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Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]

autor
vastutusandmed
Raimund Ubar, Sergei Kostin, Jaan Raik
allikas
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
ilmumiskoht
Piscataway
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 36-41 : ill [CD-ROM]
konverentsi nimetus, aeg
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 26-28 March, 2013
konverentsi toimumispaik
Abu Dhabi, UAE
ISBN
978-1-4673-6038-8
märkused
Bibliogr.: 21 ref
TTÜ struktuuriüksus
keel
inglise
Ubar, R., Kostin, S., Raik, J. Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource] // 2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE. Piscataway : IEEE, 2013. p. 36-41 : ill [CD-ROM].