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26
book article
Die Anwendung von Tests im Fernstudium an technischen Universitäten
Umborg, Viktoria
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 104-107
book article
27
book article
Difficulty of cloze test modifications
Kokkota, Valmar
2nd regional seminar Testing in foreign language teaching : Tallinn, February 25-26, 1986 : summaries
1986
/
p. 51-53
https://www.ester.ee/record=b1217950*est
book article
28
book article
Digital design learning system based on Java applets
Jutman, Artur
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
4th Annual Conference of the LTSN Centre for Information and Computer Sciences : 26th-28th August 2002, NUI Galway, Ireland
2003
/
p. 183-187 : ill
https://pld.ttu.ee/dildis/publications/Sudnitson%20LTSN-ICS%202003.pdf
book article
29
dissertation
Digital test in WEB-based environment
Ivask, Eero
2006
https://www.ester.ee/record=b2158119*est
dissertation
30
newspaper article
Eesti teadlaste leiutis: uus koroonaviiruse kiirtest ootab heakskiitu ja otsib tootjat
Ladva, Asso
Õhtuleht
2020
/
Lk. 5
https://dea.digar.ee/article/ohtuleht/2020/12/07/2.12
newspaper article
31
newspaper article
Eesti-Saksa ettevõte arendas laboritäpsusega koroona kiirtesti
Eesti Elu : [Kanada ajaleht]
2020
/
lk. 3
https://eestielu.com/et/eesti-elu/paberleht/11209-eesti-elu-nr-48-4-detsember-2020-digileht
newspaper article
32
newspaper article
Ei tea mida ülikoolis õppida? Erialatest aitab teha õige valiku
postimees.ee
2023
Ei tea mida ülikoolis õppida? Erialatest aitab teha õige valiku Ei tea mida ülikoolis õppida? Erialatest aitab teha õige valiku
newspaper article
33
book article
E-learning tools for teaching self-test of digital electronics
Jutman, Artur
;
Gramatova, Elena
;
Pikula, T.
;
Ubar, Raimund-Johannes
15 EAEEIE International Conference on Innovation in Education for Electrical and Information Engineering : Sofia, Bulgaria, May 27-29, 2004
2004
/
p. 267-272 : ill
book article
34
book
ESTEL test : tests of the English language : lower-intermediate level
Kokkota, Valmar
1999
https://www.ester.ee/record=b1056546*est
book
35
journal article EST
/
journal article ENG
Evaluation of DOAC dipstick test for detecting direct oral anticoagulants in urine compared with a clinically relevant plasma threshold concentration
Örd, Lenna
;
Marandi, Toomas
;
Märk, Marit
;
Raidjuk, Leonid
;
Kostjuk, Jelena
;
Banys, Valdas
;
Krause, Karit
;
Pikta, Marika
Clinical and Applied Thrombosis/Hemostasis
2022
/
8 p. : ill
https://doi.org/10.1177/10760296221084307
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
36
journal article
Evaluation of some mechanical and physical properties of ‘Oriented Strand Board (OSB/3)’ following cyclic accelerated aging tests
Lille, Harri
;
Kiviste, Mihkel
;
Telling, Renar
;
Leppik, Taimo
;
Virro, Indrek
;
Kask, Regino
European Journal of Wood and Wood Products
2022
/
p. 731–740
https://doi.org/10.1007/s00107-022-01803-9
journal article
37
book article
Exact static compaction of independent test sequences
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 315-318 : ill
book article
38
book article
Exact static compaction of sequential circuit tests using branch-and-bound and search state registration
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
ETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest
2002
/
p. 19-20
https://www.researchgate.net/publication/250423148_Exact_Static_Compaction_of_Sequential_Circuit_Tests_Using_Branch_and-Bound_and_Search_State_Registration
book article
39
book article
Feste Wortverbindungen des Deutschen als Objekt des Testens
Umborg, Viktoria
2nd regional seminar Testing in foreign language teaching : Tallinn, February 25-26, 1986 : summaries
1986
/
S. 79-81
https://www.ester.ee/record=b1217950*est
book article
40
book
Filosoofia ja loogika e-kursuste enesetestid [Elektrooniline teavik]
Meos, Indrek
2020
https://www.indrekmeos.xyz/enesetestid.html
book
41
book
Filosoofia ja loogika testid [Elektrooniline teavik]
Meos, Indrek
2020
https://filosoofia.indrekmeos.xyz/testid/
book
42
book article
FTGEN - система генерирования функциональных тестов
Ubar, Raimund-Johannes
;
Dušina, Julia
;
Zaugarov, Viktor
;
Крупнова Е.
;
Storožev, Sergei
Proceedings of CAD-93 : new information technologies for science, education and business, Yalta, May 4-13, 1993
1993
/
p. 123-125
book article
43
book article
Functional test program generation for digital systems
Ubar, Raimund-Johannes
;
Dušina, Julia
;
Krupnova, Helena
;
Storožev, Sergei
;
Zaugarov, Viktor
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 1994
1994
/
p. 14-18: ill
book article
44
newspaper article
Geneetiline test aitab arstidel määrata sobivaima ravimi ja annuse
Laanetu, Mari-Liis
;
Viigimaa, Margus
mu.ee
2024
Geneetiline test aitab arstidel määrata sobivaima ravimi ja annuse
newspaper article
45
book article
Generating tests from EFSM models using guided model checking and iterated search refinment
Ernits, Juhan-Peep
;
Kull, Andres
;
Raiend, Kullo
;
Vain, Jüri
Formal Approach to Software Testing and Runtime Verification : First Combined International Workshops FATES 2006 and RV 2006 : Seattle, WA, USA, August 15-16, 2006 : revised selected papers
2006
/
p. 85-99
https://link.springer.com/chapter/10.1007/11940197_6
book article
46
journal article
Hierarchical approaches to test generation and fault simulation
Ubar, Raimund-Johannes
Radioelectronics and informatics
2003
/
p. 204
journal article
47
book article
Hierarchical defect level test quality analysis
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
VILAB User Forum
2000
/
[11] p
book article
48
book article
Hierarchical test generation based on alternative graph model
Ubar, Raimund-Johannes
Proceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 1995
1995
/
p. 18
book article
49
book article
Hierarchical test generation for complex digital systems with control and data processing parts
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 43-52
book article
50
book article
Hierarchical test generation. SEMI show slides
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 53-64
book article
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