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201

artikkel ajakirjas

Hierarchical approaches to test generation and fault simulationUbar, Raimund-JohannesRadioelectronics and informatics2003 / p. 204

artikkel ajakirjas

202

artikkel kogumikus

Hierarchical calculation of malicious faults for evaluating the fault-toleranceUbar, Raimund-Johannes; Devadze, Sergei; Jenihhin, Maksim; Raik, Jaan; Jervan, Gert; Ellervee, PeeterProceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China2008 / p. 222-227 : ill https://ieeexplore.ieee.org/document/4459544

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203

artikkel kogumikus

Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patternsUbar, Raimund-Johannes; Jutman, ArturProceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 19991999 / p. 437-442 : ill https://www.sciencedirect.com/science/article/pii/S0026271499002036

artikkel kogumikus

204

artikkel kogumikus

Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Evartson, Teet; Lensen, Harri; Aarna, Margit5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada2007 / [6] p. [CD-ROM]

artikkel kogumikus

205

artikkel kogumikus

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

artikkel kogumikus

206

artikkel kogumikus

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

artikkel kogumikus

207

artikkel kogumikus

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

artikkel kogumikus

208

artikkel kogumikus

High level fault modeling in digital systemsUbar, Raimund-Johannes; Aarna, Margit; Brik, Marina; Raik, JaanSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 486-491

artikkel kogumikus

209

artikkel kogumikus

High-frequency current sensor for power network on-line mea[s]urementsKütt, Lauri; Järvik, Jaan; Vaimann, Toomas; Shafiq, Muhammad; Lehtonen, Matti; Kilter, JakoProceedings of the 13th International Scientific Conference Electric Power Engineering 2012 : EPE 2012 : Brno. Vol. 12012 / p. 367-371 : ill https://www.researchgate.net/publication/262674502_High-Frequency_Current_Sensor_for_Power_Network_On-line_Measurements

artikkel kogumikus

210

artikkel kogumikus

High-level decision diagram based fault models for targeting FSMsRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 353-358 : ill http://dx.doi.org/10.1109/DSD.2006.60

artikkel kogumikus

211

artikkel kogumikus

High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

artikkel kogumikus

212

artikkel kogumikus

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

artikkel kogumikus

213

artikkel kogumikus

High-level functional test generation for microprocessor modulesOyeniran, Adeboye Stephen; Ubar, Raimund-JohannesProceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 20192019 / p. 356-361 : ill https://doi.org/10.23919/MIXDES.2019.8787131

artikkel kogumikus

214

artikkel kogumikus

High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445

artikkel kogumikus

215

artikkel kogumikus

High-level path activation technique to speed up sequential circuit test generationRaik, Jaan; Ubar, Raimund-JohannesEuropean Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany1999 / p. 84-89 : ill https://ieeexplore.ieee.org/document/804289

artikkel kogumikus

216

artikkel kogumikus

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

artikkel kogumikus

217

artikkel kogumikus

High-speed logic level fault simulationUbar, Raimund-Johannes; Devadze, SergeiDesign and test technology for dependable systems-on-chip2011 / p. 310-335 : ill https://www.igi-global.com/chapter/high-speed-logic-level-fault/51407

artikkel kogumikus

218

artikkel kogumikus

Hilbert transform, an effective replacement of Park's vector modulus for the detection of rotor faultsAsad, Bilal; Vaimann, Toomas; Kallaste, Ants; Rassõlkin, Anton; Belahcen, Anouar2019 Electric Power Quality and Supply Reliability Conference (PQ) & 2019 Symposium on Electrical Engineering and Mechatronics (SEEM), Kärdla, Estonia, June 12-15, 2019 : proceedings2019 / 4 p. : ill https://doi.org/10.1109/PQ.2019.8818227

artikkel kogumikus

219

artikkel ajalehes

Hispaania stsenaarium: miks elektrisüsteemid ootamatult kustuvadLandsberg, Martpostimees.ee2025 https://tehnika.postimees.ee/8239729/eksperdi-ulevaade-hispaania-stsenaarium-miks-elektrisusteemid-ootamatult-kustuvad

artikkel ajalehes

220

artikkel ajakirjas

Holistic approach for Fault-Tolerant Network-on-Chip based many-core systems [Online resource]Azad, Siavoosh Payandeh; Niazmand, Behrad; Raik, Jaan; Jervan, Gert; Hollstein, ThomasarXiv.org2016 / [8] p. : ill

artikkel ajakirjas

221

dissertatsioon

Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseksOrasson, Elmet2007 https://www.ester.ee/record=b2305436*est

dissertatsioon

222

artikkel kogumikus

Hybrid FEA-Simulink modelling of permanent magnet assisted synchronous reluctance motor with unbalanced magnet fluxPando-Acedo, Jaime; Rassõlkin, Anton; Lehikoinen, Antti; Vaimann, Toomas; Kallaste, Ants; Romero-Cadaval, Enrique; Belahcen, Anouar2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), 27-30 Aug. 2019, Toulouse, France : proceedings2019 / p. : 174-180 : ill https://doi.org/10.1109/DEMPED.2019.8864925

artikkel kogumikus

223

artikkel ajakirjas EST / artikkel ajakirjas ENG

Identification and location of PD defects in medium voltage underground power cables using high frequency current transformerShafiq, Muhammad; Kiitam, Ivar; Taklaja, Paul; Kütt, Lauri; Kauhaniemi, Kimmo; Palu, IvoIEEE Access2019 / art. 8771171, p. 103608 - 103618 : ill https://doi.org/10.1109/ACCESS.2019.2930704 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

224

artikkel kogumikus

Impact of faults and different operating conditions on current parameters in case of broken rotor barsKudelina, Karolina21st International Symposium "Topical problems in the field of electrical and power engineering. Doctoral school of energy and geotechnology. III" : Pärnu, Estonia, June 15-18, 20222022 / p. 41-42 : ill https://www.ester.ee/record=b5504019*est

artikkel kogumikus

225

artikkel ajakirjas

Implementation of protection features for a modular bidirectional solid-state battery disconnectorDsa, Daniel; Chinnusamy, Abhinav; Banavath, Satish Naik; Carvalho da Silva, Edivan LaercioIEEE journal of emerging and selected topics in power electronics2024 https://doi.org/10.1109/JESTPE.2024.3502157

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