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1. IEEE 9 bus test system
2. European and European Union Patents Court (EEUPC)
3. European Federation of National Academies of Sciences and Humanities All European Academies, (ALLEA)
4. accelerated shelf-life test
5. adaptive test strategy generation
6. antigen test
7. Applications in Test Engineering
8. ASTM G65 dry sand rubber wheel abrasion test
9. Automated Synthesis of Software-based Self-test
10. automated test environment
11. automated test pattern generation
12. automatic test case generation
13. automatic test pattern generation
14. automatic test program generation
15. Auvergne test-bed
16. battery test
17. behavioral test
18. behaviour level test generation
19. bending test
20. bit-error rate test
21. Board and System Test
22. board test
23. bounds test
24. built-in self-test
25. capillary condensation redistribution test
26. chi-square test
27. closed bottle test
28. cognitive screening test
29. compartment fire test
30. compartment test
31. cone penetration test (CPT)
32. COVID-19 antigen test
33. cutting test
34. cybersecurity test bed
35. DDR4 interconnect test
36. design and test
37. design-for-test
38. deterministic test sequences
39. diagnostic test
40. digital test
41. Digital test and testable design
42. double-pulse test
43. drawing test
44. dry droplet antimicrobial test
45. embedded test
46. fan pressurisation test
47. final test result prediction
48. four-point bending test
49. FPGA based test
50. FPGA-Assisted Test
51. FPGA-centric test
52. functional self-test
53. functional test generation
54. Granger causality test
55. hardness test
56. Hierarchical Multi-level Test Generation
57. high-level synthesis for test
58. high-level test data generation
59. highlevel test generation
60. high-speed serial link test
61. IEEE 1149.1
62. IEEE 1687
63. IEEE 802.15.6
64. IEEE 802156
65. IEEE C37.118.1
66. IEEE P1687
67. IEEE Std. 1687
68. implementation-independent test generation
69. in situ tensile test in SEM
70. industrial field test
71. in-situ tensile test in SEM
72. Johansen cointegration test
73. Kolmogorov-Smirnov test
74. load test
75. logic built-in self-test
76. Luria alternating series test
77. Mann–Kendall test
78. Mann-Kendall trend test
79. memory interconnect test
80. microprocessor test
81. Model test
82. multiplier test
83. offline test generation
84. orthogonal test
85. package test analysis
86. parallel design and test
87. performance test
88. piezocone penetration test (CPTu)
89. Point Load Test index
90. pressurisation test
91. processor-centric board test
92. progressive damage test
93. provably correct test generation
94. pseudo-exhaustive test
95. purity test
96. real-time room temperature test
97. rolling thin film oven test
98. rtioco-based timed test sequences
99. seasonal Mann Kendall test
100. seismic piezocone penetration test
101. self-test
102. self-test architectures
103. sentence writing test
104. serial sevens test
105. ship towing test tank
106. similar material simulation test
107. small-scale fire test
108. small‐scale test
109. software based self-test
110. software-based self-test
111. software-based self-test (SBST)
112. soil phosphorus (P) test
113. standard test method
114. static load test
115. static-dynamic probing test (SDT)
116. stress test
117. system level test
118. teaching design and test of systems
119. tensile test
120. tensile test
121. test
122. test and evaluation platform
123. test automation
124. test bench
125. test coverage
126. test driven development
127. test driven modelling
128. test embankment
129. test equipment
130. test generation
131. test generation and fault diagnosis
132. Test Group Generation for Detecting Multiple Faults
133. test groups
134. test model design
135. test optimization
136. test packets
137. test path synthesis
138. test patterns
139. test point insertion
140. test program generation
141. test reference year
142. test replication
143. test scenario description language
144. test-bed
145. test-chips
146. test-house
147. test-pattern
148. test-suite reduction
149. Three-point bending test
150. unit root test
151. usability platform test
152. 1995 ECC benchmark test
153. 24th IEEE International Conference on Industrial Technology 2023

1. European Test Symposium (ETS)
2. AI in business, workshop (2022 : Tallinn)
3. IEEE
4. 16PF (test)

1. IEEE

IEEE European Test Workshop (source)

types of item

keyword 153

subject term 4

TalTech subject term 1