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Jutman, Artur (author)
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26
book article
DefSim: CMOS defects on chip for research and education
Pleskacz, Witold A.
;
Borejko, Tomasz
;
Walkanis, A.
;
Stopjakova, Viera
;
Jutman, Artur
;
Ubar, Raimund-Johannes
7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings
2006
/
p. 74-79 : ill
book article
27
book article
DefSim: measurement environment for CMOS defects
Borejko, Tomasz
;
Jutman, Artur
;
Pleskacz, Witold A.
;
Ubar, Raimund-Johannes
2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 2
2006
/
p. 679-682
https://ieeexplore.ieee.org/document/1651048
book article
28
book article
DefSim-based exercises for studying defects in CMOS gates
Jutman, Artur
;
Pleskacz, Witold A.
;
Boiko, Nikolai
;
Ubar, Raimund-Johannes
EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden
2006
/
p. 23-26 : ill
book article
29
book article
Delay testing of asynchronous NoC interconnects
Bengtsson, Tomas
;
Jutman, Artur
;
Kumar, Shashi
;
Ubar, Raimund-Johannes
Proceedings of the 12th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2005 : Krakow, Poland, 22-25 June, 2005. Vol. 1 of 2
2005
/
p. 419-424 : ill
book article
30
journal article
Design error diagnosis in digital circuits with stuck-at fault model
Jutman, Artur
;
Ubar, Raimund-Johannes
Microelectronics reliability
2000
/
2, p. 307-320 : ill
journal article
31
book article
Design error localization in digital circuits by stuck-at fault test patterns
Jutman, Artur
;
Ubar, Raimund-Johannes
[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2
2000
/
p. 723-726
book article
32
book article EST
/
book article ENG
Designing reliable cyber-physical systems
Aleksandrowicz, Gadi
;
Arbel, Eli
;
Bloem, Roderick
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Jutman, Artur
;
Raik, Jaan
;
Shibin, Konstantin
Languages, design methods, and tools for electronic system design : selected contributions from FDL 2016
2018
/
p. 15-38 : ill
https://doi.org/10.1007/978-3-319-62920-9_2
Conference Proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
33
book article
Designing reliable cyber-physical systems : overview associated to the special session at FDL'16
Aleksandrowicz, Gadi
;
Arbel, Eli
;
Bloem, Roderick
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Jutman, Artur
;
Raik, Jaan
;
Shibin, Konstantin
The 2016 Forum on Specification & Design Languages : proceedings : Bremen, Germany, September 14-16, 2016
2016
/
[8] p. : ill
https://doi.org/10.1109/FDL.2016.7880382
book article
34
book article
Diagnostic modeling of digital systems with multi-level decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Jenihhin, Maksim
Design and test technology for dependable systems-on-chip
2011
/
p. 92-118 : ill
https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams
book article
35
book article
Diagnostic modeling of microprocessors with high-level decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Jenihhin, Maksim
;
Brik, Marina
;
Istenberg, Martin
;
Wuttke, Heinz-Dietrich
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 147-150 : ill
book article
36
book article
Diagnostic software with WEB interface for teaching purposes
Vislogubov, Vladislav
;
Jutman, Artur
;
Kruus, Helena
;
Orasson, Elmet
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 255-258 : ill
book article
37
book article
DIAGNOZER : a laboratory tool for teaching research in diagnosis of electronic systems [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jutman, Artur
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
2009 IEEE International Conference on Microelectronic Systems Education MSE '09 : 25-27 July 2009, San Francisco, California : [proceedings]
2009
/
p. 12-15 : ill. [CD-ROM]
http://dx.doi.org/10.1109/MSE.2009.5270842
book article
38
book article
Digital design learning system based on Java applets
Jutman, Artur
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
4th Annual Conference of the LTSN Centre for Information and Computer Sciences : 26th-28th August 2002, NUI Galway, Ireland
2003
/
p. 183-187 : ill
https://pld.ttu.ee/dildis/publications/Sudnitson%20LTSN-ICS%202003.pdf
book article
39
journal article
Digital electronics design and test at Computer Engineering Department of Tallinn University of Technology
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Ellervee, Peeter
The house magazine : the parlamentary weekly
2006
/
1198, p. 42 : ill
journal article
40
book article
Distance-learning tools for digital design and test issues
Jutman, Artur
;
Kruus, Margus
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
IT+SE'2002 : Information Tec[h]nologies in Science, Education, Telecommunication, Business : proceedings = Информационные технологии в науке, образовании, телекоммуникации, бизнесе, Украина, Крым, Ялта-Гурзуф, 20-30 мая 2002 года : труды
2002
/
p. 269-272 : ill
book article
41
journal article
Effective scalable IEEE 1687 instrumentation network for fault management
Jutman, Artur
;
Shibin, Konstantin
;
Devadze, Sergei
IEEE design & test
2013
/
p. 26-35 : ill
journal article
42
book article
Efficient at-speed interconnect BIST and diagnosis framework
Jutman, Artur
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
/
p. 257-258 : ill
https://artiklid.elnet.ee/record=b1018804*est
book article
43
book article
Efficient single-pattern fault simulation on structurally synthesized BDDs
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Jutman, Artur
Dependable Computing - EDCC-5 : 5th European Dependable Computing Conference : Budapest, Hungary, April 20-22, 2005 : proceedings
2005
/
p. 332-344 : ill
book article
44
book article
Efficient TPG for a fast at-speed interconnect BIST [Electronic resource]
Jutman, Artur
7th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 18-21, 2004, Stará Lesná, Slovakia : proceedings
2004
/
p. 223-226 : ill. [CD-ROM]
book article
45
book article
E-learning environment for WEB-based study of testing
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Aleksejev, Igor
;
Tšepurov, Anton
;
Tšertov, Anton
;
Kostin, Sergei
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
Proceedings of the 8th European Workshop on Microelectronics Education : EWME 2010 : Darmstadt, Germany, 10-12 May 2010
2010
/
p. 47-52 : ill
book article
46
book article
E-learning environment in the area of digital microelectronics
Jutman, Artur
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
ITHET 2004 : proceedings of the Fifth International Conference on Information Technology based Higher Education and Training : 31 May - 2 June, 2004, Istanbul, Turkey
2004
/
p. 278-283 : ill
book article
47
book article
E-learning tools for digital test
Devadze, Sergei
;
Gorjachev, R.
;
Jutman, Artur
;
Orasson, Elmet
;
Rosin, Vjatšeslav
;
Ubar, Raimund-Johannes
Proc. III International Conference "Distance Learning - Educational Sphere of XXI Century" : Minsk, Belorussia, 2003
2003
/
p. 336-342
book article
48
book article
E-learning tools for teaching self-test of digital electronics
Jutman, Artur
;
Gramatova, Elena
;
Pikula, T.
;
Ubar, Raimund-Johannes
15 EAEEIE International Conference on Innovation in Education for Electrical and Information Engineering : Sofia, Bulgaria, May 27-29, 2004
2004
/
p. 267-272 : ill
book article
49
book article
Embedded instrumentation toolbox for screening marginal defects and outliers for production
Odintsov, Sergei
;
Jutman, Artur
;
Devadze, Sergei
;
Aleksejev, Igor
IEEE AUTOTESTCON 2017 : Schaumburg, USA, Sept 11-14, 2017 : proceedings
2017
/
p. 336-334 : ill
https://doi.org/10.1109/AUTEST.2017.8080516
book article
50
book article
Embedded synthetic instruments for board-level testing
Jutman, Artur
;
Devadze, Sergei
;
Aleksejev, Igor
;
Wenzel, Thomas
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
2012
/
1 p. : ill
book article
Number of records 160, displaying
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32
1.
Jutman, Artur
2.
Jutman, Valentin
3.
Abdullin, Artur
4.
Abels, Artur
5.
Adson, Artur
6.
Alliksaar, Artur
7.
Binczewski, Artur
8.
Dahlberg, Artur
9.
Hain, Artur
10.
Izumrudov, Artur
11.
Jugaste, Artur
12.
Jõgi, Artur
13.
Jürvetson, Artur
14.
Keller, Artur
15.
Kivikas, Artur
16.
Klauson, Artur
17.
Lavrov, Artur
18.
Leetberg, Artur
19.
Liefländer, Artur
20.
Linari-Linholm, Artur
21.
Lobov, Artur
22.
Luha, Artur Heinrich
23.
Mägi, Artur
24.
Nilson, Artur
25.
Noole, Artur
26.
Puksov, Artur
27.
Rieger, Artur
28.
Ruszczak, Artur
29.
Rätsep, Artur
30.
Talvik, Artur
31.
Toikka, Artur
32.
Tooman, Artur
CV
24
1.
Jutman, Artur 1976
2.
Jutman, Valentin 1938
3.
Georgin, Artur
4.
Hain, Artur 1925-2011
5.
Jõgi, Artur 1978
6.
Klauson, Artur 1995
7.
Laksberg, Artur 1975
8.
Leetberg, Artur 1886-1969
9.
Leetna, Karl Artur
10.
Liefländer, Artur
11.
Linari-Linholm, Artur A. 1903-1983
12.
Linari-Linholm, Artur Aleksander
13.
Luha, Artur Heinrich 1892-1953
14.
Luhha, Artur Heinrich
15.
Mitsulis, Artur 1981
16.
Mitšulis, Artur
17.
Noole, Artur 1985
18.
Perna, Artur (-1939)
19.
Perna, Artur 1881-1940
20.
Pihlak, Artur Aleksander 1885-1941
21.
Pärna, Artur 1915-1943
22.
Sagarov, Artur
23.
Toikka, Artur 1998
24.
Šagarov, Artur
name of the person
21
1.
Jutman, Artur
2.
Andersalu, Artur
3.
Georgin, Artur Mihkel, 1891-1954
4.
Hain, Artur
5.
Lavrov, Artur
6.
Lessner, Artur
7.
Linari-Linholm, Artur, 1903-1983
8.
Lind, Artur
9.
Lind, Artur, 1927-1989
10.
Luha, Artur Heinrich, 1892-1953
11.
Mihhailov, Artur
12.
Noole, Artur
13.
Ojasalu, Artur
14.
Perna, Artur, 1881-1940
15.
Pihlak, Artur-Aleksander, 1885-1941
16.
Prees, Artur
17.
Pärna, Artur
18.
Saaliste, Artur
19.
Sagarov, Artur
20.
Talvik, Artur, 1964-
21.
Vassar, Artur, 1911-1977
subject term
1
1.
Artur Uin ja Ko, veinitööstus
TTÜ subject term
1
1.
Perna, Artur, 1881-1940
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