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Ubar, Raimund-Johannes (TTÜ author)

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251

book article

Exploiting high-level descriptions for circuits fault tolerance assessmentsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza Reorda, Matteo; Raik, Jaan; Ubar, Raimund-Johannes1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, October 20-22, 19971997 / p. 212-216

book article
252

book article

Explorations in low area overhead DfT techniques for sequential BISTRaik, Jaan; Raidma, Rein; Ubar, Raimund-JohannesIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 220-223 : ill

book article
253

book article

An external diagnosis method for network-on-a-chipRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France2007 / [2] p. : ill

book article
254

book article

Fast and efficient static compaction of test sequences based on greedy algorithmsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 117-122

book article
255

book article

Fast and efficient static compaction of test sequences using bipartite graph representationsMarkus, Antti; Raik, Jaan; Ubar, Raimund-JohannesECS'99 : proceedings of the 2nd Electronic Circuits and Systems Conference : September 6-8, 1999, Bratislava, Slovakia1999 / p. 17-20

book article
256

book article

Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

book article
257

book article

Fast fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 35-40 https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0

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258

book article

Fast fault simulation for extended class of faults in scan-path circuitsUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturProceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam2010 / p. 14-19

book article
259

journal article EST / journal article ENG

Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
260

book article

Fast RTL fault simulation using decision diagrams and bitwise set operationsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-Johannes; Ellervee, Peeter2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada2011 / p. 164-170

book article
261

book article

Fast static compaction of test sequences using implications and greedy searchRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest2001 / p. 207-209 : ill

book article
262

book article

Fast static compaction of tests composed of independent sequences : basic properties and comparison of methodsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesThe 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II2002 / p. 445-448 : ill http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190

book article
263

book article

Fast test cost calculation for hybrid BIST in digital systemsOrasson, Elmet; Raidma, Rein; Ubar, Raimund-Johannes; Jervan, Gert; Peng, ZeboEuromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings2001 / p. 318-325 : ill

book article
264

journal article

Fast test pattern generation for sequential circuits using decision diagram representationsRaik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2000 / 3, p. 213-226 : ill https://link.springer.com/article/10.1023/A:1008335130158

journal article
265

book article

Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, JaanVLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers2016 / p. 23-45 : ill http://dx.doi.org/10.1007/978-3-319-46097-0_2

book article
266

book article

Fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France2010 / p. 653-656 : ill

book article
267

book article

Fault diagnosis in integrated circuits with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Evartson, Teet; Lensen, Harri10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 604-610 : ill http://dx.doi.org/10.1109/DSD.2007.4341530

book article
268

book article

Fault diagnosis in the BIST environment based on bisection of detected faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru2007 / [6] p. : ill

book article
269

journal article

Fault diagnosis in VLSI devicesUbar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering1995 / 1, p. 51-67

journal article
270

book article

Fault diagnosis of VLSI devices using alternative graph representationUbar, Raimund-JohannesProceedings of the 8th Symposium on Microcomputer and Microprocessor Applications, Budapest, October 12-14, 1994. Vol. 11994 / p. 34-44

book article
271

journal article

Fault effect reasoning in digital systems by topological view on low- and high-level decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета. Управление, вычислительная техника и информатика2014 / p. 99-113 : ill http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107

journal article
272

book article

Fault model and test synthesis for RISC-processorsUbar, Raimund-Johannes; Markus, Antti; Jervan, Gert; Raik, JaanBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 229-232: ill

book article
273

book article

Fault modeling and diagnosis in digital systemsUbar, Raimund-JohannesCREDES Summer School : Dependable Systems Design : handouts2011 / p. 91-106 : ill

book article
274

book article

Fault modeling and test generation with low- and high-level decision diagramsUbar, Raimund-Johannes24. GI/GMM/ITG-Workshop : Testmethoden und Zuverlässigkeit von Schaltungen und Systemen2012 / p. 1-12

book article
275

book article

Fault oriented test pattern generation for sequential circuits using Genetic AlgorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 129-132 : ill

book article

Number of records 832, displaying 251 - 275

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1. Ubar, Raimund-Johannes 1941
2. Räämet, Raimund 1918-2004
3. Aare, Johannes 1915-2000
4. Ahrenschild, Johannes (-1936)
5. Alaots, Johannes
6. Aljak, Arnold Johannes
7. Allik, Erich-Johannes
8. Avik, Eduard Johannes
9. Drechsler, Wolfgang Johannes Max
10. Ehala, Johannes 1986
11. Hint, Johannes 1914-1985
12. Johannes, Ille 1939
13. Johannson, Johannes
14. Johanson, Johannes
15. Juhans, Johannes 1874-1956
16. Kajander, Aleksi Oskar Johannes 1994
17. Kiiwet, Johannes
18. Kiivet, Johannes 1879-1967
19. Kivit, Johannes
20. Kollist, Johannes 1884-1937
21. Kollist, Johannes Theodor
22. Korv, August Johannes 1911-1981
23. Krimmer, Robert Johannes
24. Käpp, Martin Johannes
25. Langel, Johannes 1900-1985
26. Langell, Johannes
27. Livländer, Robert Johannes
28. Madise, Johannes 1920
29. Meitre, Johannes 1906-1978
30. Messer, Johannes
31. Mäll, Johannes 1911-1981
32. Mühlman, Johannes
33. Mühlmann, Johannes 1888-1936
34. Notermans, Antonius Johannes Hubertus 1959
35. Nuudi, Johannes 1895-1975
36. Palo, Johannes 1925-1960
37. Pals, Johannes 1903-1941
38. Pello, Johannes 1958
39. Pervik, Johannes 1892-1958
40. Presmann, Johannes 1942
41. Putk, Aksel-Johannes 1928-1999
42. Püümann, Mait Johannes
43. Roes, Johannes 1914
44. Russwurm, Johannes
45. Russvurm, Johannes 1855-1939
46. Russvurm, Johannes Carl Gysbert Immanuel
47. Sakeus, Johannes 1880-1934
48. Taimsalu, Johannes 1891-1942
49. Teiman, Johannes
50. Teimann, Johannes Rudolf (kuni 22.05.1935)
51. Tomson, Johannes
52. Tuulre, Feliks Johannes 1908-1987
53. Veerus, Johannes Voldemar 1897-1972
54. Verus, Johannes Voldemar
55. Vuhk, Oskar Johannes

1. Ubar, Raimund-Johannes, 1941-
2. Hagelberg, Raimund, 1927-2012
3. Räämet, Raimund, 1918-2004
4. Aare, Johannes, 1915-2000
5. Aavik, Johannes, 1880-1973
6. Avik, Eduard Johannes, 1891-1942
7. Bender, Naatan Johannes
8. Granö, Johannes Gabriel
9. Hint, Johannes, 1914-1985
10. Johannes Paulus II, paavst, 1920-2005
11. Kert, Johannes
12. Kiivet, Johannes, 1879-1967
13. Kollist, Johannes
14. Käis, Johannes
15. Lang, Johannes
16. Maide, Johannes Voldemar
17. Mossov, Johannes
18. Pals, Johannes, 1903-1941
19. Pello, Johannes
20. Putk, Aksel-Johannes
21. Rammul, Aleksander Johannes, 1875-1949
22. Steinbrunn, Johannes
23. Taimsalu, Johannes, 1891-1942
24. Talu, Martin Johannes
25. Veerus, Johannes Voldemar, 1897-1972
26. Veski, Johannes Voldemar, 1873-1968
27. Voll, Johannes

1. Johannes Mittus, vasevalamise tööstus

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