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Design of a generalized fractional-order PID controller using operational amplifiersGonzalez, Emmanuel A.; Alimisis, Vassilis; Psychalinos, Costas; Tepljakov, Aleksei2018 25th IEEE International Conference on Electronics Circuits and Systems (ICECS), Bordeaux, France, December 9–12, 20182018 / p. 253-256 : ill http://dx.doi.org/10.1109/ICECS.2018.8617954

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52

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Design space exploration and optimisation for NoC-based timing sensitive systemsTagel, Mihkel; Ellervee, Peeter; Jervan, GertBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 177-180 : ill

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53

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Design space exploration and optimisation for NoC-based timing sensitive systemsTagel, Mihkel; Ellervee, Peeter; Jervan, GertInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 117-120 : ill

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54

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Design-aid programs for LSI integrated circuitsTarnay, K.; Szekely, V.; Baji, P.; Farkas, G.; Masszi, F.; Kerecsen-Rencz, M.Проблемы моделирования и измерения в электронике1986 / p. 3-11

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55

journal article

Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chipsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIET computers and digital techniques2009 / 5, p. 476-486 : ill http://dx.doi.org/10.1049/iet-cdt.2008.0096

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56

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Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

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Related publications 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

57

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Diagnostic modeling of digital systems with low- and high-level decision diagramsUbar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [1] p

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58

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Digitaalkiipide projekteerimine ja test : teadus, tehnoloogia või kunstRaik, JaanA & A2005 / lk. 5-9

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59

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Digital hardware organization course for SoC programEllervee, Peeter; Tenhunen, Hannu2001 International Conference on Microelectronic Systems Education : June 17-18, 2001, Las Vegas, Nevada, USA : proceedings2001 / p. 26-27 https://ieeexplore.ieee.org/document/932402

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60

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Digital logic simulation with compressed BDDsUbar, Raimund-Johannes; Mironov, Dmitri; Devadze, Sergei; Raik, JaanProceedings : 2011 IEEE International Conference on Computer Science and Automation Engineering : June 10-12, 2011, Shanghai, China2011 / p. 105-109 : ill https://ieeexplore.ieee.org/document/5952643

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61

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Discrete gravitational search algorithm for solving finite state machine inference problemSpitšakova, MargaritaInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 63-66 : ill

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62

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Division Method And CircuitPatankar, Udayan Sunil; Koel, Ants; Patankar, Sunil; Flores, Miguel E.2022 https://www.wipo.int

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Related publications 1

Area efficient design and implementation of a novel divider circuit block = Uudne efektiivne jagamistehte riistvaraline realisatsioon

63

newspaper article

Droonide lihtsus ja odavus võimaldab neid sõjas massiliselt kasutada [Võrguväljaanne]Klementi, Joakimerr.ee2022 Droonide lihtsus ja odavus võimaldab neid sõjas massiliselt kasutada

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64

newspaper article

Eesti teadlased loodavad panna putukrobotile pähe tehisaruRaik, Jaannovaator.err.ee2024 Eesti teadlased loodavad panna putukrobotile pähe tehisaru Эстонские ученые создают робота-насекомого с искусственным интеллектом

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65

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Eesti teaduse nähtamatud hiiglasedRaik, JaanTeadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]2019 / lk. 161-168 : ill., fot https://www.ester.ee/record=b5208765*est

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66

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Eestisse luuakse kiibitehnoloogia kompetentsikeskusTambur, SilverTrialoog2025 https://trialoog.taltech.ee/eestisse-luuakse-kiibitehnoloogia-kompetentsikeskus/

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67

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ElektroonikaVelmre, EnnTEA entsüklopeedia. 6. köide, eerika - faiaagid2011 / lk. 199

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68

journal article EST / journal article ENG

Elliptic-curve crypto processor for RFID applicationsRashid, Muhammad; Jamal, Sajjad Shaukat; Khan, Sikandar Zulqarnain; Alharbi, Adel R.; Aljaedi, Amer; Imran, MalikApplied Sciences (Switzerland)2021 / art. 7079 https://doi.org/10.3390/app11157079 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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69

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Equivalent transformations of structurally synthesized BDDs and applicationsJürimägi, Lembit; Ubar, Raimund-Johannes; Viies, Vladimir2019 8th Mediterranean Conference on Embedded Computing (MECO)2019 / 6 p. : ill https://doi.org/10.1109/MECO.2019.8760283

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70

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Error sources in analog ASICs and ways for their minimizationMihhailov, JuriInternational journal of engineering and applied sciences (EAAS)2013 / p. 32-41 : ill

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71

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Esimene üldkasutatav mikrokontrollerkiip TMS 1000Toomsalu, ArvoA & A2008 / 2, lk. 9-16 : ill

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72

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European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedingsCantarella, JD2005 https://www.ester.ee/record=b2300865*est

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73

journal article EST / journal article ENG

Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuitsPagliarini, Samuel Nascimento; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, FernandaIEEE transactions on nuclear science2021 / p. 1045-1053 https://doi.org/10.1109/TNS.2021.3070643 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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74

journal article EST / journal article ENG

Evaluating NTT/INTT implementation styles for post-quantum cryptographyImran, Malik; Khan, Safiullah; Khalid, Ayesha; Rafferty, Ciara; Ali Shah, Yasir; Pagliarini, Samuel; Rashid, Muhammad; O'Neill, MaireIEEE Embedded Systems Letters2024 / p. 485 - 488 https://doi.org/10.1109/LES.2024.3410516 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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75

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Fast test cost calculation for hybrid BIST in digital systemsOrasson, Elmet; Raidma, Rein; Ubar, Raimund-Johannes; Jervan, Gert; Peng, ZeboEuromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings2001 / p. 318-325 : ill https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f

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