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Jutman, Artur (TTÜ author)
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101
journal article EST
/
journal article ENG
Optimization of boundary scan tests using FPGA-based efficient scan architectures
Aleksejev, Igor
;
Devadze, Sergei
;
Jutman, Artur
;
Shibin, Konstantin
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 245-255 : ill
https://doi.org/10.1007/s10836-016-5588-y
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
102
book article
Optimization of structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Vassiljeva, T.
;
Raik, Jaan
;
Jutman, Artur
;
Tombak, Mati
;
Peder, Ahti
Proceedings of the Fourth IASTED International Conference on Modelling, Simulation, and Optimization : August 17-19, 2004, Kavai, Hawaii, USA
2004
/
p. 234-240 : ill
book article
103
book article
Overview of e-learning environment for web-based study of testing and diagnostics of digital systems
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Microelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 2004
2004
/
p. 253-258 : ill
https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41
book article
104
book article
Overview of e-learning environment for web-based study of testing and diagnostics of digital systems
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 2004
2004
/
p. 173-176
https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41
book article
105
book article
Parallel exact critical path tracing fault simulation with reduced memory requirements
Devadze, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 2009
2009
/
p. 155-160 : ill
https://ieeexplore.ieee.org/document/4938046
book article
106
book article
Parallel fault backtracing for calculation of fault coverage
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
43rd International Conference on Microelectronics, Devices and Materials and the Workshop on Electronic Testing : September 12. - September 14.2007, Bled, Slovenia : MIDEM conference 2007 proceedings
2007
/
p. 165-170 : ill
book article
107
book article
Parallel fault backtracing for calculation of fault coverage
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
Proceedings of the ASP-DAC 2008 : [13th] Asia and South Pacific Design Automation Conference 2008 : January 21-24, 2008, COEX, Seoul, Korea
2008
/
p. 667-672 : ill
https://www.researchgate.net/publication/221153650_Parallel_fault_backtracing_for_calculation_of_fault_coverage
book article
108
book article
Parallel X-fault simulation with critical path tracing technique [Electronic resource]
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
DATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 2010
2010
/
p. 879-884 [CD-ROM]
https://www.researchgate.net/publication/221341788_Parallel_X-fault_simulation_with_critical_path_tracing_technique
book article
109
book article
Post-silicon validation of IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Jutman, Artur
;
Squillero, Giovanni
;
Tšertov, Anton
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791546
book article
110
book article
Practical works for on-line teaching design and test of digital circuits
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Hahanov, V.
;
Skvortsova, O.
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume III
2002
/
p. 1223-1226 : ill
http://dx.doi.org/10.1109/ICECS.2002.1046474
book article
111
book article
Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687
Jutman, Artur
;
Shibin, Konstantin
;
Devadze, Sergei
IEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings
2016
/
p. 240-249 : ill
https://doi.org/10.1109/AUTEST.2016.7589605
book article
112
book article
Research environment for teaching digital test
Ivask, Eero
;
Jutman, Artur
;
Orasson, Elmet
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Synergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 2
2004
/
p. 468-473 : ill
https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf
book article
113
journal article
Research in digital design and test at Tallinn University of Technology
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Jutman, Artur
;
Raik, Jaan
;
Ellervee, Peeter
;
Kruus, Margus
Radioelectronics & informatics
2008
/
p. 4-12 : ill
http://www.ewdtest.com/ri/%E2%84%96-1-40-january-march-2008/
journal article
114
book article
Research on digital system design and test at Tallinn University of Technology
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Hollstein, Thomas
;
Jervan, Gert
;
Jutman, Artur
;
Kruus, Margus
;
Raik, Jaan
Research in Estonia : present and future
2011
/
p. 184-205 : ill
book article
115
book article
Reseeding using compaction of pre-generated LFSR sequences
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : 31st August to 3rd September 2008, Malta : conference guide
2008
/
p. 215
book article
116
book article
Reseeding using compaction of pre-generated LFSR sub-sequences
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : Malta
2008
/
p. 1290-1295 : ill
http://dx.doi.org/10.1109/ICECS.2008.4675096
book article
117
book article
Re-using chip level DFT at board level
Gu, Xinli
;
Jutman, Artur
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
2012
/
1 p
book article
118
book article
Run-time reconfigurable instruments for advanced board-level testing
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
IEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings
2016
/
p. 385-392 : ill
https://doi.org/10.1109/AUTEST.2016.7589627
book article
119
journal article
Run-time reconfigurable instruments for advanced board-level testing
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
IEEE instrumentation & measurement magazine
2017
/
p. 23-30 : ill
https://doi.org/10.1109/MIM.2017.8006390
journal article
120
dissertation
Selected issues of modeling, verification and testing of digital systems
Jutman, Artur
2004
https://www.ester.ee/record=b1989760*est
dissertation
121
book article
Sequential test set compaction in LFSR reseeding
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
Design and test technology for dependable systems-on-chip
2011
/
p. 476-493 : ill
https://ieeexplore.ieee.org/document/4738292
book article
122
book article
Shift register based TPG for at-speed interconnect BIST
Jutman, Artur
MIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 2
2004
/
p. 751-754 : ill
https://ieeexplore.ieee.org/document/1314941?signout=success
book article
123
book article
Simulation-based equivalence checking between IEEE 1687 ICL and RTL
Damljanovic, Aleksa
;
Jutman, Artur
;
Portolan, Michele
;
Tšertov, Anton
2019 IEEE International Test Conference (ITC)
2019
/
paper. 7.3, 8 p. : ill
https://doi.org/10.1109/ITC44170.2019.9000181
book article
124
book article
SoC and board modeling for processor-centric board testing
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
14th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2011 : 31 August - 2 September 2011, Oulu, Finland : proceedings
2011
/
p. 575-582 : ill
https://ieeexplore.ieee.org/document/6037463
book article
125
book article
SSBDD model : advantageous properties and efficient simulation algorithms
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
ETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest
2002
/
p. 345-346 : ill
book article
Number of records 157, displaying
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1.
Jutman, Artur
2.
Jutman, Valentin
3.
Abdullin, Artur
4.
Abels, Artur
5.
Adson, Artur
6.
Alliksaar, Artur
7.
Binczewski, Artur
8.
Dahlberg, Artur
9.
Hain, Artur
10.
Izumrudov, Artur
11.
Jugaste, Artur
12.
Jõgi, Artur
13.
Jürvetson, Artur
14.
Keller, Artur
15.
Kivikas, Artur
16.
Klauson, Artur
17.
Lavrov, Artur
18.
Leetberg, Artur
19.
Liefländer, Artur
20.
Linari-Linholm, Artur
21.
Lobov, Artur
22.
Luha, Artur Heinrich
23.
Medvid, Artur
24.
Mägi, Artur
25.
Nilson, Artur
26.
Noole, Artur
27.
Puksov, Artur
28.
Rieger, Artur
29.
Ruszczak, Artur
30.
Rätsep, Artur
31.
Talvik, Artur
32.
Toikka, Artur
33.
Tooman, Artur
CV
25
1.
Jutman, Artur 1976
2.
Jutman, Valentin 1938
3.
Georgin, Artur 1891-1954
4.
Hain, Artur 1925-2011
5.
Jõgi, Artur 1978
6.
Klauson, Artur 1995
7.
Laksberg, Artur 1975
8.
Lavrov, Artur 1999
9.
Leetberg, Artur 1886-1969
10.
Leetna, Karl Artur
11.
Liefländer, Artur
12.
Linari, Artur-Aleksander
13.
Linari-Linholm, Artur A. 1903-1983
14.
Luha, Artur Heinrich 1892-1953
15.
Luhha, Artur Heinrich
16.
Mitsulis, Artur 1981
17.
Mitšulis, Artur
18.
Noole, Artur 1985
19.
Perna, Artur (-1939)
20.
Perna, Artur 1881-1940
21.
Pihlak, Artur Aleksander 1885-1941
22.
Pärna, Artur 1915-1943
23.
Sagarov, Artur
24.
Toikka, Artur 1998
25.
Šagarov, Artur
name of the person
21
1.
Jutman, Artur
2.
Andersalu, Artur
3.
Georgin, Artur Mihkel, 1891-1954
4.
Hain, Artur
5.
Lavrov, Artur
6.
Lessner, Artur
7.
Linari-Linholm, Artur, 1903-1983
8.
Lind, Artur
9.
Lind, Artur, 1927-1989
10.
Luha, Artur Heinrich, 1892-1953
11.
Mihhailov, Artur
12.
Noole, Artur
13.
Ojasalu, Artur
14.
Perna, Artur, 1881-1940
15.
Pihlak, Artur-Aleksander, 1885-1941
16.
Prees, Artur
17.
Pärna, Artur
18.
Saaliste, Artur
19.
Sagarov, Artur
20.
Talvik, Artur, 1964-
21.
Vassar, Artur, 1911-1977
subject term
1
1.
Artur Uin ja Ko, veinitööstus
TTÜ subject term
1
1.
Perna, Artur, 1881-1940
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