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51

book article

Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

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Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

52

dissertation

Common-ground energy router structure with enhanced reliability and protection = Ühise nulljuhtmega suurendatud töökindluse ja kaitsega energiaruuterRahimpour, Saeed2024 https://doi.org/10.23658/taltech.45/2024 https://www.ester.ee/record=b5694226*est https://digikogu.taltech.ee/et/Item/520b18fc-f0a8-4a08-ade8-d3b890d253ff

dissertation

Related publications 9

53

book article

Complex delay fault reasoning with sequential 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Aleksejev, Igor2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102403

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54

journal article EST / journal article ENG

Comprehensive Diagnostic Assessment of Inverter Failures in a Utility-Scale Solar Power Plant : A Case Study Based on Field and Laboratory ValidationKull, Karl; Asad, Bilal; Naseer, Muhammad Usman; Kallaste, Ants; Vaimann, ToomasSensors2025 / art. 3717 https://doi.org/10.3390/s25123717

journal article EST / journal article ENG

55

journal article EST / journal article ENG

A Comprehensive Study of Partial Discharge Based Extrinsic Aging in Nomex Insulation Films : Modeling, Simulation and MeasurementChoudhary, Maninder; Shafiq, Muhammad; Bhattarai, Abhinav; Kiitam, Ivar; Taklaja, Paul; Palu, IvoElectric Power Systems Research2025 / art. 111663 https://doi.org/10.1016/j.epsr.2025.111663

journal article EST / journal article ENG

56

book article EST / book article ENG

Condition monitoring and fault detection for electrical machines using IOTRaja, Hadi Ashraf; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, AntsProceedings of the Future Technologies Conference (FTC) 2022. Volume 22023 / p. 162-173 https://doi.org/10.1007/978-3-031-18458-1_12 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

Related publications 1

IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaks

57

book article

Condition monitoring of electrical machinesVaimann, Toomas; Kallaste, Ants11th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 16-21, 20122012 / p. 209-212 : ill

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58

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Condition monitoring of electrical machines and its relation to industrial internetBelahcen, Anouar; Gyftakis, Konstantinos N.; Martinez, Javier; Climente-Alarcon, Vicente; Vaimann, Toomas2015 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD) : proceedings : Castello del Valentino, Torino, Italy, 26-27 March, 20152015 / p. 233-241 : ill http://dx.doi.org/10.1109/WEMDCD.2015.7194535

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59

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Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

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60

journal article

Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphsMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesAutomation and remote control2005 / p. 313-327 : ill https://doi.org/10.1007/s10513-005-0054-9

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61

dissertation

Cost-effective concurrent hardware checkers for network on chip based system on chip = Kulutõhusad süsteemiga paralleelsed rikkemonitorid kiipvõrkudel põhinevatele kiipsüsteemideleHariharan, Ranganathan2019 https://digi.lib.ttu.ee/i/?12854 https://www.ester.ee/record=b5243161*est

dissertation

62

book article

Cost-efficient real-time condition monitoring and fault diagnostics system for BLDC motor using IoT and Machine learningRaja, Hadi Ashraf; Raval, Hardik; Vaimann, Toomas; Kallaste, Ants; Rassõlkin, Anton; Belahcen, AnouarDiagnostika '22 : 2022 International Conference on Diagnostics in Electrical Engineering : conference proceedings2022 / 4 p. https://doi.org/10.1109/Diagnostika55131.2022.9905102

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Related publications 1

IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaks

63

book article

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 108-113 : ill

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64

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Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 61-66 : ill

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65

dissertation

Cross-layer dependability management in network on chip based system on chip = Kiipvõrkudel põhinevate süsteemide kihtideülene usaldatavuse haldusAzad, Siavoosh Payandeh2018 https://digi.lib.ttu.ee/i/?9948 https://www.ester.ee/record=b5056143*est

dissertation

66

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Data-driven cross-layer fault management architecture for sensor networksVihman, Lauri; Kruusmaa, Maarja; Raik, Jaan16th European Dependable Computing Conference : EDCC 2020 : Virtual Conference, Munich, Germany, 7-10 September 2020 : proceedings2020 / art. 20094188, p. 33-40 https://doi.org/10.1109/EDCC51268.2020.00015

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Related publications 1

Data-driven fault-resilient cross-layer sensor network architecture = Andmepõhine tõrkekindel kihtideülene sensorvõrgu arhitektuur

67

dissertation

Data-driven fault-resilient cross-layer sensor network architecture = Andmepõhine tõrkekindel kihtideülene sensorvõrgu arhitektuurVihman, Lauri2024 https://www.ester.ee/record=b5657135*est https://digikogu.taltech.ee/et/Item/00a93258-dc0f-4a4d-822f-099fff757224 https://doi.org/10.23658/taltech.7/2024

dissertation

Related publications 5

68

book article

DECIDER : a decision diagram based hierarchical test generation systemJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 19981998 / p. 269-273 https://www.ida.liu.se/labs/eslab/publications/pap/db/DDECS98.pdf

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69

book article

Deductive fault simulation on structurally synthesized BDDsAarna, Margit; Ubar, Raimund-Johannes; Raik, JaanBEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia2004 / p. 11 : ill

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70

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DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN acceleratorsTaheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, Björn2023 24th International Symposium on Quality Electronic Design (ISQED)2023 / 8 p. : ill https://doi.org/10.1109/ISQED57927.2023.10129353

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Related publications 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

71

book article

DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability AssessmentAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimIEEE European Test Symposium (ETS) : Venice, Italy, 22-26 May 2023 : proceedings2023 / 6 p. : ill https://doi.org/10.1109/ETS56758.2023.10174133

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Related publications 2

72

journal article

DeepVigor+: Scalable and Accurate Semi-Analytical Fault Resilience Analysis for Deep Neural NetworksAhmadilivani, Mohammad Hasan; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimarXiv.org2024 / 14 p. : ill https://doi.org/10.48550/arXiv.2410.15742

journal article

Related publications 1

Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks

73

book article

Defect oriented fault coverage of 100stuck-at fault test setsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 511-516 : ill https://repo.pw.edu.pl/info.seam?ps=20&id=WUT7e20f35d67ae45d3b2d1264d7a4ba722&lang=en&pn=1&cid=156607

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74

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Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

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Defect-oriented library builder and hierarchical test generationCibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 163-168 : ill

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