Otsing - TalTech teadusportaal

kuva

reasta

1

artikkel kogumikus

About robustness of test patterns regarding multiple faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador2012 / p. 86-91 : ill

artikkel kogumikus

2

artikkel ajakirjas

Accurate dialysis dose evaluation and extrapolation algorithms during online optical dialysis monitoringFridolin, Ivo; Karai, Deniss; Kostin, Sergei; Ubar, Raimund-JohannesIEEE transactions on biomedical engineering2013 / p. 1371-1377 : ill

artikkel ajakirjas

3

artikkel kogumikus

Accurate NBTI-induced gate delay modeling based on intensive SPICE simulationsKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 21-26 : ill

artikkel kogumikus

4

artikkel kogumikus

Block-level fault model-free debug and diagnosis in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 12th EUROMICRO Conference on Digital System Design, Architectures, Methods and Tools : Patras, Greece, August 27-29, 20092009 / p. 229-232 https://ieeexplore.ieee.org/document/5350128

artikkel kogumikus

5

artikkel kogumikus

Built-in self diagnosis with multiple signature analyzers in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 29-34 : ill

artikkel kogumikus

6

artikkel kogumikus

Calculation of the diagnosibility of digital circuits without using fault modelsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 159-162 : ill

artikkel kogumikus

7

artikkel kogumikus

Combined fault-model free cause-effect and effect-cause fault diagnosis in block-level digital networksUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanASQED'09 : 1st Asia Symposium on Quality Electronic Design : Kuala Lumpur, Malaisia, July 15-16, 20092009 / p. 385-390 https://ieeexplore.ieee.org/document/5206232

artikkel kogumikus

8

artikkel kogumikus

Comparison of two approaches to improve functional BIST fault coverageKostin, Sergei; Ubar, Raimund-Johannes; Gorev, Maksim; Mägi, GunnarBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 105-108 : ill

artikkel kogumikus

9

artikkel kogumikus

Defect-oriented modul-level fault diagnosis in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 81-86

artikkel kogumikus

10

artikkel kogumikus

DIAGNOZER : a laboratory tool for teaching research in diagnosis of electronic systems [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Jutman, Artur; Raik, Jaan; Wuttke, Heinz-Dietrich2009 IEEE International Conference on Microelectronic Systems Education MSE '09 : 25-27 July 2009, San Francisco, California : [proceedings]2009 / p. 12-15 : ill. [CD-ROM] http://dx.doi.org/10.1109/MSE.2009.5270842

artikkel kogumikus

11

artikkel kogumikus

E-learning environment for WEB-based study of testingUbar, Raimund-Johannes; Jutman, Artur; Raik, Jaan; Devadze, Sergei; Jenihhin, Maksim; Aleksejev, Igor; Tšepurov, Anton; Tšertov, Anton; Kostin, Sergei; Orasson, Elmet; Wuttke, Heinz-DietrichProceedings of the 8th European Workshop on Microelectronics Education : EWME 2010 : Darmstadt, Germany, 10-12 May 20102010 / p. 47-52 : ill

artikkel kogumikus

12

artikkel kogumikus

Embedded diagnosis in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2008 26th International Conference on Microelectronics : Niš, Serbia, 11-14 May 2008 : proceedings. Vol. 22008 / p. 421-424 : ill

artikkel kogumikus

13

artikkel kogumikus

Embedded diagnosis in digital systemsKostin, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 81-84 : ill

artikkel kogumikus

14

artikkel ajakirjas

Embedded fault diagnosis in digital systems with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanMicroprocessors and microsystems2008 / 5/6, p. 279-287 : ill

artikkel ajakirjas

15

artikkel ajakirjas

Environment for the analysis of functional self-test quality in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Kruus, Helena; Aarna, Margit; Devadze, SergeiProceedings of the Estonian Academy of Sciences2014 / p. 151-162 : ill https://artiklid.elnet.ee/record=b2673964*est

artikkel ajakirjas

16

artikkel ajakirjas

Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanInternational journal of microelectronics and computer science2018 / p. 9−18 https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1 https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf

artikkel ajakirjas

17

artikkel kogumikus

Experimental comparison of different diagnosis algorithms in the BIST environmentUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Kruus, MargusProceedings of the 16th IASTED International Conference on Applied Simulation and Modelling : August 29-31, 2007, Palma de Mallorca, Spain2007 / p. 271-276 : ill

artikkel kogumikus

18

artikkel ajakirjas EST / artikkel ajakirjas ENG

Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

19

artikkel kogumikus

Fault diagnosis in integrated circuits with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Evartson, Teet; Lensen, Harri10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 604-610 : ill http://dx.doi.org/10.1109/DSD.2007.4341530

artikkel kogumikus

20

artikkel kogumikus

Fault diagnosis in the BIST environment based on bisection of detected faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru2007 / [6] p. : ill

artikkel kogumikus

21

artikkel kogumikus

Gate-level modelling of NBTI-induced delays under process variationsCopetti, Thiago; Cardoso Medeiros, Guilherme; Bolzani Poehls, Leticia; Vargas, Fabian; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 75-80 : ill http://dx.doi.org/10.1109/LATW.2016.7483343

artikkel kogumikus

22

artikkel kogumikus

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

artikkel kogumikus

23

artikkel ajakirjas

Hierarchical physical defect reasoning in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Brik, MarinaEstonian journal of engineering2011 / 3, p. 185-200

artikkel ajakirjas

24

artikkel kogumikus

Hierarchical timing-critical paths analysis in sequential circuitsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Kostin, Sergei2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain2018 / 6 p. : ill https://doi.org/10.1109/PATMOS.2018.8464176

artikkel kogumikus

25

artikkel kogumikus

How to prove that a circuit is fault-free?Ubar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey2012 / p. 427-430 : ill https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free

artikkel kogumikus

Kostin, Sergei (autor)

teaviku laadid

autor 81

CV 46

tema kohta 15