Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
integraallülitused (subject term)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
203
Look more..
(1/1)
Export
export all inquiry results
(203)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
176
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
2007
/
p. 29-34 : ill
http://dx.doi.org/10.1109/ETS.2007.41
book article
177
book article
Test cost minimization for hybrid BIST
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
2000
/
p. 283-298 : ill
https://ieeexplore.ieee.org/abstract/document/887168
book article
178
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
book article
179
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf
book article
180
book article
The dildis-project-using applets for more demonstrative lectures in digital systems design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Proceedings of the 31st ASEE/IEEE Frontiers in Educations Conference : FIE'2001 : Reno, Nevada
2001
/
p. SIE-2-7
https://ieeexplore.ieee.org/document/963996
book article
181
book article
The dildis-project-using applets for more demonstrative lectures in digital systems design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
FIE 2001 : 31st Annual Frontiers in Educations Conference : Impact on Engineering and Science Education : Reno, Nevada, October 10-13, 2001 : conference program
2001
/
p. 83
https://ieeexplore.ieee.org/document/963996
book article
182
newspaper article
Töökindla arvutusriistvara keskuse juht Maksim Jenihhin
Jenihhin, Maksim
forte.delfi.ee
2024
Töökindla arvutusriistvara keskuse juht Maksim Jenihhin
newspaper article
183
book article
Ultra fast parallel fault analysis on structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
2007
/
p. 131-136 : ill
http://dx.doi.org/10.1109/ETS.2007.43
book article
184
book article
Untestable fault identification in sequential circuits using model-checking
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
Proceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan
2008
/
p. 21-26 : ill
http://dx.doi.org/10.1109/ATS.2008.22
book article
185
journal article
Uudne turvaline kiibitehnoloogia
Raik, Jaan
Mente et Manu
2021
/
lk. 32-33 : fot
Mente et Manu 2/2021
journal article
186
newspaper article
Uuring: Eesti majanduse veduriks võib saada kuus tehnoloogiavaldkonda
Bioneer.ee
2023
Uuring: Eesti majanduse veduriks võib saada kuus tehnoloogiavaldkonda
newspaper article
187
journal article EST
/
journal article ENG
Versatile direct and transpose matrix multiplication with chained operations : an optimized architecture using circulant matrices
Iakymchuk, Taras
;
Rosado-Munoz, Alfredo
;
Mompean, Manuel Bataller
;
Villora, Jose Vicente Frances
;
Osimiry, Emmanuel Ovie
IEEE Transactions on Computers
2016
/
p. 3470 - 3479
https://doi.org/10.1109/TC.2016.2538235
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
188
book article
VHDL design debug framework based on zamiaCAD
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2013 : Design Automation and Test in Europe, March 18-22, 2013, Grenoble, France
2013
/
[1] p. : ill
book article
189
newspaper article
Võitlus kiipides varitsevate troojalastega tõstab Eesti teadlased kilbile
Härmat, Karin
err.ee
2023
Võitlus kiipides varitsevate troojalastega tõstab Eesti teadlased kilbile
newspaper article
190
journal article
XXI sajandi arvuti
Toomsalu, Arvo
A & A
2000
/
1, lk. 8-13 ; 2, lk. 8-19
https://artiklid.elnet.ee/record=b1003324*est
journal article
191
book article
Быстродействующие интегральные компараторы
Gurjanov, Boris
;
Tamm, Uljas
IX Всесоюзная научно-техническая конференция по микроэлектронике, г. Казань, 14-17 окт. 1980 г. : тезисы докладов
1980
/
с. 88
book article
192
book article
Изменение параметров интегральных схем при анализе в растровом электронном микроскопе
Meiler, Boriss
Электрофизические свойства полупроводниковых и диэлектрических материалов
1986
/
с. 85-92
https://www.ester.ee/record=b1296001*est
book article
193
book article
Измеритель коэффициента шума интегральных усилителей
Tammet, Heinar
;
Torim, A.A.
Тезисы докладов республиканской научно-технической конференции, посвященной 80-летию со дня изобретения радио А. С. Поповым
1975
/
с. 93
https://www.ester.ee/record=b1322122*est
book article
194
book article
Измеритель шумов интегральных схем
Koiduste, A.
;
Tammet, Heinar
XX студенческая научно-техническая конференция вузов Прибалтийских республик, Белорусской ССР и Молдавской ССР : тезисы докладов. Часть 1
1974
/
с. 147
https://www.ester.ee/record=b1306141*est
book article
195
dissertation
Исследование влияния технологического микроклимата в производстве интегральных микросхем : автореферат ... кандидата технических наук (05.12.18)
Rätsep, Ülo
1983
https://www.ester.ee/record=b1522476*est
dissertation
196
journal article
Коэффициенное ударное ионизацеи носителей заряда в <100> арсениде галлия
Rang, Toomas
;
Puusepp, Märt
Электронная техника. Серия 2, Полупроводниковые приборы : научно-технический сборник
1987
/
с. 98-100
https://www.ester.ee/record=b2160501*est
journal article
197
book article
Метод исследования комплексного влияния параметров технологического микроклимата на качество полупроводниковых интегральных микросхем
Rätsep, Ülo
Тезисы докладов Республиканской научно-технической конференции "Современные методы и устройства радиоэлектронного оборудования", посвященной Дню радио. Секция: полупроводниковые приборы
1981
/
с. 81-82
https://www.ester.ee/record=b1310801*est
book article
198
book
Методическое пособие к лабораторным работам и курсовому проектированию по дисциплине "Схемотехника ЭВМ"
1987
https://www.ester.ee/record=b1354263*est
book
199
book article
Методы идентификации шумовых источников интегральных схем
Tammet, Heinar
Тезисы докладов республиканской научно-технической конференции, посвященной Дню радио, Таллин, 1977
1977
/
с. 87-88
https://www.ester.ee/record=b1313776*est
book article
200
book article
Оценка тенденции использования некоторых видов микросхем
Maltsev, Jüri
;
Ševtšenko, S.
Тезисы докладов республиканской научно-технической конференции, посвященной Дню радио. [1], Секция: Информационно-измерительная техника
1981
/
с. 25-26
https://www.ester.ee/record=b1310782~S1*est
book article
Number of records 203, displaying
176 - 200
previous
1
2
3
4
5
6
7
8
9
next
subject term
1
1.
integraallülitused
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT