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376

book article

System modelling and measurement under the view of design of testability and fault diagnosis of analog circuitsLiu, Ji-Gou; Frühauf, UweBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 295-298: ill

book article

377

book article

Teaching diagnostic modeling of digital systems with decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Raik, Jaan; Mironov, Dmitri; Evartson, Teet; Orasson, Elmet; Aarna, Margit; Wuttke, Heinz-DietrichProceedings of 12th IASTED International Conference on Computers and Advanced Technology in Education - CATE 2009 : St.Thomas, US, November 22-24, 20092009 / p. 1-6. [CD-ROM]

book article

378

book article

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

book article

379

dissertation

Techniques for robust routing, communication and computation in multiprocessor systems = Robustse marsruutimise, side ja arvutuse tehnikad mitmeprotsessorilistes süsteemidesJanson, Karl2021 https://www.ester.ee/record=b5396084*est https://digikogu.taltech.ee/et/Item/c9091d5c-dcd8-4b21-95a7-84ead85241e6 https://doi.org/10.23658/taltech.3/2021

dissertation

380

newspaper article

Tehisintellekt pandi metalliettevõttes rikkeid otsima, et vähendada tootmiskulusid [Võrguväljaanne]am.ee2022 Tehisintellekt pandi metalliettevõttes rikkeid otsima, et vähendada tootmiskulusid

newspaper article

381

book article

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

book article

382

book article

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, VineethInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 33-37 : ill

book article

383

book article

Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill

book article

384

book article

Test generation for finite state machinesUbar, Raimund-Johannes; Brik, MarinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 233-236: ill

book article

385

journal article

Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocolsBengtsson, Tomas; Kumar, Shashi; Ubar, Raimund-Johannes; Jutman, Artur; Peng, ZeboIET computers and digital techniques2008 / 6, p. 445-460 https://www.diva-portal.org/smash/record.jsf?dswid=-5073&aq2=%5B%5B%5D%5D&c=39&af=%5B%5D&searchType=SIMPLE&sortOrder2=title_sort_asc&language=en&pid=diva2%3A290043&aq=%5B%5B%7B%22personId%22%3A%22authority-person%3A23389%22%7D%5D%5D&sf=all&aqe=%5B%5D&sortOrder=author_sort_asc&onlyFullText=false&noOfRows=50

journal article

386

book article

Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148

book article

387

book article

Testing of systems using softwareUbar, Raimund-JohannesConcise encyclopedia of software engineering1993 / p. 352-356

book article

388

book article

The analysis of integrating sigma-delta ADC noiseGutnikov, V.S.; Krivchenko, T.I.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 201-206: ill

book article

389

journal article

The investigation of the Therac-25 accidentsZdanov, VassiliA & A2007 / 6, lk. 20-32 : ill https://artiklid.elnet.ee/record=b1021179*est

journal article

390

book article

The study about indefinite fault causes in Estonian 110 kV power gridTaklaja, Paul; Oidram, ReinPQ2010 : 7th International Conference "2010 Electric Power Quality and Supply Reliability" : June 16-18, 2010, Kuressaare, Estonia2010 / p. 177-182 : ill

book article

391

book article

3D parallel fault simulationGorev, Maksim; Ubar, Raimund-JohannesProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 39-42 : ill

book article

392

journal article

3D permeance model of induction machines taking into account saturation effects and its connection with stator current and shaft speed spectraMartinez, Javier; Belahcen, Anouar; Arkkio, AnteroIET electric power applications2015 / p. 20-29 : ill http://dx.doi.org/10.1049/iet-epa.2014.0013

journal article

393

book article

A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 79-82 : ill http://www.ester.ee/record=b2150914*est

book article

394

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

395

book article

Topological analysis of SSBDDs with applications in fault diagnosisUbar, Raimund-JohannesProceedings of 10th International Workshop on Boolean Problems : Freiberg, Germany, September 19-21, 20122012 / p. 1-16

book article

396

book article

Towards artificial intelligence based automatic adaptive response analyzer for high frequency analog BISTPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesCIMSA 2008 : IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : Istanbul, Turky, July 14-16, 20082008 / p. 99-104 : ill https://ieeexplore.ieee.org/document/4595841

book article

397

book article

Transient modeling and recovery of non-stationary fault signature for condition monitoring of induction motorsAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants; Rassõlkin, Anton; Ghahfarokhi, Payam ShamsAdvances in machine fault diagnosis2022 / p. 43-59 https://doi.org/10.3390/app11062806

book article

398

journal article EST / journal article ENG

Transient modeling and recovery of non-stationary fault signature for condition monitoring of induction motorsAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants; Rassõlkin, Anton; Ghahfarokhi, Payam Shams; Kudelina, KarolinaApplied sciences2021 / 17 p. : ill https://doi.org/10.3390/app11062806 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

399

journal article EST / journal article ENG

Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanMicroprocessors and microsystems2015 / p. 1130-1138 : ill https://doi.org/10.1016/j.micpro.2015.05.003 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

400

book article

Troubleshooting and debugging functionsRuban, Olga; Laugis, Juhan5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 20082008 / p. 216-221 : ill

book article

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