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376
book article
Study of the effects of single phase ground faults to the voltage transformers in the 10 kV medium voltage power networks
Janson, Kuno
;
Järvik, Jaan
;
Külm, Evald
;
Kütt, Lauri
;
Šklovski, Jevgeni
48. Internationales Wissenschaftliches Kolloquium, 22.-25.09.2003, Technische Universität Ilmenau, Germany
2003
/
p. 583-584 : ill
book article
377
book article
Study of the effects of single phase ground faults to the voltage transformers in the 10 kV medium voltage power networks [Electronic resource]
Janson, Kuno
;
Järvik, Jaan
;
Külm, Evald
;
Kütt, Lauri
;
Šklovski, Jevgeni
48. Internationales Wissenschaftliches Kolloquium, 22.-25.09.2003, Technische Universität Ilmenau, Germany : proceedings and our portrait
2003
/
[10] p. : ill. [CD-ROM]
book article
378
book article
Study of transformer overvoltages under single-phase earth faults in 6...35 kV networks with insulated neutral point [Electronic resource]
Janson, Kuno
;
Järvik, Jaan
;
Kalda, Heljut
;
Külm, Evald
;
Šklovski, Jevgeni
Electric Power Engineering 2003 : 5th International Scientific Conference : January 28-29, 2003, Beskydy Pension, Visalaje, Czech Republic : held by occasion of 25th Anniversary of Department of Electrical
2003
/
[17] p. : ill. [CD-ROM]
book article
379
book article
Suppression of voltage flicker by saturable reactor operating under forced magnetization [Electronic resource]
Bolgov, Viktor
;
Järvik, Jaan
EUROCON 2007 : the International Conference on Computer as a Tool : September 9-12, 2007, Warsaw, Poland : proceedings
2007
/
p. 1417-1422 : ill. [CD-ROM]
https://ieeexplore.ieee.org/document/4400513
book article
380
journal article
A survey of broken rotor bar fault diagnostic methods of induction motor
Asad, Bilal
;
Vaimann, Toomas
;
Rassõlkin, Anton
;
Kallaste, Ants
;
Belahcen, Anouar
Scientific Journal of Riga Technical University. Electrical, control and communication engineering
2018
/
p. 117–124 : ill
https://doi.org/10.2478/ecce-2018-0014
journal article
381
journal article EST
/
journal article ENG
A survey on UAV computing platforms : a hardware reliability perspective
Ahmed, Foisal
;
Jenihhin, Maksim
Sensors
2022
/
art. 6286
https://doi.org/10.3390/s22166286
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
382
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
383
book article
A synthesis-agnostic behavioral fault model for high gate-level fault coverage
Karputkin, Anton
;
Raik, Jaan
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings
2016
/
p. 1124-1127 : ill
https://ieeexplore.ieee.org/document/7459477/figures#figures
book article
384
dissertation
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
Balakrishnan, Aneesh
2022
https://doi.org/10.23658/taltech.11/2022
https://digikogu.taltech.ee/et/Item/a594d3ec-0e6b-4a78-819a-fe1f47992612
dissertation
Related publications
9
Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors
On the estimation of complex circuits functional failure rate by machine learning techniques
Challenges of reliability assessment and enhancement in autonomous systems
The validation of graph model-based, gate level low-dimensional feature data for machine learning applications
Understanding multidimensional verification : where functional meets non-functional
Enabling cross-layer reliability and functional safety assessment through ML-based compact models
Composing graph theory and deep neural networks to evaluate SEU type soft error effects
Gate-level graph representation learning : a step towards the improved stuck-at faults analysis
Modeling soft-error reliability under variability
385
book article
System modelling and measurement under the view of design of testability and fault diagnosis of analog circuits
Liu, Ji-Gou
;
Frühauf, Uwe
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 295-298: ill
book article
386
newspaper article
TalTechi IT-professorid: "Tehisaru roll kinnisvaras aina kasvab."
Petlenkov, Eduard
;
Belikov, Juri
TalTech veeb
2025
https://taltech.ee/uudised/taltechi-it-professorid-tehisaru-roll-kinnisvaras-aina-kasvab
newspaper article
387
book article
Teaching diagnostic modeling of digital systems with decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Mironov, Dmitri
;
Evartson, Teet
;
Orasson, Elmet
;
Aarna, Margit
;
Wuttke, Heinz-Dietrich
Proceedings of 12th IASTED International Conference on Computers and Advanced Technology in Education - CATE 2009 : St.Thomas, US, November 22-24, 2009
2009
/
p. 1-6. [CD-ROM]
book article
388
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
389
dissertation
Techniques for robust routing, communication and computation in multiprocessor systems = Robustse marsruutimise, side ja arvutuse tehnikad mitmeprotsessorilistes süsteemides
Janson, Karl
2021
https://www.ester.ee/record=b5396084*est
https://digikogu.taltech.ee/et/Item/c9091d5c-dcd8-4b21-95a7-84ead85241e6
https://doi.org/10.23658/taltech.3/2021
dissertation
390
newspaper article
Tehisintellekt pandi metalliettevõttes rikkeid otsima, et vähendada tootmiskulusid [Võrguväljaanne]
am.ee
2022
Tehisintellekt pandi metalliettevõttes rikkeid otsima, et vähendada tootmiskulusid
newspaper article
391
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
2007
/
p. 29-34 : ill
http://dx.doi.org/10.1109/ETS.2007.41
book article
392
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 33-37 : ill
book article
393
book article
Test generation for control faults in digital systems
Dušina, Julia
;
Brik, Marina
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 325-330: ill
book article
394
book article
Test generation for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 233-236: ill
book article
395
journal article
Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols
Bengtsson, Tomas
;
Kumar, Shashi
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Peng, Zebo
IET computers and digital techniques
2008
/
6, p. 445-460
https://www.diva-portal.org/smash/record.jsf?dswid=-5073&aq2=%5B%5B%5D%5D&c=39&af=%5B%5D&searchType=SIMPLE&sortOrder2=title_sort_asc&language=en&pid=diva2%3A290043&aq=%5B%5B%7B%22personId%22%3A%22authority-person%3A23389%22%7D%5D%5D&sf=all&aqe=%5B%5D&sortOrder=author_sort_asc&onlyFullText=false&noOfRows=50
journal article
396
book article
Test pattern generation at the behavioral level from VHDL circuit description containing several processes
Gramatova, Elena
;
Bezakova, Jana
;
Cibakova, Tatiana
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 145-148
book article
397
book article
Testing of systems using software
Ubar, Raimund-Johannes
Concise encyclopedia of software engineering
1993
/
p. 352-356
book article
398
book article
The analysis of integrating sigma-delta ADC noise
Gutnikov, V.S.
;
Krivchenko, T.I.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 201-206: ill
book article
399
journal article
The investigation of the Therac-25 accidents
Zdanov, Vassili
A & A
2007
/
6, lk. 20-32 : ill
https://artiklid.elnet.ee/record=b1021179*est
journal article
400
book article
The study about indefinite fault causes in Estonian 110 kV power grid
Taklaja, Paul
;
Oidram, Rein
PQ2010 : 7th International Conference "2010 Electric Power Quality and Supply Reliability" : June 16-18, 2010, Kuressaare, Estonia
2010
/
p. 177-182 : ill
book article
Number of records 450, displaying
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