, Artur
MIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 2
2004
/
p. 751-754 : ill
https://ieeexplore.ieee.org/document/1314941?signout=success
book article
Number of records 361, displaying
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