prindi

High-level test generation for processing elements in many-core systems

autor
Oyeniran, Adeboye Stephen
Ubar, Raimund-Johannes
Azad, Siavoosh Payandeh
Raik, Jaan
vastutusandmed
Adeboye Stephen Oyeniran, Raimund Ubar, Siavoosh Payandeh Azad, Jaan Raik
allikas
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
ilmumiskoht
[S.l.]
kirjastus/väljaandja
IEEE
ilmumisaasta
2017
leheküljed
8 p. : ill
konverentsi nimetus, aeg
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017
konverentsi toimumispaik
Madrid, Spain
leitav
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
märksõna
tarkvaraarendus
tarkvara
testimine
rikked
võtmesõna
processor core testing
high-level control faults
test generation
high-level fault coverage
fault redundancy
ISBN
978-1-5386-3344-1/17
märkused
Bibliogr.: 29 ref
TTÜ struktuuriüksus
arvutisüsteemide instituut
keel
inglise
Oyeniran, A.S., Ubar, R., Azad, S.P., Raik, J. High-level test generation for processing elements in many-core systems // 12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings. [S.l.] : IEEE, 2017. 8 p. : ill. http://dx.doi.org/10.1109/ReCoSoC.2017.8016156