High-level decision diagrams based coverage metrics for verification and test
vastutusandmed
Maksim Jenihhin, Jaan Raik, Anton Chepurov, Uljana Reinsalu, Raimund Ubar
allikas
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
[6] p. : ill
konverentsi nimetus, aeg
10th IEEE Latin American Test Workshop, 2-5 March, 2009
konverentsi toimumispaik
Rio de Janero, Brazil
ISBN
978-1-4244-4206-5
märkused
Bibliogr.: 10 ref
TTÜ struktuuriüksus
keel
inglise
Jenihhin, M., Raik, J., Tšepurov, A., Reinsalu, U., Ubar, R.-J. High-level decision diagrams based coverage metrics for verification and test // LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009. [S.l.] : IEEE, 2009. [6] p. : ill.