Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
digitaalintegraallülitused (subject term)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
67
Look more..
(1/1)
Export
export all inquiry results
(67)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
journal article
Acceleration of recursive data sorting over tree-based structures
Mihhailov, Dmitri
;
Sudnitsõn, Aleksander
;
Sklyarov, Valery
;
Skliarova, Iouliia
Elektronika ir elektrotechnika = Electronics and electrical engineering
2011
/
p. 51-56 : ill
https://eejournal.ktu.lt/index.php/elt/article/view/612
journal article
2
journal article
Algorithms of functional level testability analysis for digital circuits
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
Periodica polytechnica. Electrical engineering
1992
/
3/4, p. 295-308
journal article
3
book article
Approaches to improve hierarchical ATPG for synchronous sequential circuits
Viilukas, Taavi
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa
2012
/
p. 105-108 : ill
book article
4
book article
Automated test pattern generator with constraint solver
Viilukas, Taavi
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
lk. 33-36
book article
5
book article
Boolean fault dignosis with structurally synthesized BDDs
Ubar, Raimund-Johannes
Recent progress in the Boolean domain
2014
/
p. 303-331 : ill
book article
6
book article
Collaborative distributed computing in the field of digital electronics testing
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Balanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings
2010
/
p. 145-152
book article
7
book article
Collaborative distributed fault simulation for digital electronic circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Intelligent Distributed Computing IV : proceedings of the 4th International Symposium on Intelligent Distributed Computing - IDC 2010 : Tangier, Morocco, September 2010
2010
/
p. 67-76
book article
8
book article
Constraint-based hierarchical untestability identification for synchronous sequential circuits
Raik, Jaan
;
Rannaste, Anna
;
Jenihhin, Maksim
;
Viilukas, Taavi
;
Ubar, Raimund-Johannes
;
Fujiwara, Hideo
Sixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim
2011
/
p. 147-152
book article
9
book article
Constraint-based hierarchical untestability identification for syncronous sequential circuits
Viilukas, Taavi
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Rannaste, Anna
;
Jenihhin, Maksim
;
Fujiwara, Hideo
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 139-142 : ill
book article
10
dissertation
Constraints solving based hierarchical test generation for synchronous sequential circuits = Kitsenduste lahendamisel baseeruv hierarhiline testigenereerimine sünkroonsetele järjestikskeemidele
Viilukas, Taavi
2012
https://www.ester.ee/record=b2888278*est
dissertation
11
book article
Decision diagrams for diagnostic modeling
Ubar, Raimund-Johannes
MEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia
2015
/
p. 43
book article
12
book article
Defect-oriented modul-level fault diagnosis in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
2011
/
p. 81-86
book article
13
book article
Description of digital objects with alternative graphs for test generation purposes
Ubar, Raimund-Johannes
;
Lohuaru, Tõnu
Fault Tolerant Systems and Diagnostics : XI. International Conference ; Proceedings ; Suhl, June 6-9, 1988
1988
/
p. [?]
book article
14
book
Design and test technology for dependable systems-on-chip
2011
https://www.ester.ee/record=b4467408*est
book
15
book article
Design error diagnosis using backtrace algorithm on decision diagrams
Repinski, Urmas
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
p. 93-96
book article
16
book article
Design obfuscation versus test
Farahmandi, Farimah
;
Sinanoglu, Ozgur
;
Blanton, Ronald
;
Pagliarini, Samuel Nascimento
2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia
2020
/
10 p
https://doi.org/10.1109/ETS48528.2020.9131590
book article
17
book
Design of FPGA-based circuits using hierarchical finite state machines
Skliarova, Iouliia
;
Sklyarov, Valery
;
Sudnitsõn, Aleksander
2012
http://www.ester.ee/record=b2857138*est
book
18
dissertation
DfT-based external test and diagnosis of mesh-like networks on chips = Testitavusel põhinev välise testi ja diagnoosi meetod kahemõõtmelistele kiipvõrkudele
Govind, Vineeth
2009
https://digi.lib.ttu.ee/i/?454
https://www.ester.ee/record=b2539211*est
dissertation
19
dissertation
Digital test in WEB-based environment
Ivask, Eero
2006
https://www.ester.ee/record=b2158119*est
dissertation
20
journal article
Dynamic analysis of digital circuits with multi-valued simulation
Ubar, Raimund-Johannes
Microelectronics journal
1998
/
11, p. 821-826: ill
journal article
21
book article
Evalutionary two-criteria optimization of finite state machines
Spitšakova, Margarita
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
lk. 101-104
book article
22
book article
Evolutionary approach to the functional test generation for digital circuits
Skobtsov, Y.A.
;
Ivanov, D.E.
;
Skobtsov, V.Y.
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 229-232 : ill
book article
23
book article
Fast fault emulation for synchronous sequential circuits
Raik, Jaan
;
Ellervee, Peeter
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
2004
/
p. 35-40
https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0
book article
24
book article
Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Orasson, Elmet
;
Raik, Jaan
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers
2016
/
p. 23-45 : ill
http://dx.doi.org/10.1007/978-3-319-46097-0_2
book article
25
dissertation
Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimine
Devadze, Sergei
2009
https://digi.lib.ttu.ee/i/?445
https://www.ester.ee/record=b2508727*est
dissertation
Number of records 67, displaying
1 - 25
previous
1
2
3
next
subject term
1
1.
digitaalintegraallülitused
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT