RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems
autor
vastutusandmed
Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendoerfer, Christian Sauer, Anton Klotz, Michael Huebner, Joerg Nolte, Heinrich Theodor Vierhaus, Georgios Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert-Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka
allikas
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
ilmumiskoht
Danvers
kirjastus/väljaandja
ilmumisaasta
leheküljed
art. 19690741 , 6 p
konverentsi nimetus, aeg
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE 2020), 9 to 13 March, 2020
konverentsi toimumispaik
Grenoble, France
ISBN
978-3-9819263-4-7
märkused
Bibliogr.: 58 ref
TTÜ struktuuriüksus
keel
inglise
Jenihhin, M., Hamdioui, S., Sonza Reorda, M., Raik J. et al. RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems // 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings. Danvers : EDAA, 2020. art. 19690741 , 6 p.