Searching - TalTech Research Portal

display

sort

51

book article

Design of a generalized fractional-order PID controller using operational amplifiersGonzalez, Emmanuel A.; Alimisis, Vassilis; Psychalinos, Costas; Tepljakov, Aleksei2018 25th IEEE International Conference on Electronics Circuits and Systems (ICECS), Bordeaux, France, December 9–12, 20182018 / p. 253-256 : ill http://dx.doi.org/10.1109/ICECS.2018.8617954

book article

52

book article

Design space exploration and optimisation for NoC-based timing sensitive systemsTagel, Mihkel; Ellervee, Peeter; Jervan, GertBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 177-180 : ill

book article

53

book article

Design space exploration and optimisation for NoC-based timing sensitive systemsTagel, Mihkel; Ellervee, Peeter; Jervan, GertInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 117-120 : ill

book article

54

journal article

Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chipsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIET computers and digital techniques2009 / 5, p. 476-486 : ill http://dx.doi.org/10.1049/iet-cdt.2008.0096

journal article

55

book article

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

book article

Related publications 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

56

book article

Diagnostic modeling of digital systems with low- and high-level decision diagramsUbar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [1] p

book article

57

journal article

Digitaalkiipide projekteerimine ja test : teadus, tehnoloogia või kunstRaik, JaanA & A2005 / lk. 5-9

journal article

58

book article

Digital hardware organization course for SoC programEllervee, Peeter; Tenhunen, Hannu2001 International Conference on Microelectronic Systems Education : June 17-18, 2001, Las Vegas, Nevada, USA : proceedings2001 / p. 26-27 https://ieeexplore.ieee.org/document/932402

book article

59

book article

Digital logic simulation with compressed BDDsUbar, Raimund-Johannes; Mironov, Dmitri; Devadze, Sergei; Raik, JaanProceedings : 2011 IEEE International Conference on Computer Science and Automation Engineering : June 10-12, 2011, Shanghai, China2011 / p. 105-109 : ill https://ieeexplore.ieee.org/document/5952643

book article

60

book article

Discrete gravitational search algorithm for solving finite state machine inference problemSpitšakova, MargaritaInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 63-66 : ill

book article

61

newspaper article

Droonide lihtsus ja odavus võimaldab neid sõjas massiliselt kasutada [Võrguväljaanne]Klementi, Joakimerr.ee2022 Droonide lihtsus ja odavus võimaldab neid sõjas massiliselt kasutada

newspaper article

62

newspaper article

Eesti teadlased loodavad panna putukrobotile pähe tehisaruRaik, Jaannovaator.err.ee2024 Eesti teadlased loodavad panna putukrobotile pähe tehisaru Эстонские ученые создают робота-насекомого с искусственным интеллектом

newspaper article

63

book article

Eesti teaduse nähtamatud hiiglasedRaik, JaanTeadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]2019 / lk. 161-168 : ill., fot https://www.ester.ee/record=b5208765*est

book article

64

journal article EST / journal article ENG

Elliptic-curve crypto processor for RFID applicationsRashid, Muhammad; Jamal, Sajjad Shaukat; Khan, Sikandar Zulqarnain; Alharbi, Adel R.; Aljaedi, Amer; Imran, MalikApplied Sciences (Switzerland)2021 / art. 7079 https://doi.org/10.3390/app11157079 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

65

book article

Equivalent transformations of structurally synthesized BDDs and applicationsJürimägi, Lembit; Ubar, Raimund-Johannes; Viies, Vladimir2019 8th Mediterranean Conference on Embedded Computing (MECO)2019 / 6 p. : ill https://doi.org/10.1109/MECO.2019.8760283

book article

66

journal article

Error sources in analog ASICs and ways for their minimizationMihhailov, JuriInternational journal of engineering and applied sciences (EAAS)2013 / p. 32-41 : ill

journal article

67

journal article

Esimene üldkasutatav mikrokontrollerkiip TMS 1000Toomsalu, ArvoA & A2008 / 2, lk. 9-16 : ill

journal article

68

book

European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedingsCantarella, JD2005 https://www.ester.ee/record=b2300865*est

book

69

journal article EST / journal article ENG

Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuitsPagliarini, Samuel Nascimento; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, FernandaIEEE transactions on nuclear science2021 / p. 1045-1053 https://doi.org/10.1109/TNS.2021.3070643 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

70

book article

Fast test cost calculation for hybrid BIST in digital systemsOrasson, Elmet; Raidma, Rein; Ubar, Raimund-Johannes; Jervan, Gert; Peng, ZeboEuromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings2001 / p. 318-325 : ill https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f

book article

71

book article

Fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France2010 / p. 653-656 : ill https://ieeexplore.ieee.org/document/5537504

book article

72

book article

Fault diagnosis in integrated circuits with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Evartson, Teet; Lensen, Harri10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 604-610 : ill http://dx.doi.org/10.1109/DSD.2007.4341530

book article

73

journal article

Fault diagnosis in VLSI devicesUbar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering1995 / 1, p. 51-67

journal article

74

journal article

Fault effect reasoning in digital systems by topological view on low- and high-level decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета. Управление, вычислительная техника и информатика2014 / p. 99-113 : ill http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107

journal article

75

book article

Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDsDevadze, Sergei; Raik, Jaan; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 97-102 : ill

book article

integraallülitused (subject term)

types of item

subject term 1