A two-phase metamorphic approach for testing industrial control systems

autor
Sudheerbabu, Gaadha
Sebek, Filip
vastutusandmed
Gaadha Sudheerbabu, Tanwir Ahmad, Filip Sebek, Dragos Truscan, Jüri Vain, Ivan Porres
allikas
2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) : proceedings
kirjastus/väljaandja
ilmumisaasta
leheküljed
4 p
konverentsi nimetus, aeg
2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), 6-9 Sept. 2022
konverentsi toimumispaik
Stuttgart, Germany
märkused
Bibliogr.: 9 ref
Open Access
Open Access (roheline)
teaduspublikatsioon
teaduspublikatsioon
TTÜ struktuuriüksus
keel
inglise
Sudheerbabu, Gaadha; Ahmad, Tanwir; Sebek, Filip; Truscan, Dragos; Vain, Jüri;Porres, Ivan A two-phase metamorphic approach for testing industrial control systems // 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) : proceedings. : IEEE, 2022. 4 p. https://doi.org/10.1109/ETFA52439.2022.9921439