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Ubar, Raimund-Johannes (TTÜ author)

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326

journal article

Hierarchical physical defect reasoning in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Brik, MarinaEstonian journal of engineering2011 / 3, p. 185-200

journal article
327

book article

Hierarchical test generation based on alternative graph modelUbar, Raimund-JohannesProceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 19951995 / p. 18

book article
328

journal article

Hierarchical test generation for combinational circuits with real defects coverageCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2002 / p. 1141-1149 : ill

journal article
329

book article

Hierarchical test generation for complex digital systems with control and data processing partsUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 43-52

book article
330

dissertation

Hierarchical test generation for digital circuits represented by Decision Diagrams : thesis on informatics and system engineeringRaik, Jaan2001 https://www.ester.ee/record=b1578107*est

dissertation
331

book article

Hierarchical test generation for digital systemsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 131-136: ill

book article
332

book article

Hierarchical test generation for digital systems based on combining bottom-up and top-down approachesRaik, Jaan; Ubar, Raimund-JohannesWorld Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 11998 / p. 374-381: ill

book article
333

book article

Hierarchical test generation for finite state machinesBrik, Marina; Ubar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 319-324: ill

book article
334

book article

Hierarchical test generation with multi-level decision diagram modelsJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 19981998 / p. 26-33

book article
335

book article

Hierarchical test generation. SEMI show slidesUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 53-64

book article
336

book article

Hierarchical test synthesis for digital systems using alternative graph modelUbar, Raimund-JohannesQuantitative aspects of designing and validating dependable computing systems1995

book article
337

book article

Hierarchical timing-critical paths analysis in sequential circuitsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Kostin, Sergei2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain2018 / 6 p. : ill https://doi.org/10.1109/PATMOS.2018.8464176

book article
338

book article

High level fault modeling in digital systemsUbar, Raimund-Johannes; Aarna, Margit; Brik, Marina; Raik, JaanSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 486-491

book article
339

journal article

High quality test generation for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, JaanRomanian journal of information science and technology2005 / 1, p. 73-84 : ill

journal article
340

book article

High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

book article
341

book article

High-level combined deterministic and pseudo-exhuastive test generation for RISC processorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

book article
342

book article

High-level decision diagram based fault models for targeting FSMsRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 353-358 : ill http://dx.doi.org/10.1109/DSD.2006.60

book article
343

book article

High-Level Decision Diagram manipulations for code coverage analysisMinakova, Karina; Reinsalu, Uljana; Tšepurov, Anton; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 207-210 : ill

book article
344

book article

High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

book article
345

book article

High-level decision diagrams for improving simulation performance of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Morawiec, AdamSCI 2000 : World Multiconference on Systemics, Cybernetics and Informatics : July 23-26, 2000, Orlando, Florida, USA : proceedings. Volume IX, Industrial Systems2000 / p. 62-67 : ill

book article
346

book article

High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

book article
347

book article

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

book article
348

book article

High-level functional test generation for microprocessor modulesOyeniran, Adeboye Stephen; Ubar, Raimund-JohannesProceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 20192019 / p. 356-361 : ill https://doi.org/10.23919/MIXDES.2019.8787131

book article
349

journal article

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanJournal of electronic testing : theory and applications2020 / p. 87-103 https://doi.org/10.1007/s10836-020-05856-7

journal article
350

dissertation

High-level implementation-independent software-based self-test for RISC type microprocessors = Mikroprotsessorite tarkvarapõhine implementatsioonist mittesõltuv funktsionaalne enesekontrollOyeniran, Adeboye Stephen2020 https://digikogu.taltech.ee/et/Item/08a75fbb-3f71-4fe4-b3d0-3f37a9a5f36d

dissertation

Number of records 832, displaying 326 - 350

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1. Ubar, Raimund-Johannes 1941
2. Räämet, Raimund 1918-2004
3. Aare, Johannes 1915-2000
4. Ahrenschild, Johannes (-1936)
5. Alaots, Johannes
6. Aljak, Arnold Johannes
7. Allik, Erich-Johannes
8. Avik, Eduard Johannes
9. Drechsler, Wolfgang Johannes Max
10. Ehala, Johannes 1986
11. Hint, Johannes 1914-1985
12. Johannes, Ille 1939
13. Johannson, Johannes
14. Johanson, Johannes
15. Juhans, Johannes 1874-1956
16. Kajander, Aleksi Oskar Johannes 1994
17. Kiiwet, Johannes
18. Kiivet, Johannes 1879-1967
19. Kivit, Johannes
20. Kollist, Johannes 1884-1937
21. Kollist, Johannes Theodor
22. Korv, August Johannes 1911-1981
23. Krimmer, Robert Johannes
24. Käpp, Martin Johannes
25. Langel, Johannes 1900-1985
26. Langell, Johannes
27. Livländer, Robert Johannes
28. Madise, Johannes 1920
29. Meitre, Johannes 1906-1978
30. Messer, Johannes
31. Mäll, Johannes 1911-1981
32. Mühlman, Johannes
33. Mühlmann, Johannes 1888-1936
34. Notermans, Antonius Johannes Hubertus 1959
35. Nuudi, Johannes 1895-1975
36. Palo, Johannes 1925-1960
37. Pals, Johannes 1903-1941
38. Pello, Johannes 1958
39. Pervik, Johannes 1892-1958
40. Presmann, Johannes 1942
41. Putk, Aksel-Johannes 1928-1999
42. Püümann, Mait Johannes
43. Roes, Johannes 1914
44. Russwurm, Johannes
45. Russvurm, Johannes 1855-1939
46. Russvurm, Johannes Carl Gysbert Immanuel
47. Sakeus, Johannes 1880-1934
48. Taimsalu, Johannes 1891-1942
49. Teiman, Johannes
50. Teimann, Johannes Rudolf (kuni 22.05.1935)
51. Tomson, Johannes
52. Tuulre, Feliks Johannes 1908-1987
53. Veerus, Johannes Voldemar 1897-1972
54. Verus, Johannes Voldemar
55. Vuhk, Oskar Johannes

1. Ubar, Raimund-Johannes, 1941-
2. Hagelberg, Raimund, 1927-2012
3. Räämet, Raimund, 1918-2004
4. Aare, Johannes, 1915-2000
5. Aavik, Johannes, 1880-1973
6. Avik, Eduard Johannes, 1891-1942
7. Bender, Naatan Johannes
8. Granö, Johannes Gabriel
9. Hint, Johannes, 1914-1985
10. Johannes Paulus II, paavst, 1920-2005
11. Kert, Johannes
12. Kiivet, Johannes, 1879-1967
13. Kollist, Johannes
14. Käis, Johannes
15. Lang, Johannes
16. Maide, Johannes Voldemar
17. Mossov, Johannes
18. Pals, Johannes, 1903-1941
19. Pello, Johannes
20. Putk, Aksel-Johannes
21. Rammul, Aleksander Johannes, 1875-1949
22. Steinbrunn, Johannes
23. Taimsalu, Johannes, 1891-1942
24. Talu, Martin Johannes
25. Veerus, Johannes Voldemar, 1897-1972
26. Veski, Johannes Voldemar, 1873-1968
27. Voll, Johannes

1. Johannes Mittus, vasevalamise tööstus

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