DECIDER : a system for hierarchical test pattern generation

vastutusandmed
Jaan Raik, Raimund Ubar
ajakirja aastakäik number kuu
3
ilmumisaasta
leheküljed
p. 40-45 : ill
ISSN
1563-0064
märkused
Bibliogr.: 16 ref
Special issue: Proceedings of East-West Design & Test Conference (EWDTC’03): Yalta, Alushta, Crimea, Ukraine, September 17-21, 2003
keel
inglise
Raik, J., Ubar, R.-J. DECIDER : a system for hierarchical test pattern generation // Radioelectronics and informatics (2003) 3, p. 40-45 : ill. https://www.researchgate.net/publication/250395975_DECIDER_A_System_for_Hierarchical_Test_Pattern_Generation