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Special session: approximation and fault resiliency of DNN acceleratorsAhmadilivani, Mohammad Hasan; Barbareschi, Mario; Barone, Salvatore; Bosio, Alberto; Daneshtalab, Masoud; Torca, Salvatore Della; Gavarini, Gabriele; Jenihhin, Maksim; Raik, Jaan; Taheri, MahdiProceedings 2023 IEEE 41st VLSI Test Symposium (VTS)2023 / 10 p. : ill https://doi.org/10.1109/VTS56346.2023.10140043 Conference proceeding at Scopus Article at Scopus Article at WOS

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Study of MOSFET post-fault operation in fault-tolerant DC-DC convertersBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2022 IEEE 7th International Energy Conference (ENERGYCON)2022 / Code 181231, 5 p https://doi.org/10.1109/ENERGYCON53164.2022.9830216

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Seotud publikatsioonid 1

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Supply chain quality improvement based on customer complianceMaas, Rene; Shevtshenko, Eduard; Karaulova, TatjanaTechnological Innovation for Connected Cyber Physical Spaces : 14th IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2023, Caparica, Portugal, July 5–7, 2023 : proceedings2023 / p. 230 - 242 https://doi.org/10.1007/978-3-031-36007-7_17 Conference Proceedings at Scopus Article at Scopus

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Using STLs for effective in-field test of GPUsRodriguez Condia, Josie E.; Da Silva, Felipe Augusto; Bagbaba, Ahmet Cagrl; Guerrero-Balaguera, Juan-David; Hamdioui, Said; Sauer, Christian; Reorda, Matteo SonzaIEEE Design and Test2023 / p. 109-117 https://doi.org/10.1109/MDAT.2022.3188573 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Wear-out failure analysis of an impedance-source PV microinverter based on system-level electrothermal modelingShen, Yanfeng; Chub, Andrii; Wang, Huai; Vinnikov, Dmitri; Liivik, Elizaveta; Blaabjerg, FredeIEEE transactions on industrial electronics2019 / p. 3914-3927 https://doi.org/10.1109/TIE.2018.2831643 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Wear-out failure analysis of solar optiverter operating with 60- and 72-cell Si crystalline PV modulesLiivik, Liisa; Chub, Andrii; Sangwongwanich, Ariya; Shen, Yanfeng; Vinnikov, Dmitri; Blaabjerg, FredeIECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society : proceedings2018 / p. 6134-6140 : ill https://doi.org/10.1109/IECON.2018.8592925

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