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176

book article

Structurally synthesized multiple input BDDs for simulation of digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, Artur16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009 : Yasmine Hammamet, Tunesia, 13-19 December, 20092009 / p. 451-454 : ill http://dx.doi.org/10.1109/ICECS.2009.5410895

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177

journal article EST / journal article ENG

A survey on split manufacturing : attacks, defenses, and challengesPerez, Tiago Diadami; Pagliarini, Samuel NascimentoIEEE Access2020 / p. 184013-184035 https://doi.org/10.1109/ACCESS.2020.3029339 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Related publications 1

Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees

178

book

Süvatehnoloogiate alternatiivsed arengutrajektoorid ja nende tähendus Eestile : lõpparuanneKoppel, Kaupo; Kuusik, Alar; Arrak, Kadri; Raik, Jaan; Niidu, Allan; Kõks, Kerttu-Liis; Lahtvee, Petri-Jaan2023 https://media.voog.com/0000/0037/5345/files

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179

journal article EST / journal article ENG

Symmetry in the narrow sense: on the linearity and time-invariance of DQ0 modelsSegev, Elior; Ofir, Ron; Belikov, Juri; Levron, YoashIEEE Transactions on Power Systems2023 / p. 1751-1754 https://doi.org/10.1109/TPWRS.2022.3229873 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

180

book article

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

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181

book article

Synthesis of sequential circuits with dynamic power managementLensen, Harri; Kruus, Margus; Sudnitsõn, AleksanderProc. of 42nd International Scientific Conference of Riga Technical University : RTUCET'012001 / p. 81-86

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182

journal article

Synthesis of sequential circuits with dynamic power managementLensen, Harri; Kruus, Margus; Sudnitsõn, AleksanderScientific proceedings of Riga Technical University. 7.serija, Telecommunications and electronics2001 / p. 81-86

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183

journal article

System-level data format exploration for dynamically allocated data structuresEllervee, Peeter; Miranda, Miguel; Catthoor, Francky; Hemani, AhmedIEEE transactions on computer-aided design of integrated circuits and systems2001 / 12, p. 1469-1472 : ill https://ieeexplore.ieee.org/abstract/document/969440

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184

dissertation

System-level design of timing-sensitive network-on-chip based dependable systems = Kiipvõrkudel põhinevate ajakriitiliste ja töökindlate süsteemide kõrgtaseme disainTagel, Mihkel2012 https://www.ester.ee/record=b2778263*est

dissertation

185

journal article

Z-RAM-mäluToomsalu, ArvoA & A2008 / 3, lk. 10-19 https://artiklid.elnet.ee/record=b1022321*est

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186

newspaper article

TalTechi arvutisüsteemide professori uudne tehnoloogia raskendab spionaaži [Võrguväljaanne]Kald, Indrekituudised.ee2021 "TalTechi arvutisüsteemide professori uudne tehnoloogia raskendab spionaaži

newspaper article

187

book article

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

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188

book article

Teaching digital test with BIST analyzerJutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 123-128 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610171

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189

newspaper article

Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputadaPort, Kristjandelfi.ee2023 Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputada

newspaper article

190

newspaper article

Tehnikaülikooli teadlased loovad uue põlvkonna veakindlaid kiipeNõges, KrõõtMente et Manu2010 / lk. 2 https://www.ester.ee/record=b1242496*est

newspaper article

191

newspaper article

Tehnikaülikooli teadlaste juhtimisel luuakse uue põlvkonna veakindlaid kiipeStudioosus2010 / veebr., lk. 8 https://www.ester.ee/record=b1558644*est

newspaper article

192

journal article

10th IEEE European Test SymposiumUbar, Raimund-Johannes; Prinetto, Paolo; Raik, JaanIEEE journal of design & test of computers2005 / p. 480-481 : phot http://dx.doi.org/10.1109/MDT.2005.106

journal article

193

book article

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

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194

book article

Test cost minimization for hybrid BISTJervan, Gert; Peng, Zebo; Ubar, Raimund-JohannesIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings2000 / p. 283-298 : ill https://ieeexplore.ieee.org/abstract/document/887168

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195

journal article

Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocolsBengtsson, Tomas; Kumar, Shashi; Ubar, Raimund-Johannes; Jutman, Artur; Peng, ZeboIET computers and digital techniques2008 / 6, p. 445-460 https://www.diva-portal.org/smash/record.jsf?dswid=-5073&aq2=%5B%5B%5D%5D&c=39&af=%5B%5D&searchType=SIMPLE&sortOrder2=title_sort_asc&language=en&pid=diva2%3A290043&aq=%5B%5B%7B%22personId%22%3A%22authority-person%3A23389%22%7D%5D%5D&sf=all&aqe=%5B%5D&sortOrder=author_sort_asc&onlyFullText=false&noOfRows=50

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196

book article

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China2003 / p. 318-325 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

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197

book article

Test time minimization for hybrid BIST with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 112-116 : ill https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf

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198

book article

The dildis-project-using applets for more demonstrative lectures in digital systems design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichFIE 2001 : 31st Annual Frontiers in Educations Conference : Impact on Engineering and Science Education : Reno, Nevada, October 10-13, 2001 : conference program2001 / p. 83 https://ieeexplore.ieee.org/document/963996

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199

book article

The dildis-project-using applets for more demonstrative lectures in digital systems design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the 31st ASEE/IEEE Frontiers in Educations Conference : FIE'2001 : Reno, Nevada2001 / p. SIE-2-7 https://ieeexplore.ieee.org/document/963996

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200

newspaper article

Töökindla arvutusriistvara keskuse juht Maksim JenihhinJenihhin, Maksimforte.delfi.ee2024 Töökindla arvutusriistvara keskuse juht Maksim Jenihhin

newspaper article

integraallülitused (subject term)

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