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151
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
152
book article
Teaching digital test with BIST analyzer
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
2008
/
p. 123-128 : ill
http://dx.doi.org/10.1109/EAEEIE.2008.4610171
book article
153
newspaper article
Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputada
Port, Kristjan
delfi.ee
2023
Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputada
newspaper article
154
newspaper article
Tehnikaülikooli teadlased loovad uue põlvkonna veakindlaid kiipe
Nõges, Krõõt
Mente et Manu
2010
/
lk. 2
https://www.ester.ee/record=b1242496*est
newspaper article
155
newspaper article
Tehnikaülikooli teadlaste juhtimisel luuakse uue põlvkonna veakindlaid kiipe
Studioosus
2010
/
veebr., lk. 8
https://www.ester.ee/record=b1558644*est
newspaper article
156
journal article
10th IEEE European Test Symposium
Ubar, Raimund-Johannes
;
Prinetto, Paolo
;
Raik, Jaan
IEEE journal of design & test of computers
2005
/
p. 480-481 : phot
http://dx.doi.org/10.1109/MDT.2005.106
journal article
157
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
2007
/
p. 29-34 : ill
http://dx.doi.org/10.1109/ETS.2007.41
book article
158
book article
Test cost minimization for hybrid BIST
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
2000
/
p. 283-298 : ill
https://ieeexplore.ieee.org/abstract/document/887168
book article
159
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
book article
160
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf
book article
161
newspaper article
Töökindla arvutusriistvara keskuse juht Maksim Jenihhin
Jenihhin, Maksim
forte.delfi.ee
2024
Töökindla arvutusriistvara keskuse juht Maksim Jenihhin
newspaper article
162
book article
Ultra fast parallel fault analysis on structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
2007
/
p. 131-136 : ill
http://dx.doi.org/10.1109/ETS.2007.43
book article
163
book article
Untestable fault identification in sequential circuits using model-checking
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
Proceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan
2008
/
p. 21-26 : ill
http://dx.doi.org/10.1109/ATS.2008.22
book article
164
journal article
Uudne turvaline kiibitehnoloogia
Raik, Jaan
Mente et Manu
2021
/
lk. 32-33 : fot
Mente et Manu 2/2021
journal article
165
newspaper article
Uuring: Eesti majanduse veduriks võib saada kuus tehnoloogiavaldkonda
Bioneer.ee
2023
Uuring: Eesti majanduse veduriks võib saada kuus tehnoloogiavaldkonda
newspaper article
166
book article
VHDL design debug framework based on zamiaCAD
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2013 : Design Automation and Test in Europe, March 18-22, 2013, Grenoble, France
2013
/
[1] p. : ill
book article
167
newspaper article
Võitlus kiipides varitsevate troojalastega tõstab Eesti teadlased kilbile
Härmat, Karin
err.ee
2023
Võitlus kiipides varitsevate troojalastega tõstab Eesti teadlased kilbile
newspaper article
168
journal article
XXI sajandi arvuti
Toomsalu, Arvo
A & A
2000
/
1, lk. 8-13 ; 2, lk. 8-19
https://artiklid.elnet.ee/record=b1003324*est
journal article
169
book article
Быстродействующие интегральные компараторы
Gurjanov, Boris
;
Tamm, Uljas
IX Всесоюзная научно-техническая конференция по микроэлектронике, г. Казань, 14-17 окт. 1980 г. : тезисы докладов
1980
/
с. 88
book article
170
book article
Изменение параметров интегральных схем при анализе в растровом электронном микроскопе
Meiler, Boriss
Электрофизические свойства полупроводниковых и диэлектрических материалов
1986
/
с. 85-92
https://www.ester.ee/record=b1296001*est
book article
171
book article
Измеритель коэффициента шума интегральных усилителей
Tammet, Heinar
;
Torim, A.A.
Тезисы докладов республиканской научно-технической конференции, посвященной 80-летию со дня изобретения радио А. С. Поповым
1975
/
с. 93
https://www.ester.ee/record=b1322122*est
book article
172
book article
Измеритель шумов интегральных схем
Koiduste, A.
;
Tammet, Heinar
XX студенческая научно-техническая конференция вузов Прибалтийских республик, Белорусской ССР и Молдавской ССР : тезисы докладов. Часть 1
1974
/
с. 147
https://www.ester.ee/record=b1306141*est
book article
173
dissertation
Исследование влияния технологического микроклимата в производстве интегральных микросхем : автореферат ... кандидата технических наук (05.12.18)
Rätsep, Ülo
1983
https://www.ester.ee/record=b1522476*est
dissertation
174
journal article
Коэффициенное ударное ионизацеи носителей заряда в <100> арсениде галлия
Rang, Toomas
;
Puusepp, Märt
Электронная техника. Серия 2, Полупроводниковые приборы : научно-технический сборник
1987
/
с. 98-100
https://www.ester.ee/record=b2160501*est
journal article
175
book article
Метод исследования комплексного влияния параметров технологического микроклимата на качество полупроводниковых интегральных микросхем
Rätsep, Ülo
Тезисы докладов Республиканской научно-технической конференции "Современные методы и устройства радиоэлектронного оборудования", посвященной Дню радио. Секция: полупроводниковые приборы
1981
/
с. 81-82
https://www.ester.ee/record=b1310801*est
book article
Number of records 181, displaying
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