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101
book
Elektriohutus madalpingevõrkudes vahelduvpingega kuni 1000 V ja alalispingega kuni 1500 V. Kaitsesüsteemide katsetus-, mõõte- ja seireseadmed
Risthein, Endel
2009
https://www.ester.ee/record=b2462036*est
book
102
book
Elektriohutus madalpingevõrkudes vahelduvpingega kuni 1000 V ja alalispingega kuni 1500 V. Kaitsesüsteemide katsetus-, mõõte- ja seireseadmed
Risthein, Endel
2009
https://www.ester.ee/record=b2478889*est
book
103
book
Elektriohutus madalpingevõrkudes vahelduvpingega kuni 1000 V ja alalispingega kuni 1500 V. Kaitsesüsteemide katsetus-, mõõte- ja seireseadmed
Risthein, Endel
2009
https://www.ester.ee/record=b2478886*est
book
104
book
Elektriohutus madalpingevõrkudes vahelduvpingega kuni 1000 V ja alalispingega kuni 1500 V. Kaitsesüsteemide katsetus-, mõõte- ja seireseadmed
Risthein, Endel
2009
https://www.ester.ee/record=b2478887*est
book
105
book
Elektriohutus madalpingevõrkudes vahelduvpingega kuni 1000 V ja alalispingega kuni 1500 V. Kaitsesüsteemide katsetus-, mõõte- ja seireseadmed
Risthein, Endel
2010
https://www.ester.ee/record=b2594967*est
book
106
book
Elektriohutus madalpingevõrkudes vahelduvpingega kuni 1000 V ja alalispingega kuni 1500 V. Kaitsesüsteemide katsetus-, mõõte- ja seireseadmed
Risthein, Endel
2010
https://www.ester.ee/record=b2594972*est
book
107
book article
Enabling cross-layer reliability and functional safety assessment through ML-based compact models
Alexandrescu, Dan
;
Balakrishnan, Aneesh
;
Lange, Thomas
;
Glorieux, Maximilien
Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition
2020
/
6 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159750
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
108
book article
Environment for fault simulation acceleration on FPGA
Ellervee, Peeter
;
Raik, Jaan
;
Tihhomirov, Valentin
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 217-220 : ill
book article
109
journal article
Environment for FPGA-based fault emulation
Ellervee, Peeter
;
Raik, Jaan
;
Tammemäe, Kalle
;
Ubar, Raimund-Johannes
Proceedings of the Estonian Academy of Sciences. Engineering
2006
/
3-2, p. 323-335 : ill
journal article
110
journal article
Environment for the analysis of functional self-test quality in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Kruus, Helena
;
Aarna, Margit
;
Devadze, Sergei
Proceedings of the Estonian Academy of Sciences
2014
/
p. 151-162 : ill
https://artiklid.elnet.ee/record=b2673964*est
journal article
111
book article
Estimation of complex derivatives application for fault diagnosis
Baraškova, Tatjana
;
Pascault, D.
17th International conference on "Mathematical Modelling and Analysis" : June 6-9, 2012, Tallinn, Estonia : abstracts
2012
/
p. 19
book article
112
journal article EST
/
journal article ENG
Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuits
Pagliarini, Samuel Nascimento
;
Benites, Luis
;
Martins, Mayler
;
Rech, Paolo
;
Kastensmidt, Fernanda
IEEE transactions on nuclear science
2021
/
p. 1045-1053
https://doi.org/10.1109/TNS.2021.3070643
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
113
journal article
Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
International journal of microelectronics and computer science
2018
/
p. 9−18
https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1
https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf
journal article
114
newspaper article
Experts: No need to worry about the impact of solar storms today
Piir, Rait
news.err.ee
2024
Experts: No need to worry about the impact of solar storms today
newspaper article
115
journal article EST
/
journal article ENG
Explainability and transparency of classifiers for air-handling unit faults using explainable artificial intelligence (XAI)
Meas, Molika
;
Machlev, Ram
;
Köse, Ahmet
;
Tepljakov, Aleksei
;
Loo, Lauri
;
Levron, Yoash
;
Petlenkov, Eduard
;
Belikov, Juri
Sensors
2022
/
art. 6338 : ill
https://doi.org/10.3390/s22176338
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
116
book article
Extended checkers for control part of routers in network-on-chips
Hariharan, Ranganathan
;
Niazmand, Behrad
;
Hollstein, Thomas
;
Raik, Jaan
;
Jervan, Gert
MEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France
2015
/
p. 36-39 : ill
book article
117
newspaper article
Facebooki katkestus mõjutas nii ettevõtete kui ka riikide toimepidevust [Võrguväljaanne]
Pärli, Merilin
err.ee
2021
"Facebooki katkestus mõjutas nii ettevõtete kui ka riikide toimepidevust"
newspaper article
118
newspaper article
Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike [Võrguväljaanne]
ohtuleht.ee
2021
"Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike"
newspaper article
119
journal article EST
/
journal article ENG
Failure consequence evaluation of uncontrollable district heating network
Mao, Ding
;
Wang, Peng
;
Ju, Yuchen
;
Ni, Long
Sustainable cities and society
2022
/
art. 103593, 16 p. : ill
https://doi.org/10.1016/j.scs.2021.103593
Journal metrics at Scopus
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journal article EST
/
journal article ENG
120
journal article
Failure mechanisms in oil-shale pillars
Pastarus, Jüri-Rivaldo
Oil shale
1994
/
3, p. 251-257: ill
https://kirj.ee/wp-content/plugins/kirj/pub/OS-3-1994-251-257_20230316182205.pdf
journal article
121
book article
Fast extended test access via JTAG and FPGAs
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
International Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings
2009
/
p. 1-7 : ill
http://dx.doi.org/10.1109/TEST.2009.5355668
book article
122
book article
Fast fault simulation for extended class of faults in scan-path circuits
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
Proceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam
2010
/
p. 14-19
https://ieeexplore.ieee.org/document/5438717
book article
123
journal article EST
/
journal article ENG
Fast identification of true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jürimägi, Lembit
Microelectronics reliability
2018
/
p. 252-261 : ill
https://doi.org/10.1016/j.microrel.2017.11.027
Journal metrics at Scopus
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journal article EST
/
journal article ENG
124
book article
Fault collapsing with linear complexity in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France
2010
/
p. 653-656 : ill
https://ieeexplore.ieee.org/document/5537504
book article
125
journal article EST
/
journal article ENG
Fault detecting accuracy of mechanical damages in rolling bearings
Kudelina, Karolina
;
Baraškova, Tatjana
;
Shirokova, Veroonika
;
Vaimann, Toomas
;
Rassõlkin, Anton
Machines
2022
/
art. 86
https://doi.org/10.3390/machines10020086
Journal metrics at Scopus
Article at Scopus
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journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil
Number of records 303, displaying
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