Otsing - TalTech teadusportaal

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226

artikkel kogumikus

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

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227

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Implementation-independent test generation for a large class of faults in RISC processor modulesJenihhin, Maksim; Oyeniran, Adeboye Stephen; Raik, Jaan; Ubar, Raimund-Johannes24th Euromicro Conference on Digital System Design (DSD)2021 https://doi.org/10.1109/DSD53832.2021.00090

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228

artikkel kogumikus

An improved estimation methodology for hybrid BIST cost calculationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 297-300 : ill https://ieeexplore.ieee.org/document/1423882

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229

artikkel ajakirjas EST / artikkel ajakirjas ENG

Improved fault classification and localization in power transmission networks using vae-generated synthetic data and machine learning algorithmsKhan, Muhammad Amir; Asad, Bilal; Vaimann, Toomas; Kallaste, Ants; Pomarnacki, Raimondas; Hyunh, Van KhangMachines2023 / art. 963 https://doi.org/10.3390/machines11100963 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

230

artikkel kogumikus

Improved fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 72-78 : ill

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231

artikkel kogumikus

Improving the confidence level in functional safety simulation tools for ISO 26262Bagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://dvcon-proceedings.org/document/improving-the-confidence-level-in-functional-safety-simulation-tools-for-iso-26262/ https://zenodo.org/record/3361607#.Y0PHFnZByHs

artikkel kogumikus

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

232

dissertatsioon

Insulation durability and measurement of partial discharge = Isolatsiooni vastupidavus ja osalahenduste mõõtmineKiitam, Ivar2021 https://www.ester.ee/record=b5473274*est https://digikogu.taltech.ee/et/Item/401e6d0b-f51d-488f-b0d6-2e2bdb8f9496 https://doi.org/10.23658/taltech.62/2021

dissertatsioon

233

artikkel kogumikus

Integrated modelling, fault management, verification and reliable design environment for cyber-physical systemsRaik, Jaan; Rauwerda, Gerard; Zhao, Yong; Shibin, KonstantinMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 74

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234

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Intelligent diagnostic centers: a new way to distributed fault-toleranceVarkonyi-Koczy, Annamaria R.; Tilly, K.; Dobrowiecki, Tadeusz; Vadasz, B.; Kiss, I.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 365-368: ill

artikkel kogumikus

235

artikkel kogumikus

Internet based test generation and fault simulationIvask, Eero; Ubar, Raimund-Johannes; Raik, Jaan; Schneider, AndreIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 57-60 : ill

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236

artikkel kogumikus

Internet-based collaborative test generation with MOSCITO [Electronic resource]Schneider, Andre; Ivask, Eero; Miklos, P.; Raik, Jaan; Diener, Karl-Heinz; Ubar, Raimund-Johannes; Cibakova, Tatiana; Gramatova, ElenaSIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 20022002 / [6] p. [CD-ROM] https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF

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237

artikkel ajakirjas EST / artikkel ajakirjas ENG

Investigating the progression of insulation degradation in power cable based on partial discharge measurementsHassan, Waqar; Shafiq, Muhammad; Hussain, Ghulam Amjad; Choudhary, Maninder; Palu, IvoElectric power systems research2023 / art. 109452 https://doi.org/10.1016/j.epsr.2023.109452 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

238

artikkel kogumikus

Invited paper: System-Wide Fault Management based on IEEE P1687 IJTAGJutman, Artur; Devadze, Sergei; Aleksejev, Jevgeni6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC) : 20-22 June 2011, Montpeillier, France2011 / [4] p.: ill https://ieeexplore.ieee.org/document/5981520

artikkel kogumikus

239

dissertatsioon

IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaksRaja, Hadi Ashraf2023 https://doi.org/10.23658/taltech.20/2023 https://digikogu.taltech.ee/et/Item/3015334f-c32b-43ae-ba2d-bfcda536aba5 https://www.ester.ee/record=b5558656*est

dissertatsioon

Seotud publikatsioonid 7

240

artikkel kogumikus

Kordsete rikete diagnostika järjestiklülitustesPuulinn, S.; Ubar, Raimund-JohannesXXIX vabariiklik üliõpilaste teaduslik- tehniline konverents 30. märtsist - 1. aprillini 1977 : ettekannete teesid1977 / lk. 43 https://www.ester.ee/record=b2449987*est

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241

artikkel kogumikus

Kui pikk peab olema elektrikatkestusValdna, VelloTallinna Tehnikaülikooli aastaraamat 20032004 / lk. 169-170

artikkel kogumikus

242

artikkel ajalehes

Kui pikk peab olema elektrikatkestus : [poliitikud peavad väärtustama reaalharidust, insenerikoolitust ja tehnikateadusi]Valdna, VelloPostimees2003 / 23. sept., lk. 13 https://arvamus.postimees.ee/2049577/kui-pikk-peab-olema-elektrikatkestus

artikkel ajalehes

243

artikkel ajalehes

Kuidas teha peedist pesumasinale trumlit? Auvere elektrijaam neelab veel miljoneid ega hakka niipea normaalselt tööle!Niitra, Nilsohtuleht.ee2023 / lk. 4-5 Kuidas teha peedist pesumasinale trumlit? Auvere elektrijaam neelab veel miljoneid ega hakka niipea normaalselt tööle!

artikkel ajalehes

244

artikkel ajakirjas

KuumvahetusmoodulidToomsalu, ArvoA & A1999 / 4, lk. 13-15 https://artiklid.elnet.ee/record=b1002041*est

artikkel ajakirjas

245

artikkel kogumikus

Localization of single-gate design errors in combinational circuits by diagnostic information about stuck-at faultsUbar, Raimund-Johannes; Borrione, DominiqueProceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 19981998 / p. 73-79 https://www.researchgate.net/publication/238687832_Localization_of_Single_Gate_Design_Errors_in_Combinational_Circuits_by_Diagnostic_Information_about_Stuck-at_Faults

artikkel kogumikus

246

artikkel kogumikus

Logic simulation and fault collapsing with shared structurally synthesized BDDsMironov, Dmitri; Ubar, Raimund-Johannes; Raik, Jaan2014 19th IEEE European Test Symposium (ETS) : May 26th-30th, 2014, Paderborn, Germany : proceedings2014 / [2] p. : ill

artikkel kogumikus

247

artikkel kogumikus

Logic-based implementation of fault-tolerant routing in 3D Network-on-ChipsNiazmand, Behrad; Azad, Siavoosh Payandeh; Flich, Jose; Raik, Jaan; Jervan, Gert; Hollstein, Thomas2016 Tenth IEEE/ACM International Symposium on Networks-on-Chip (NOCS) : Nara, Japan, 31 August - 2 September 20162016 / [8] p. : ill https://doi.org/10.1109/NOCS.2016.7579317

artikkel kogumikus

248

artikkel ajakirjas

Londoni kiirabi automaatse edastussüsteemi läbikukkumine 1992. aastalNestor, TriinA & A2007 / 5, lk. 18-27 https://artiklid.elnet.ee/record=b1021106*est

artikkel ajakirjas

249

artikkel kogumikus

Machine learning clustering techniques for selective mitigation of critical design featuresLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, LucaProceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition2020 / 7 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159751

artikkel kogumikus

250

artikkel kogumikus

Machine learning to tackle the challenges of transient and soft errors in complex circuitsLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece2019 / p. 7-14 : ill https://doi.org/10.1109/IOLTS.2019.8854423

artikkel kogumikus

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