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AdAM: adaptive fault-tolerant approximate multiplier for edge DNN acceleratorsTaheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Rafiq, Ahsan; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim2024 IEEE European Test Symposium (ETS): ETS 2024 : May 20-24, 2024, The Hague, Netherlands : proceedings2024 https://doi.org/10.1109/ETS61313.2024.10567161 Conference Proceedings at Scopus Article at Scopus Article at WOS

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APPRAISER : DNN fault resilience analysis employing approximation errorsTaheri, Mahdi; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Raik, Jaan; Daneshtalab, Masoud2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)2023 / p. 124−127 https://ddecs2023.taltech.ee/ https://doi.org//10.1109/DDECS57882.2023.10139468

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DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN acceleratorsTaheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, BjörnarXiv.org2023 / 8 p. : ill https://doi.org/10.48550/arXiv.2303.08226

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A fault-resistant architecture for AES S-box architectureTaheri, Mahdi; Sheikhpour, Saeideh; Ansari, Mohammad Saeed; Mahani, AliJournal of Applied Research in Electrical Engineering2021 / p. 86-92 https://doi.org/10.22055/jaree.2021.36230.1020

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A high-performance MEMRISTOR-based Smith-Waterman DNA sequence alignment using FPNI structureTaheri, Mahdi; Zandevakili, Hamed; Mahani, AliJournal of Applied Research in Electrical Engineering2021 / p. 59-68 https://doi.org/10.22055/jaree.2021.36117.1016

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A novel fault-tolerant logic style with self-checking capabilityTaheri, Mahdi; Sheikhpour, Saeideh; Mahani, Ali; Jenihhin, MaksimProceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 20222022 / art. 183305 : ill https://doi.org/10.1109/IOLTS56730.2022.9897818

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Special session : approximation and fault resiliency of DNN acceleratorsAhmadilivani, Mohammad Hasan; Barbareschi, Mario; Barone, Salvatore; Bosio, Alberto; Daneshtalab, Masoud; Torca, Salvatore Della; Gavarini, Gabriele; Jenihhin, Maksim; Raik, Jaan; Taheri, MahdiProceedings 2023 IEEE 41st VLSI Test Symposium (VTS)2023 / 10 p. : ill https://doi.org/10.1109/VTS56346.2023.10140043 Conference proceeding at Scopus Article at Scopus Article at WOS

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A systematic literature review on hardware reliability assessment methods for deep neural networksAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimACM Computing Surveys2024 / art. 141 https://doi.org/10.1145/3638242 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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