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76
journal article
Defect-oriented mixed-level fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
Facta Universitatis [Niš]. Series electronics and energetics
2002
/
1, April, p. 123-136 : ill
journal article
77
book article
Defect-oriented modul-level fault diagnosis in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
2011
/
p. 81-86
book article
78
book article
Defect-oriented test generation and fault simulation in the environment of MOSCITO
Schneider, Andre
;
Diener, Karl-Heinz
;
Gramatova, Elena
;
Fisherova, Maria
;
Ivask, Eero
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
;
Kuzmicz, W.
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 303-306 : ill
book article
79
book article
Defect-oriented test generation using probabilistic estimation
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000
2001
/
p. 131-136 : ill
book article
80
book
Defektide ja rikete seoste analüüs : lepingu Lep16039 aruanne [Võrguväljaanne]
Palu, Ivo
;
Keel, Matti
;
Tammoja, Heiki
2016
https://www.elektrilevi.ee/-/doc/6305157/ettevottest/defektide_rikete_aruanne.pdf
book
81
book article
DefSim - the defective IC
Pleskacz, Witold A.
;
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
DATE 2007 : Design Automation and Test in Europe : Nice, France, April 16-20, 2007
2007
/
p. s96 (2 p.)
book article
82
book article
Delay fault investigation at the register transfer level
Fischerova, Maria
;
Gramatova, Elena
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 141-144
book article
83
dissertation
Dependability improvements of NoC-based systems = Töökindluse parandamine kiipvõrkudel põhinevates süsteemides
Niazmand, Behrad
2018
https://digi.lib.ttu.ee/i/?9879
https://www.ester.ee/record=b4907650*est
dissertation
84
book article EST
/
book article ENG
Dependence of the carrier removal rate in 4H-SIC PN structures on irradiation temperature
Lebedev, Alexander A.
;
Davydovskaya, Klavdya S.
;
Kozlovski, Vitali V.
;
Korolkov, Oleg
;
Sleptsuk, Natalja
;
Toompuu, Jana
Silicon Carbide and Related Materials 2018 : 12th European Conference on Silicon Carbide and Related Materials (ECSCRM 2018) : Selected, peer reviewed papers from the European Conference on Silicon Carbide and Related Materials (ECSCRM 2018), September 2-6, 2018,Birmingham, UK
2019
/
p. 730-733
https://doi.org/10.4028/www.scientific.net/MSF.963.730
Conference proceeding at Scopus
Article at Scopus
book article EST
/
book article ENG
85
journal article
Design error diagnosis in digital circuits with stuck-at fault model
Jutman, Artur
;
Ubar, Raimund-Johannes
Microelectronics reliability
2000
/
p. 307-320 : ill
https://doi.org/10.1016/S0026-2714(99)00203-6
journal article
86
book article
Design error diagnosis in digital circuits without error model
Ubar, Raimund-Johannes
;
Borrione, Dominique
VLSI : systems on a chip : IFIP TC10 WG10.5 Tenth International Conference on Very Large Scale Integration (VLSI'99) : December 1-4, 1999, Lisboa, Portugal
1999
/
p. 281-292 : ill
https://www.researchgate.net/publication/292157544_Design_Error_Diagnosis_in_Digital_Circuits_without_Error_Model
book article
87
book article
Design error diagnosis in scan-path designs
Ubar, Raimund-Johannes
2nd IEEE Latin American Test Workshop : LATW 2001 : Cancun, Mexico, February 11-14, 2001 : digest of papers
2001
/
p. 162-168 : ill
book article
88
journal article
Design error diagnosis with re-synthesis in combinational circuits
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2003
/
1, p. 73-82 : ill
https://link.springer.com/article/10.1023/A:1021948013402
journal article
89
book article
Design error localization in digital circuits by stuck-at fault test patterns
Jutman, Artur
;
Ubar, Raimund-Johannes
[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2
2000
/
p. 723-726
https://ieeexplore.ieee.org/document/838792
book article
90
book article
Design issues of redundant protection and supervision system for the special purpose power converters [Electronic resource]
Vinnikov, Dmitri
;
Roasto, Indrek
;
Vodovozov, Valery
International Conference on Renewable Energies and Power Quality : ICREPQ'09 : Valencia, Spain, 15th to 17th April 2009
2009
/
[6] p. [CD-ROM]
https://www.icrepq.com/ICREPQ%2709/356-vinnikov.pdf
book article
91
book article
Design technologies for system-on-chip : fault simulation in complex digital designs
Hahanov, V.
;
Ubar, Raimund-Johannes
Автоматизированные системы управления и приборы автоматики, 2003
2003
/
p. 16-35
book article
92
journal article EST
/
journal article ENG
Detection of induction motor broken bars in grid and frequency converter supply
Vaimann, Toomas
;
Belahcen, Anouar
;
Martinez, Javier
;
Kilk, Aleksander
Przeglad elektrotechniczny
2014
/
p. 90-94 : ill
https://www.pe.org.pl/articles/2014/1/22.pdf
Journal metrics at Scopus
Article at Scopus
journal article EST
/
journal article ENG
93
book article
Determination of the nonfaulty limits of circuit characteristics in the fault identification of discrete-type circuits
Gadzheva, Elissaveta
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 97-100: ill
book article
94
book article
Determined-safe faults identification : a step towards ISO26262 hardware compliant designs
Augusto da Silva, Felipe
;
Bagbaba, Ahmet Cagri
;
Sartoni, Sandro
;
Cantoro, Riccardo
;
Sonza Reorda, Matteo
;
Hamdioui, Said
;
Sauer, Christian
2020 25th IEEE European Test Symposium (ETS)
2020
/
6 p. : ill
https://doi.org/10.1109/ETS48528.2020.9131568
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
95
book article
Determining the unknown faults of the HV overhead lines
Taklaja, Paul
;
Niitsoo, Jaan
;
Palu, Ivo
Proceedings of the 13th International Scientific Conference Electric Power Engineering 2012 : EPE 2012 : Brno. Vol. 1
2012
/
p. 187-192 : ill
book article
96
dissertation
Development of a Substation Risk-Based Asset Management Decision-Making Process in the Case of Insuffcient Information = Alajaama riskipõhise varahalduse otsustusprotsessi arendamine ebapiisava sisendteabe tingimustes
Andreesen, Guido
2025
https://www.ester.ee/record=b5754736*est
https://digikogu.taltech.ee/et/Item/49e349b9-c62b-4a9e-af14-5c8408e54028
https://doi.org/10.23658/taltech.52/2025
dissertation
Related publications
4
Methodology for forecasting the cost of substation asset management in upcoming future
Cost-efficient improvement of power system’s reliability within limited funds
Maximum risk calculation process for individual substation equipment in primary side
Determining cost-efficient sequence of condition inspection based on estimated condition data
97
book article
A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Fieback, Moritz
;
Wu, Lizhou
;
Jenihhin, Maksim
;
Taouil, Mottaqiallah
;
Hamdioui, Said
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
2020
/
p. 792-797
https://doi.org/10.23919/DATE48585.2020.9116278
book article
98
dissertation
DfT-based external test and diagnosis of mesh-like networks on chips = Testitavusel põhinev välise testi ja diagnoosi meetod kahemõõtmelistele kiipvõrkudele
Govind, Vineeth
2009
https://digi.lib.ttu.ee/i/?454
https://www.ester.ee/record=b2539211*est
dissertation
99
book article
Diagnostic modeling of digital systems with low- and high-level decision diagrams
Ubar, Raimund-Johannes
LATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]
2013
/
[1] p
book article
100
book article
Diagnostic modeling of digital systems with multi-level decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Jenihhin, Maksim
Design and test technology for dependable systems-on-chip
2011
/
p. 92-118 : ill
https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams
book article
Number of records 438, displaying
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