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test generation (võtmesõna)
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1
artikkel kogumikus
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
artikkel kogumikus
2
artikkel kogumikus
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
artikkel kogumikus
3
artikkel kogumikus
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing
artikkel kogumikus
4
artikkel kogumikus
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
artikkel kogumikus
5
artikkel kogumikus
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
artikkel kogumikus
6
artikkel kogumikus
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
artikkel kogumikus
7
artikkel kogumikus
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
artikkel kogumikus
8
artikkel kogumikus
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
artikkel kogumikus
9
artikkel kogumikus
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
artikkel kogumikus
10
artikkel kogumikus EST
/
artikkel kogumikus ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
artikkel kogumikus EST
/
artikkel kogumikus ENG
11
artikkel kogumikus
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
artikkel kogumikus
12
artikkel kogumikus
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
artikkel kogumikus
13
artikkel kogumikus
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
artikkel kogumikus
14
artikkel kogumikus
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
artikkel kogumikus
Kirjeid leitud 14, kuvan
1 - 14
võtmesõna
202
1.
behaviour level test generation
2.
functional test generation
3.
highlevel test generation
4.
implementation-independent test generation
5.
offline test generation
6.
provably correct test generation
7.
test generation
8.
test generation and fault diagnosis
9.
adaptive test strategy generation
10.
automated test pattern generation
11.
automatic test case generation
12.
automatic test pattern generation
13.
automatic test program generation
14.
high-level test data generation
15.
test program generation
16.
Activity-based demand generation
17.
automatic code generation
18.
Automatic generation control
19.
automatic GUI model generation
20.
building and urban form generation
21.
business model generation
22.
code generation
23.
disaster alert generation
24.
distributed electricity generation
25.
distributed generation
26.
Distributed Generation (DG)
27.
distributed generation systems
28.
distributed power generation
29.
distrubuted power generation
30.
droplet generation
31.
droplet generation rate control
32.
electric power generation
33.
electricity generation
34.
energy generation
35.
extreme penetration level of non synchronous generation
36.
feasible path generation
37.
fifth generation computer
38.
fourth generation district heating
39.
frequent item generation
40.
generation
41.
generation and transmission expansion planning
42.
Generation Costs
43.
generation of electric energy
44.
generation succession
45.
heat generation
46.
hydroelectric power generation
47.
hydrogen generation
48.
I–III generation
49.
job generation
50.
multisine generation
51.
next generation 4D printing
52.
next generation sequencing
53.
Next-generation probiotics
54.
next-generation sequencing
55.
oil-shale power generation
56.
pattern Generation
57.
photovoltaic (PV) generation
58.
photovoltaic generation dispatch
59.
power generation
60.
power generation dispatch
61.
power generation economics
62.
power generation planning
63.
PV generation
64.
PV power generation
65.
Renewable energy generation
66.
renewable generation
67.
residual generation
68.
Second generation bioethanol
69.
second generation of tribology models
70.
second generation sequencing
71.
silver generation
72.
solar power generation
73.
space generation advisory council
74.
template based sql generation
75.
trajectory generation
76.
waste generation
77.
wave generation
78.
white light generation
79.
wind energy generation
80.
wind generation
81.
wind power generation
82.
16S rRNA gene amplicon next-generation sequencing
83.
4GDH (4th generation district heating)
84.
4th generation district heating
85.
5th generation district heating
86.
accelerated shelf-life test
87.
antigen test
88.
ASTM G65 dry sand rubber wheel abrasion test
89.
automated test environment
90.
Auvergne test-bed
91.
battery test
92.
behavioral test
93.
bending test
94.
bit-error rate test
95.
Board and System Test
96.
board test
97.
bounds test
98.
built-in self-test
99.
capillary condensation redistribution test
100.
chi-square test
101.
closed bottle test
102.
cognitive screening test
103.
compartment fire test
104.
compartment test
105.
cone penetration test (CPT)
106.
COVID-19 antigen test
107.
cutting test
108.
cybersecurity test bed
109.
DDR4 interconnect test
110.
design and test
111.
design-for-test
112.
deterministic test sequences
113.
diagnostic test
114.
digital test
115.
Digital test and testable design
116.
double-pulse test
117.
drawing test
118.
dry droplet antimicrobial test
119.
embedded test
120.
fan pressurisation test
121.
final test result prediction
122.
four-point bending test
123.
FPGA based test
124.
FPGA-Assisted Test
125.
FPGA-centric test
126.
functional self-test
127.
Granger causality test
128.
hardness test
129.
high-level synthesis for test
130.
high-speed serial link test
131.
IEEE 9 bus test system
132.
in situ tensile test in SEM
133.
industrial field test
134.
in-situ tensile test in SEM
135.
Johansen cointegration test
136.
Kolmogorov-Smirnov test
137.
load test
138.
logic built-in self-test
139.
Luria alternating series test
140.
Mann–Kendall test
141.
memory interconnect test
142.
microprocessor test
143.
Model test
144.
multiplier test
145.
orthogonal test
146.
package test analysis
147.
parallel design and test
148.
performance test
149.
piezocone penetration test (CPTu)
150.
Point Load Test index
151.
pressurisation test
152.
processor-centric board test
153.
progressive damage test
154.
pseudo-exhaustive test
155.
purity test
156.
rtioco-based timed test sequences
157.
seasonal Mann Kendall test
158.
seismic piezocone penetration test
159.
self-test
160.
self-test architectures
161.
sentence writing test
162.
serial sevens test
163.
ship towing test tank
164.
similar material simulation test
165.
small‐scale test
166.
software based self-test
167.
software-based self-test
168.
software-based self-test (SBST)
169.
soil phosphorus (P) test
170.
standard test method
171.
static load test
172.
static-dynamic probing test (SDT)
173.
stress test
174.
system level test
175.
teaching design and test of systems
176.
tensile test
177.
test
178.
test and evaluation platform
179.
test bench
180.
test coverage
181.
test driven development
182.
test driven modelling
183.
test embankment
184.
test equipment
185.
test groups
186.
test model design
187.
test optimization
188.
test packets
189.
test path synthesis
190.
test patterns
191.
test point insertion
192.
test reference year
193.
test replication
194.
test scenario description language
195.
test-bed
196.
test-chips
197.
test-house
198.
test-pattern
199.
test-suite reduction
200.
Three-point bending test
201.
unit root test
202.
1995 ECC benchmark test
märksõna
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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