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151

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Side-channel attacks on triple modular redundancy schemesAlmeida, Felipe; Aksoy, Levent; Raik, Jaan; Pagliarini, Samuel Nascimento2021 IEEE 30th Asian Test Symposium ATS 2021 : proceedings2021 / p. 79-84 : ill https://doi.org/10.1109/ATS52891.2021.00026 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

152

book article

A side-channel hardware trojan in 65nm CMOS with 2μW precision and multi-bit leakage capabilityPerez, Tiago Diadami; Pagliarini, Samuel Nascimento2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) : 17-20 January 2022 : Taipei, Taiwan2022 / p. 9-10 : ill https://doi.org/10.1109/ASP-DAC52403.2022.9712490

book article

Seotud publikatsioonid 1

Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees

153

book article EST / book article ENG

Side-channel Trojan insertion - a practical foundry-side attack via ECOPerez, Tiago Diadami; Imran, Malik; Vaz, Pablo; Pagliarini, Samuel Nascimento2021 IEEE International Symposium on Circuits and Systems (ISCAS), Daegu, Korea, May 22-28, 2021 : proceedings2021 / 5 p. : ill https://doi.org/10.1109/ISCAS51556.2021.9401481 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

Seotud publikatsioonid 1

Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees

154

journal article

Silicon integrated circuit fabrication process modeling and simulationRang, Toomas; Tarnay, K.; Mizsei, JanosPeriodica polytechnica. Electrical engineering = Электротехника1980 / p. 109-113 https://www.ester.ee/record=b1198855*est

journal article

155

book article

A simulation framework for 3-dimension networks-on-chip with different vertical channel density configurationsYing, Haoyuan; Jaiswal, Ashok; Abd El Ghany, Mohamed A; Hollstein, Thomas; Hofmann, KlausProceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 / p. 83-88 : ill

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156

journal article EST / journal article ENG

Split-chip design to prevent IP reverse engineeringPagliarini, Samuel Nascimento; Sweeney, Joseph; Mai, Ken; Blanton, Shawn; Mitra, Subhasish; Pileggi, LarryIEEE Design and Test2020 / p. 109-118 https://doi.org/10.1109/MDAT.2020.3033255 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

157

book article

Steady state analysis of an output signal based combination of two NLMS adaptive filtersTrump, Tõnu17th European Signal Processing Conference (EUSIPCO 2009) : 24-28 August 20092009 / p. 1720-1724 https://ieeexplore.ieee.org/document/7077570

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158

book article

Steady state analysis of the galvanically isolated DC/DC converter with a commutating LC filter [Electronic resource]Zakis, Janis; Vinnikov, Dmitri; Rankis, Ivars2012 IEEE International Conference on Industrial Technology : proceedings CD2012 / p. 838-843 : ill [CD-ROM] https://ieeexplore.ieee.org/document/6210041

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159

book article

Structurally synthesized multiple input BDDs for simulation of digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, Artur16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009 : Yasmine Hammamet, Tunesia, 13-19 December, 20092009 / p. 451-454 : ill http://dx.doi.org/10.1109/ICECS.2009.5410895

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160

journal article EST / journal article ENG

A survey on split manufacturing : attacks, defenses, and challengesPerez, Tiago Diadami; Pagliarini, Samuel NascimentoIEEE Access2020 / p. 184013-184035 https://doi.org/10.1109/ACCESS.2020.3029339 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Seotud publikatsioonid 1

Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees

161

book

Süvatehnoloogiate alternatiivsed arengutrajektoorid ja nende tähendus Eestile : lõpparuanneKoppel, Kaupo; Kuusik, Alar; Arrak, Kadri; Raik, Jaan; Niidu, Allan; Kõks, Kerttu-Liis; Lahtvee, Petri-Jaan2023 https://media.voog.com/0000/0037/5345/files

book

162

journal article EST / journal article ENG

Symmetry in the narrow sense: on the linearity and time-invariance of DQ0 modelsSegev, Elior; Ofir, Ron; Belikov, Juri; Levron, YoashIEEE Transactions on Power Systems2023 / p. 1751-1754 https://doi.org/10.1109/TPWRS.2022.3229873 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

163

book article

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

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164

book article

Synthesis of sequential circuits with dynamic power managementLensen, Harri; Kruus, Margus; Sudnitsõn, AleksanderProc. of 42nd International Scientific Conference of Riga Technical University : RTUCET'012001 / p. 81-86

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165

journal article

Synthesis of sequential circuits with dynamic power managementLensen, Harri; Kruus, Margus; Sudnitsõn, AleksanderScientific proceedings of Riga Technical University. 7.serija, Telecommunications and electronics2001 / p. 81-86

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166

journal article

System-level data format exploration for dynamically allocated data structuresEllervee, Peeter; Miranda, Miguel; Catthoor, Francky; Hemani, AhmedIEEE transactions on computer-aided design of integrated circuits and systems2001 / 12, p. 1469-1472 : ill https://ieeexplore.ieee.org/abstract/document/969440

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167

dissertation

System-level design of timing-sensitive network-on-chip based dependable systems = Kiipvõrkudel põhinevate ajakriitiliste ja töökindlate süsteemide kõrgtaseme disainTagel, Mihkel2012 https://www.ester.ee/record=b2778263*est

dissertation

168

journal article

Z-RAM-mäluToomsalu, ArvoA & A2008 / 3, lk. 10-19 https://artiklid.elnet.ee/record=b1022321*est

journal article

169

newspaper article

TalTechi arvutisüsteemide professori uudne tehnoloogia raskendab spionaaži [Võrguväljaanne]Kald, Indrekituudised.ee2021 "TalTechi arvutisüsteemide professori uudne tehnoloogia raskendab spionaaži

newspaper article

170

book article

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

book article

171

book article

Teaching digital test with BIST analyzerJutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 123-128 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610171

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172

newspaper article

Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputadaPort, Kristjandelfi.ee2023 Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputada

newspaper article

173

newspaper article

Tehnikaülikooli teadlased loovad uue põlvkonna veakindlaid kiipeNõges, KrõõtMente et Manu2010 / lk. 2 https://www.ester.ee/record=b1242496*est

newspaper article

174

newspaper article

Tehnikaülikooli teadlaste juhtimisel luuakse uue põlvkonna veakindlaid kiipeStudioosus2010 / veebr., lk. 8 https://www.ester.ee/record=b1558644*est

newspaper article

175

journal article

10th IEEE European Test SymposiumUbar, Raimund-Johannes; Prinetto, Paolo; Raik, JaanIEEE journal of design & test of computers2005 / p. 480-481 : phot http://dx.doi.org/10.1109/MDT.2005.106

journal article

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