Otsing - TalTech teadusportaal

Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English

Publikatsioonid

Publikatsioonid

Otsing

Valitud kirjed 0

at-speed testing (võtmesõna)

—

—

—

—

Lisa tingimus Liitotsing filter

Tühista

teaviku laadid

raamat ..

artikkel ajakirjas ..

artikkel ajalehes ..

artikkel kogumikus ..

dissertatsioon ..

Open Access ..

Teaduspublikatsioon ..

aasta

Toon andmeid..

Toon andmeid..

TTÜ struktuuriüksus

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Tühista

Kirjeid leitud 3
Vaata veel.. (1/136)
Ekspordi

ekspordi kõik päringu tulemused (3)
Salvesta TXT fail

prindi
Märgitud kirjetega toimetamiseks ava valitud kirjed

kuva

reasta
1

artikkel kogumikus

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

artikkel kogumikus
2

artikkel ajakirjas EST / artikkel ajakirjas ENG

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
3

artikkel kogumikus

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

artikkel kogumikus

Kirjeid leitud 3, kuvan 1 - 3

1. at-speed testing
2. absolute convergence with speed
3. A-statistical convergence with speed
4. boundedness and summability with speed
5. boundedness with speed
6. convergence and absolute convergence with speed
7. convergence and boundedness with speed
8. convergence and α-absolute convergence with speed
9. convergence with speed
10. Drilling speed
11. high speed boat
12. high speed craft (HSC)
13. high speed machining
14. high speed measurement
15. high-speed
16. high-speed camera
17. high-speed craft
18. high-speed design
19. high-speed MAS (magic angle spinning)
20. high-speed planing crafts
21. high-speed railway
22. high-speed serial link test
23. high-speed temperature scanner
24. high-speed temperature scanner (HSTS)
25. high-speed thermogravimetric analysis
26. low speed
27. operational speed
28. paranormal absolute convergence with speed
29. paranormal boundedness with speed
30. paranormal convergence with speed
31. paranormed absolute convergence with speed
32. paranormed boundedness with speed
33. paranormed convergence with speed
34. paranormed zero-convergence with speed
35. peeling speed
36. Pollen fall speed
37. speed
38. speed and position estimation
39. speed of convergence
40. speed of releases
41. speed tracking setpoints
42. speed-Maddox spaces
43. summability and absolute summability with speed
44. summability and boundedness with speed
45. zero-convergence with speed
46. variable speed drive
47. variable speed drives
48. variable speed wind turbines
49. variable-speed drives
50. variable-speed drives (VSDs)
51. water speed
52. wind speed
53. α-absolute convergence with speed
54. α-absolute summability with speed
55. accelerated testing
56. acoustomechanical testing
57. anaerobic testing
58. aspect-oriented testing
59. assessment and testing
60. benchmark testing
61. Berridge testing
62. burst testing
63. cancer genomic testing
64. compliance testing
65. compositional testing
66. computer aided testing
67. cone heater testing
68. conformance testing
69. courses on electronic testing and design
70. cybersecurity testing
71. D. non-destructive testing
72. deformation testing
73. design field testing
74. destructive testing
75. eddy current testing
76. eddy current testing (ECT)
77. erosion testing
78. fatigue testing
79. fire testing
80. hierarchical testing
81. hypotheses testing
82. Implementation-Independent Testing of Microprocessors
83. integration testing
84. laboratory scale testing
85. load testing
86. macro mechanical testing and green surface tribology
87. material testing
88. materials testing
89. measurement and testing
90. mechanical testing
91. memory testing
92. metamorphic testing
93. microprocessor testing
94. model based testing
95. model-based mutation testing
96. model-based testing
97. mutation testing
98. network-testing
99. non destructive testing
100. nondestructive testing
101. non-destructive testing
102. on-site testing
103. pin on disc wear testing
104. PMU calibration testing
105. PMU testing
106. point-of-care testing
107. processor core testing
108. processor testing
109. real-time HiL testing
110. regression testing
111. RISC processor testing
112. robustness testing
113. safety and security testing
114. scenario testing
115. scratch testing
116. security testing
117. shear testing
118. small-scale fire testing
119. software testing
120. software-in-the-loop (SIL) testing
121. stand-alone testing
122. stress-testing
123. substation testing methods
124. system testing
125. tensile testing
126. testing
127. testing methods
128. testing of digital devices
129. testing of generator
130. testing of phasor measurement units
131. two-dimensional array testing
132. ultrasonic testing
133. wafer testing
134. wear testing
135. vibration testing
136. virtual testing

vaste

reasta

Otsing
Valikud 0

ilmumisaasta

autor

TTÜ struktuuriüksus

märksõna

seeria-sari

tema kohta

võtmesõna

TalTech Raamatukogu

Akadeemia tee 1

13519

TalTech koduleht TalTech Raamatukogu koduleht Digikogu Digiteek Teadusandmed

6203551

data@taltech.ee

TalTech Raamatukogu