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51
book article
Macro level defect-oriented diagnosability of digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
lk. 53-56 : ill
book article
52
book article
Mixed-level defect simulation in data-paths of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 617-620 : ill
https://ieeexplore.ieee.org/document/1003333
book article
53
book article
Modeling sequential circuits with shared structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Marenkov, Mihhail
;
Mironov, Dmitri
;
Viies, Vladimir
Proceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 2014
2014
/
p. 130-135 : ill
book article
54
book article
Multi-level test generation and fault diagnosis for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
Dependable computing : proceedings / EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 1996
1996
/
p. 264-281: ill
book article
55
book
Multi-level test generation and fault diagnosis in digital systems
Ubar, Raimund-Johannes
1992
book
56
book article
Multi-valued simulation of digital circuits
Ubar, Raimund-Johannes
Proceedings : 1997 21st International Conference on Microelectronics : Niš, Yugoslavia, 14-17 September 1997. Vol. 2
1997
/
p. 721-724 : ill
book article
57
book article
New technique for hierarchical identification of untestable faults in sequential circuits
Krivenko, Anna
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Kruus, Margus
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
lk. 155-158 : ill
book article
58
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
59
dissertation
Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemides
Kruus, Helena
2011
dissertation
60
book article
Overview of the modular system for inference of finite state machines
Spitšakova, Margarita
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 95-98 : ill
book article
61
book
Parallel processing in FPGA-based digital circuits and systems
Sklyarov, Valery
;
Skliarova, Iouliia
2013
http://www.ester.ee/record=b2946103*est
book
62
book article
Parallel X-fault simulation with critical path tracing technique [Electronic resource]
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
DATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 2010
2010
/
p. 879-884 [CD-ROM]
https://www.researchgate.net/publication/221341788_Parallel_X-fault_simulation_with_critical_path_tracing_technique
book article
63
book article
Practical works for on-line teaching design and test of digital circuits
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Hahanov, V.
;
Skvortsova, O.
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume III
2002
/
p. 1223-1226 : ill
http://dx.doi.org/10.1109/ICECS.2002.1046474
book article
64
book article
Recursion and hierarchy in digital design and prototyping : a case study
Mihhailov, Dmitri
;
Kruus, Margus
;
Sklyarov, Valery
;
Skliarova, Iouliia
;
Sudnitsõn, Aleksander
Computer Systems and Technologies : 12th International Conference, CompSysTech'11 : Vienna, Austria, June 16-17, 2011 : proceedings
2011
/
p. 45-50 : ill
https://dl.acm.org/doi/pdf/10.1145/2023607.2023616
book article
65
book article
Representing logical inference steps with digital circuits
Matsak, Erika
Human interface and the management of information : information and interaction
2009
/
p. 178-184
https://link.springer.com/chapter/10.1007/978-3-642-02559-4_20
book article
66
book article
Research on digital system design and test at Tallinn University of Technology
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Hollstein, Thomas
;
Jervan, Gert
;
Jutman, Artur
;
Kruus, Margus
;
Raik, Jaan
Research in Estonia : present and future
2011
/
p. 184-205 : ill
book article
67
book
Riistvara kirjeldamiskeel - VHDL : metoodiline materjal
Tammemäe, Kalle
2003
http://www.ester.ee/record=b1605950*est
book
68
book
Riistvara kirjeldamiskeel VHDL : metoodiline materjal
Tammemäe, Kalle
2002
http://www.ester.ee/record=b1605950*est
book
69
dissertation
Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemid
Kostin, Sergei
2012
https://www.ester.ee/record=b2757857*est
dissertation
70
book article
Sequential circuits BIST synthesis from signal specifications
Raik, Jaan
;
Jenihhin, Maksim
;
Adelbert, Rain
Proceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 2005
2005
/
p. 196-199 : ill
https://ieeexplore.ieee.org/document/1597023
book article
71
journal article
Sisseehitatud isetestimine digitaalsüsteemides
Kruus, Helena
A & A
2011
/
lk. 32-37 : ill
https://artiklid.elnet.ee/record=b2472216*est
journal article
72
book article
Structural fault collapsing by superposition of BDDs for test generation in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
2010
/
p. 250-257 : ill
https://ieeexplore.ieee.org/document/5450451
book article
73
dissertation
Test program generation for microprocessor systems
Dušina, Julia
1993
https://www.ester.ee/record=b2090526*est
dissertation
74
book article
Testing strategies for networks on chip
Ubar, Raimund-Johannes
;
Raik, Jaan
Networks on chip
2003
/
p. 131-152 : ill
https://link.springer.com/chapter/10.1007/0-306-48727-6_7
book article
75
book article
3D parallel fault simulation
Gorev, Maksim
;
Ubar, Raimund-Johannes
Proceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere
2014
/
p. 39-42 : ill
book article
Number of records 84, displaying
51 - 75
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