Fast identification of true critical paths in sequential circuits
statement of authorship
Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi
source
publisher
journal volume number month
vol. 81
year of publication
pages
p. 252-261 : ill
subject term
ISSN
0026-2714
notes
Bibliogr.: 24 ref
scientific publication
teaduspublikatsioon
classifier
category (general)
category (sub)
kvartiil
TTÜ department
language
inglise
Ubar, R., Kostin, S., Jenihhin, M., Raik, J., Jürimägi, L. Fast identification of true critical paths in sequential circuits // Microelectronics reliability (2018) vol. 81, p. 252-261 : ill.