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digitaalelektroonika (subject term)
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26
dissertation
Digital test in WEB-based environment
Ivask, Eero
2006
https://www.ester.ee/record=b2158119*est
dissertation
27
book article
Distributed approach for genetic test generation in the field of digital electronics
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Intelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 2008
2008
/
p. 127-136
book article
28
journal article
Effective self adaptive multiple source localization technique by primal dual interior point method in binary sensor networks
Khan, Muhidul Islam
;
Xia, Kewen
IEEE communications letters
2017
/
p. 1119-1122 : ill
https://doi.org/10.1109/LCOMM.2017.2657508
journal article
29
book article
E-learning environment in the area of digital microelectronics
Jutman, Artur
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
ITHET 2004 : proceedings of the Fifth International Conference on Information Technology based Higher Education and Training : 31 May - 2 June, 2004, Istanbul, Turkey
2004
/
p. 278-283 : ill
book article
30
book article
E-learning of digital logic
Robal, Tarmo
;
Brik, Marina
;
Aarna, Margit
EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden
2006
/
p. 120-123 : ill
book article
31
book article
E-learning tools for teaching self-test of digital electronics
Jutman, Artur
;
Gramatova, Elena
;
Pikula, T.
;
Ubar, Raimund-Johannes
15 EAEEIE International Conference on Innovation in Education for Electrical and Information Engineering : Sofia, Bulgaria, May 27-29, 2004
2004
/
p. 267-272 : ill
book article
32
book article
E-learning tools for teaching the decomposition based digital synthesis
Sudnitsõn, Aleksander
;
Kruus, Margus
EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden
2006
/
p. 63-66
https://pld.ttu.ee/~kruus/EWME_06_sudn.pdf
book article
33
book article EST
/
book article ENG
Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Orasson, Elmet
;
Raik, Jaan
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers
2016
/
p. 23-45 : ill
https://doi.org/10.1007/978-3-319-46097-0_2
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
34
book article
FPGA platform based digital design education
Mihhailov, Dmitri
;
Kruus, Margus
;
Sudnitsõn, Aleksander
Proceedings of the 9th International Conference on Computer Systems and Technologies and Workshop for PhD Students in Computing : CompSysTech'2008. Vol. 374, ACM International Conference Proceeding Series
2008
/
p. IV.4-1 - IV.4-6 : ill
https://dl.acm.org/doi/pdf/10.1145/1500879.1500938
book article
35
book article
Functional level testability analysis for digital circuits
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993
1993
/
p. 545-546
book article
36
journal article
Hierarchical physical defect reasoning in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Brik, Marina
Estonian journal of engineering
2011
/
3, p. 185-200
journal article
37
book article
Hybrid BIST optimization using reseeding and test set compaction
Jervan, Gert
;
Orasson, Elmet
;
Kruus, Helena
;
Ubar, Raimund-Johannes
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 596-603 : ill
http://dx.doi.org/10.1109/DSD.2007.4341529
book article
38
book
Hybrid built-in self-test and test generation techniques for digital systems
Jervan, Gert
2005
https://www.ester.ee/record=b2177537*est
book
39
book article
Investigating defects in digital circuits by Boolean differential equations
Kruus, Helena
;
Orasson, Elmet
;
Robal, Tarmo
;
Ubar, Raimund-Johannes
The 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)
2004
/
p. 432-435
book article
40
dissertation
Investigation and development of test generation methods for control part of digital systems
Brik, Marina
2002
http://www.ester.ee/record=b1688656*est
dissertation
41
dissertation
Methods for improving the accuracy and efficiency of fault simulation in digital systems = Meetodid digitaalsüsteemide rikete simuleerimise täpsuse ja efektiivsuse tõstmiseks
Kõusaar, Jaak
2019
https://digi.lib.ttu.ee/i/?11667
dissertation
42
book
Mikroprotsessortehnika
Lehtla, Tõnu
;
Kulmar, Lembit
1995
https://www.ester.ee/record=b1054894*est
book
43
journal article
Module level defect simulation in digital circuits
Kuzmicz, Wieslaw
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the Estonian Academy of Sciences. Engineering
2001
/
4, p. 253-268
journal article
44
book article
Multi-valued simulation of digital circuits with structurally synthesized binary decision diagrams
Ubar, Raimund-Johannes
Multiple valued logic. Vol. 4
1998
/
p. 141-157
book article
45
journal article EST
/
journal article ENG
Overview of digital twin platforms for EV applications
Mohamed, Mahmoud Ibrahim Hassanin
;
Rjabtšikov, Viktor
;
Gilbert, Rolando
Sensors
2023
/
art. 1414, 15 p. : ill
https://doi.org/10.3390/s23031414
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
46
book article
Research environment for teaching digital test
Ivask, Eero
;
Jutman, Artur
;
Orasson, Elmet
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Synergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 2
2004
/
p. 468-473 : ill
https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf
book article
47
dissertation
Selected issues of modeling, verification and testing of digital systems
Jutman, Artur
2004
https://www.ester.ee/record=b1989760*est
dissertation
48
journal article
Silmade asemel, ehk, Lihtne digitaalne ostsilloskoop arvutile
Sinivee, Veljo
Arvutikasutaja
2005
/
2, lk. 10-12 : ill
https://artiklid.elnet.ee/record=b1050354*est
journal article
49
book article
Simulation-based verification with APRICOT framework using high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
East-West Design & Test Symposium : Moscow, September 18-21, 2009
2009
/
p. 13-16 : ill
book article
50
book
Sissejuhatus digitaaltehnikasse
Lehtla, Madis
2016
http://www.ester.ee/record=b4618200*est
book
Number of records 56, displaying
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