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Number of records 85
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51

book article EST / book article ENG

Kalman-filter based maximum power point tracking for a single-stage grid-connected photovoltaic systemFarrokhi, Ehsan; Ghoreishy, Hoda; Ahmadiahangar, Roya; Rosin, ArgoIECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society2021 / Code 173927 https://doi.org/10.1109/IECON48115.2021.9589653 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
52

book article

Measurement and operation based condition monitoring methodology for high voltage circuit breakersAsefi, Sajjad; Andreesen, Guido; Leinakse, Madis; Kilter, Jako; Kalmet, Tauri; Manninen, Henri; Landsberg, Mart2022 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe) : proceedings2022 / Art. 184786 https://doi.org/10.1109/ISGT-Europe54678.2022.9960521

book article
53

book article

Modelling sound conflict management for virtual-enterprise collaborationNarendra, Nanjangud C.; Norta, Alexander; Mahunnah, Msury; Maggi, Fabrizio Maria2014 IEEE International Conference on Services Computing SCC 2014 : 27 June-2 July 2014, Anchorage, Alaska : proceedings2014 / p. 813-820 : ill

book article
54

book article

Morphable compression architecture for efficient configuration in CGRAsJafri, Syed Mohammad Asad Hassan; Tajammul, Muhammad Adeel; Ellervee, Peeter2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 42-49 : ill

book article
55

book article

Multi-level fault simulation of digital systems on decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaThe First IEEE International Workshop on Electronic Design, Test and Applications : DELTA 2002, 29-31 January 2002, Christchurch, New Zealand : proceedings2002 / p. 86-91 : ill

book article
56

book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article
57

book article

NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chipHollstein, Thomas; Azad, Siavoosh Payandeh; Kogge, Thilo; Ying, Haoyuan; Hofmann, Klaus2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 75-78 : ill http://dx.doi.org/10.1109/DDECS.2015.30

book article
58

book article

Off-line testing of delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Peng, Zebo; Ubar, Raimund-Johannes9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 677-680 : ill http://dx.doi.org/10.1109/DSD.2006.72

book article
59

book article

Open data as enabler of public service co-creation : exploring the drivers and barriersToots, Maarja; McBride, Keegan David Braun; Kalvet, Tarmo; Krimmer, Robert JohannesProceedings of the 7th International Conference for E-Democracy and Open Government CeDEM17 : Danube University Krems, Krems, Austria, 17-19 May 20172017 / p. 102-112 : tab https://doi.org/10.1109/CeDEM.2017.12

book article
60

book article

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 20072007 / p. 71-77 https://ieeexplore.ieee.org/document/4297319

book article
61

book article

Power-constrained hybrid BIST test scheduling in an abort-on-first-fail test environmentHe, Zhiyuan; Jervan, Gert; Peng, Zebo; Eles, PetruProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 83-86 : ill

book article
62

book article

Recognition and analysis of the contours drawn during the Poppelreuter's testNõmm, Sven; Bardõš, Konstantin; Mašarov, Ilja; Kozhenkina, Julia; Toomela, Aaro; Toomsoo, Toomas2016 15th IEEE International Conference on Machine Learning and Applications : 18-20 December 2016, Anaheim, California : proceedings2016 / p. 170-175 : ill http://doi.org//10.1109/ICMLA.2016.0036

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63

book article

A reference architecture for a national e-learning infrastructureSaay, Mohammad Salim; Norta, Alexander9th IEEE/ACM International Conference on Utility and Cloud Computing : UCC 2016 : 6-9 December 2016, Tongji University, Shanghai, China : proceedings2016 / p. 404-409 : ill https://doi.org/10.1145/2996890.3007894

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64

book article

Remote and virtual laboratories in problem-based learning scenariosWuttke, Heinz-Dietrich; Ubar, Raimund-Johannes; Henke, Karsten2010 IEEE International Symposium on Multimedia ISM 2010 : 13-15 December 2010, Taichung, Taiwan : proceedings2010 / p. 377-382 : ill http://dx.doi.org/10.1109/ISM.2010.63

book article
65

book article

Re-using chip level DFT at board levelGu, Xinli; Jutman, ArturProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p

book article
66

book article

Revolver : a high-performance MIMD architecture for collision free computingÖberg, I.; Ellervee, PeeterEuromicro Conference : proceedings : 24th Euromicro Conference : Västerås, Sweden, August 25-27, 1998. Vol. 11998 / p. 301-308

book article
67

book article

RFID-based communications for a self-organizing robot swarmTammet, Tanel; Vain, Jüri; Puusepp, Andres; Reilent, Enar; Kuusik, AlarSASO 2008 : Second IEEE International Conference on Self-Adaptive and Self-Organizing Systems : 20-24 October, 2008, Venice, Italy : proceedings2008 / p. 45-54 https://ieeexplore.ieee.org/document/4663409

book article
68

book article

Sequential circuit test generation using decision diagram modelsRaik, Jaan; Ubar, Raimund-JohannesDesign, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings1999 / p. 736-740: ill

book article
69

book article EST / book article ENG

Series buck-boost partial power converter based on the push-pull converterAbdel-Rahim, Omar; Chub, Andrii; Blinov, Andrei; Vinnikov, DmitriIECON 2022 : 48th Annual Conference of the IEEE Industrial Electronics Society : 17-20 Oct. 20222022 / code. 184962 https://doi.org/10.1109/IECON49645.2022.9968574 Conference Proceedings at Scopus Article at Scopus

book article EST / book article ENG
70

book article

SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 223-228 : ill

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71

book article

SSBDDs and double topology for multiple fault reasoningUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 20122012 / p. 23-28

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72

book article

SystemC-based loose models for simulation speed-up by abstraction of RTL IP coresAbrar, Syed Saif; Jenihhin, Maksim; Raik, Jaan2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 71-74 : ill http://dx.doi.org/10.1109/DDECS.2015.39

book article
73

book article

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

book article
74

book article

Temporally extended high-level decision diagrams for PSL assertions simulationJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings : Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May 2008, Verbania, Italy2008 / p. 61-68 : ill https://ieeexplore.ieee.org/document/4556029

book article
75

book article

Test cost minimization for hybrid BISTJervan, Gert; Peng, Zebo; Ubar, Raimund-JohannesIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings2000 / p. 283-298 : ill https://ieeexplore.ieee.org/abstract/document/887168

book article

Number of records 85, displaying 51 - 75

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