prindi

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]

autor
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
vastutusandmed
Raimund Ubar, Sergei Kostin, Jaan Raik
allikas
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
ilmumiskoht
Piscataway
kirjastus/väljaandja
IEEE
ilmumisaasta
2013
leheküljed
p. 36-41 : ill [CD-ROM]
konverentsi nimetus, aeg
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 26-28 March, 2013
konverentsi toimumispaik
Abu Dhabi, UAE
märksõna
integraallülitused
kiipvõrgud
rikked
testimine
võtmesõna
multiple faults
fault masking
test groups
test generation
fault dignosis
ISBN
978-1-4673-6038-8
märkused
Bibliogr.: 21 ref
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Ubar, R., Kostin, S., Raik, J. Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource] // 2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE. Piscataway : IEEE, 2013. p. 36-41 : ill [CD-ROM].