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Orasson, Elmet (TTÜ author)
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1
book article
A benchmark suite for evaluating the efficiency of test tools
Kruus, Helena
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Gorev, Maksim
;
Pesonen, Vadim
;
Devadze, Sergei
;
Orasson, Elmet
;
Brik, Marina
;
Min, Mart
;
Annus, Paul
;
Kruus, Margus
;
Meigas, Kalju
BEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia
2012
/
p. 85-88 : ill
book article
2
book article
Combining learning, training and research in laboratory course for design and test
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 221-224 : ill
https://www.researchgate.net/publication/242397131_Combining_Learning_Training_and_Research_in_Laboratory_Course_for_Design_and_Test
book article
3
book article
Diagnostic software with WEB interface for teaching purposes
Vislogubov, Vladislav
;
Jutman, Artur
;
Kruus, Helena
;
Orasson, Elmet
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 255-258 : ill
book article
4
book article
Double phase fault collapsing with linear complexity in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Orasson, Elmet
;
Josifovska, Galina
;
Oyeniran, Adeboye Stephen
DSD 2015 : 18th Euromicro Conference on Digital Systems Design : 26-28 August 2015, Funchal, Madeira, Portugal
2015
/
p. 700-705 : ill
book article
5
book article
E-learning environment for WEB-based study of testing
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Aleksejev, Igor
;
Tšepurov, Anton
;
Tšertov, Anton
;
Kostin, Sergei
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
Proceedings of the 8th European Workshop on Microelectronics Education : EWME 2010 : Darmstadt, Germany, 10-12 May 2010
2010
/
p. 47-52 : ill
book article
6
book article
E-learning tool and excercises for teaching digital test
Ubar, Raimund-Johannes
;
Orasson, Elmet
Proceedings of the 2nd IEEE Conference on Signals, Systems, Decision and Information Technology : Sousse, Tunisia, 2003
2003
/
[6] p. : ill
https://pld.ttu.ee/dildis/publications/E-Learning%20tool%20and%20Excercises.pdf
book article
7
book article
E-learning tool and excercises for teaching digital test
Ubar, Raimund-Johannes
;
Orasson, Elmet
Proceedings of the 2nd IEEE Conference on Signals, Systems, Decision and Information Technology : Sousse, Tunisia, 2003 : summaries
/
p. 134
book article
8
book article
E-learning tools for digital test
Devadze, Sergei
;
Gorjachev, R.
;
Jutman, Artur
;
Orasson, Elmet
;
Rosin, Vjatšeslav
;
Ubar, Raimund-Johannes
Proc. III International Conference "Distance Learning - Educational Sphere of XXI Century" : Minsk, Belorussia, 2003
2003
/
p. 336-342
book article
9
newspaper article
Elmet Orasson tabab laskesporti
Orasson, Elmet
Mente et Manu
2014
/
lk. 18-19 : fot
https://www.ester.ee/record=b1242496*est
newspaper article
10
book article
Fast test cost calculation for hybrid BIST in digital systems
Orasson, Elmet
;
Raidma, Rein
;
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Peng, Zebo
Euromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings
2001
/
p. 318-325 : ill
https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f
book article
11
book article EST
/
book article ENG
Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Orasson, Elmet
;
Raik, Jaan
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers
2016
/
p. 23-45 : ill
https://doi.org/10.1007/978-3-319-46097-0_2
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
12
book article
Functional built-in self-test for processor cores in SoC
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
;
Evartson, Teet
;
Orasson, Elmet
30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 2012
2012
/
p. 1-4 : ill
book article
13
book article
Graphical user interface for Turbo Tester toolset
Orasson, Elmet
BEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia
2004
/
p. 12 : ill
book article
14
journal article
Hybrid BIST optimization using reseeding and test set compaction
Jervan, Gert
;
Orasson, Elmet
;
Kruus, Helena
;
Ubar, Raimund-Johannes
Microprocessors and microsystems
2008
/
5/6, p. 254-262 : ill
https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288
journal article
15
book article
Hybrid BIST optimization using reseeding and test set compaction
Jervan, Gert
;
Orasson, Elmet
;
Kruus, Helena
;
Ubar, Raimund-Johannes
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 596-603 : ill
http://dx.doi.org/10.1109/DSD.2007.4341529
book article
16
dissertation
Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseks
Orasson, Elmet
2007
https://www.ester.ee/record=b2305436*est
dissertation
17
book article
HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systems
Ubar, Raimund-Johannes
;
Mazurova, Natalja
;
Smahtina, Julia
;
Orasson, Elmet
;
Raik, Jaan
Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004
2004
/
p. 497-502 : ill
book article
18
book article
Interactive teaching software "Introduction to digital test"
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
;
Orasson, Elmet
45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband
2000
/
S. 949-954
book article
19
book article
Internet-based software for teaching test of digital circuits
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 659-662 : ill
https://ieeexplore.ieee.org/document/1003344
book article
20
book article
Internet-based software for teaching test of digital circuits
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Orasson, Elmet
;
Raik, Jaan
;
Evartson, Teet
;
Wuttke, Heinz-Dietrich
Microelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 2002
2002
/
p. 317-320 : ill
https://ieeexplore.ieee.org/document/1003344
book article
21
book article
Investigating defects in digital circuits by Boolean differential equations
Kruus, Helena
;
Orasson, Elmet
;
Robal, Tarmo
;
Ubar, Raimund-Johannes
The 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)
2004
/
p. 432-435
book article
22
book article
Java applet for self-learning of digital test issues [Electronic resource]
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Evartson, Teet
13th EAEEIE Annual Conference, 8th-10th April, 2002, York, England
2002
/
[4] p. [CD-ROM]
book article
23
journal article
Learning digital test and diagnostics via internet
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Kruus, Margus
;
Orasson, Elmet
;
Devadze, Sergei
;
Wuttke, Heinz-Dietrich
International journal of online engineering
2007
/
1, [9] p. : ill
https://www.db-thueringen.de/servlets/MCRFileNodeServlet/dbt_derivate_00032681/iJOE_1681-1221_03_2007_1_361.pdf
journal article
24
journal article
Learning digital test and diagnostics via internet [Electronic resource]
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Kruus, Margus
;
Orasson, Elmet
;
Devadze, Sergei
;
Wuttke, Heinz-Dietrich
International journal of computing & information sciences
2006
/
2, p. 86-96 : ill
journal article
25
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 133-136 : ill
book article
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Orasson, Elmet 1974
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