print

Fast identification of true critical paths in sequential circuits

author
Ubar, Raimund-Johannes
Kostin, Sergei
Jenihhin, Maksim
Raik, Jaan
Jürimägi, Lembit
statement of authorship
Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi
source
Microelectronics reliability
publisher
Elsevier
journal volume number month
vol. 81
year of publication
2018
pages
p. 252-261 : ill
url
https://doi.org/10.1016/j.microrel.2017.11.027
subject term
elektronlülitused
rikked
testimine
keyword
timing-critical path
gate-level analysis
NBTI
ISSN
0026-2714
notes
Bibliogr.: 24 ref
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
Journal metrics at Scopus
Article at Scopus
WOS
Journal metrics at WOS
Article at WOS
category (general)
Engineering
Physics and astronomy
Materials science
category (sub)
Engineering. Safety, risk, reliability and quality
Engineering. Electrical and electronic engineering
Physics and astronomy. Condensed matter physics
Materials science. Surfaces, coatings and films
Physics and astronomy. Atomic and molecular physics, and optics
Materials science. Electronic, optical and magnetic materials
kvartiil
Q2
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Ubar, R., Kostin, S., Jenihhin, M., Raik, J., Jürimägi, L. Fast identification of true critical paths in sequential circuits // Microelectronics reliability (2018) vol. 81, p. 252-261 : ill. https://doi.org/10.1016/j.microrel.2017.11.027