Otsing - TalTech teadusportaal

1. IEEE 9 bus test system
2. European and European Union Patents Court (EEUPC)
3. European Federation of National Academies of Sciences and Humanities All European Academies, (ALLEA)
4. Intercalibration workshop
5. accelerated shelf-life test
6. adaptive test strategy generation
7. antigen test
8. Applications in Test Engineering
9. ASTM G65 dry sand rubber wheel abrasion test
10. Automated Synthesis of Software-based Self-test
11. automated test environment
12. automated test pattern generation
13. automatic test case generation
14. automatic test pattern generation
15. automatic test program generation
16. Auvergne test-bed
17. battery test
18. behavioral test
19. behaviour level test generation
20. bending test
21. bit-error rate test
22. Board and System Test
23. board test
24. bounds test
25. built-in self-test
26. capillary condensation redistribution test
27. chi-square test
28. closed bottle test
29. cognitive screening test
30. compartment fire test
31. compartment test
32. cone penetration test (CPT)
33. COVID-19 antigen test
34. cutting test
35. cybersecurity test bed
36. DDR4 interconnect test
37. design and test
38. design-for-test
39. deterministic test sequences
40. diagnostic test
41. digital test
42. Digital test and testable design
43. double-pulse test
44. drawing test
45. dry droplet antimicrobial test
46. embedded test
47. fan pressurisation test
48. final test result prediction
49. four-point bending test
50. FPGA based test
51. FPGA-Assisted Test
52. FPGA-centric test
53. functional self-test
54. functional test generation
55. Granger causality test
56. hardness test
57. Hierarchical Multi-level Test Generation
58. high-level synthesis for test
59. high-level test data generation
60. highlevel test generation
61. high-speed serial link test
62. IEEE 1149.1
63. IEEE 1687
64. IEEE 2418.5(TM)
65. IEEE 802.15.6
66. IEEE 802156
67. IEEE C37.118.1
68. IEEE P1687
69. IEEE Std. 1687
70. implementation-independent test generation
71. in situ tensile test in SEM
72. industrial field test
73. in-situ tensile test in SEM
74. Johansen cointegration test
75. Kolmogorov-Smirnov test
76. load test
77. logic built-in self-test
78. Luria alternating series test
79. Mann–Kendall test
80. Mann-Kendall trend test
81. memory interconnect test
82. microprocessor test
83. Model test
84. multiplier test
85. offline test generation
86. orthogonal test
87. package test analysis
88. parallel design and test
89. performance test
90. piezocone penetration test (CPTu)
91. Point Load Test index
92. pressurisation test
93. processor-centric board test
94. progressive damage test
95. provably correct test generation
96. pseudo-exhaustive test
97. purity test
98. real-time room temperature test
99. rolling thin film oven test
100. rtioco-based timed test sequences
101. seasonal Mann Kendall test
102. seismic piezocone penetration test
103. self-test
104. self-test architectures
105. sentence writing test
106. serial sevens test
107. ship towing test tank
108. similar material simulation test
109. small-scale fire test
110. small‐scale test
111. software based self-test
112. software-based self-test
113. software-based self-test (SBST)
114. soil phosphorus (P) test
115. standard test method
116. static load test
117. static-dynamic probing test (SDT)
118. stress test
119. system level test
120. teaching design and test of systems
121. tensile test
122. tensile test
123. test
124. test and evaluation platform
125. test automation
126. test bench
127. test coverage
128. test driven development
129. test driven modelling
130. test embankment
131. test equipment
132. test generation
133. test generation and fault diagnosis
134. Test Group Generation for Detecting Multiple Faults
135. test groups
136. test model design
137. test optimization
138. test packets
139. test path synthesis
140. test patterns
141. test point insertion
142. test program generation
143. test reference year
144. test replication
145. test scenario description language
146. test-bed
147. test-chips
148. test-house
149. test-pattern
150. test-suite reduction
151. Three-point bending test
152. unit root test
153. usability platform test
154. 1995 ECC benchmark test
155. 24th IEEE International Conference on Industrial Technology 2023

1. European Test Symposium (ETS)
2. AI in business, workshop (2022 : Tallinn)
3. IEEE
4. 16PF (test)

1. European Innovation Council and SMEs Executive Agency (European Commission)

1. IEEE

IEEE European Test Workshop (allikas)

teaviku laadid

võtmesõna 155

märksõna 4

autor 1

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