High-level test generation for processing elements in many-core systems
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Siavoosh Payandeh Azad, Jaan Raik
location of publication
[S.l.]
publisher
year of publication
pages
8 p. : ill
conference name, date
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017
conference location
Madrid, Spain
subject term
keyword
ISBN
978-1-5386-3344-1/17
notes
Bibliogr.: 29 ref
TTÜ department
language
inglise
Oyeniran, A.S., Ubar, R., Azad, S.P., Raik, J. High-level test generation for processing elements in many-core systems // 12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings. [S.l.] : IEEE, 2017. 8 p. : ill.