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book article

Die Anwendung von Tests im Fernstudium an technischen UniversitätenUmborg, ViktoriaV Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 104-107

book article

27

book article

Difficulty of cloze test modificationsKokkota, Valmar2nd regional seminar Testing in foreign language teaching : Tallinn, February 25-26, 1986 : summaries1986 / p. 51-53 https://www.ester.ee/record=b1217950*est

book article

28

book article

Digital design learning system based on Java appletsJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes4th Annual Conference of the LTSN Centre for Information and Computer Sciences : 26th-28th August 2002, NUI Galway, Ireland2003 / p. 183-187 : ill https://pld.ttu.ee/dildis/publications/Sudnitson%20LTSN-ICS%202003.pdf

book article

29

dissertation

Digital test in WEB-based environmentIvask, Eero2006 https://www.ester.ee/record=b2158119*est

dissertation

30

newspaper article

Eesti teadlaste leiutis: uus koroonaviiruse kiirtest ootab heakskiitu ja otsib tootjatLadva, AssoÕhtuleht2020 / Lk. 5 https://dea.digar.ee/article/ohtuleht/2020/12/07/2.12

newspaper article

31

newspaper article

Eesti-Saksa ettevõte arendas laboritäpsusega koroona kiirtestiEesti Elu : [Kanada ajaleht]2020 / lk. 3 https://eestielu.com/et/eesti-elu/paberleht/11209-eesti-elu-nr-48-4-detsember-2020-digileht

newspaper article

32

newspaper article

Ei tea mida ülikoolis õppida? Erialatest aitab teha õige valikupostimees.ee2023 Ei tea mida ülikoolis õppida? Erialatest aitab teha õige valiku Ei tea mida ülikoolis õppida? Erialatest aitab teha õige valiku

newspaper article

33

book article

E-learning tools for teaching self-test of digital electronicsJutman, Artur; Gramatova, Elena; Pikula, T.; Ubar, Raimund-Johannes15 EAEEIE International Conference on Innovation in Education for Electrical and Information Engineering : Sofia, Bulgaria, May 27-29, 20042004 / p. 267-272 : ill

book article

34

book

ESTEL test : tests of the English language : lower-intermediate levelKokkota, Valmar1999 https://www.ester.ee/record=b1056546*est

book

35

journal article EST / journal article ENG

Evaluation of DOAC dipstick test for detecting direct oral anticoagulants in urine compared with a clinically relevant plasma threshold concentrationÖrd, Lenna; Marandi, Toomas; Märk, Marit; Raidjuk, Leonid; Kostjuk, Jelena; Banys, Valdas; Krause, Karit; Pikta, MarikaClinical and Applied Thrombosis/Hemostasis2022 / 8 p. : ill https://doi.org/10.1177/10760296221084307 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

36

journal article

Evaluation of some mechanical and physical properties of ‘Oriented Strand Board (OSB/3)’ following cyclic accelerated aging testsLille, Harri; Kiviste, Mihkel; Telling, Renar; Leppik, Taimo; Virro, Indrek; Kask, ReginoEuropean Journal of Wood and Wood Products2022 / p. 731–740 https://doi.org/10.1007/s00107-022-01803-9

journal article

37

book article

Exact static compaction of independent test sequencesRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 315-318 : ill

book article

38

book article

Exact static compaction of sequential circuit tests using branch-and-bound and search state registrationRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest2002 / p. 19-20 https://www.researchgate.net/publication/250423148_Exact_Static_Compaction_of_Sequential_Circuit_Tests_Using_Branch_and-Bound_and_Search_State_Registration

book article

39

book article

Feste Wortverbindungen des Deutschen als Objekt des TestensUmborg, Viktoria2nd regional seminar Testing in foreign language teaching : Tallinn, February 25-26, 1986 : summaries1986 / S. 79-81 https://www.ester.ee/record=b1217950*est

book article

40

book

Filosoofia ja loogika e-kursuste enesetestid [Elektrooniline teavik]Meos, Indrek2020 https://www.indrekmeos.xyz/enesetestid.html

book

41

book

Filosoofia ja loogika testid [Elektrooniline teavik]Meos, Indrek2020 https://filosoofia.indrekmeos.xyz/testid/

book

42

book article

FTGEN - система генерирования функциональных тестовUbar, Raimund-Johannes; Dušina, Julia; Zaugarov, Viktor; Крупнова Е.; Storožev, SergeiProceedings of CAD-93 : new information technologies for science, education and business, Yalta, May 4-13, 19931993 / p. 123-125

book article

43

book article

Functional test program generation for digital systemsUbar, Raimund-Johannes; Dušina, Julia; Krupnova, Helena; Storožev, Sergei; Zaugarov, ViktorTestmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 19941994 / p. 14-18: ill

book article

44

newspaper article

Geneetiline test aitab arstidel määrata sobivaima ravimi ja annuseLaanetu, Mari-Liis; Viigimaa, Margusmu.ee2024 Geneetiline test aitab arstidel määrata sobivaima ravimi ja annuse

newspaper article

45

book article

Generating tests from EFSM models using guided model checking and iterated search refinmentErnits, Juhan-Peep; Kull, Andres; Raiend, Kullo; Vain, JüriFormal Approach to Software Testing and Runtime Verification : First Combined International Workshops FATES 2006 and RV 2006 : Seattle, WA, USA, August 15-16, 2006 : revised selected papers2006 / p. 85-99 https://link.springer.com/chapter/10.1007/11940197_6

book article

46

journal article

Hierarchical approaches to test generation and fault simulationUbar, Raimund-JohannesRadioelectronics and informatics2003 / p. 204

journal article

47

book article

Hierarchical defect level test quality analysisBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

book article

48

book article

Hierarchical test generation based on alternative graph modelUbar, Raimund-JohannesProceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 19951995 / p. 18

book article

49

book article

Hierarchical test generation for complex digital systems with control and data processing partsUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 43-52

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50

book article

Hierarchical test generation. SEMI show slidesUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 53-64

book article

testid (subject term)

types of item

subject term 4