Otsing - TalTech teadusportaal

kuva

reasta

99501

artikkel kogumikus

Test driven domain modellingPiho, Gunnar; Tepandi, Jaak; Parman, Marko; Puusep, Viljam; Roost, MartMIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings2011 / p. 576-581 https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5967121

artikkel kogumikus

99502

artikkel ajakirjas EST / artikkel ajakirjas ENG

A test for the generic strong-accessibility of meromorphic nonlinear systemsCarravetta, Francesco; Sarafrazi, Mohammad Amin; Bartosiewicz, Zbigniew; Kotta, ÜlleIEEE transactions on automatic control2020 / p. 867-873 https://doi.org/10.1109/TAC.2019.2921645 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

99503

raamat

Test für praktische deutsche GrammatikLomakina, Valentina1987 https://www.ester.ee/record=b2170574*est

raamat

99504

artikkel kogumikus

Test generation : a hierarchical approachJervan, Gert; Ubar, Raimund-Johannes; Peng, Z.; Eles, PetruSystem-level test and validation of hardware/software systems2005 / p. 67-81 : ill

artikkel kogumikus

99505

artikkel ajakirjas

Test generation and knowledge base browsing facilities in expert system shell HELIParmakson, PriitTallinna Tehnikaülikooli Toimetised1991 / lk. 26-40: ill

artikkel ajakirjas

99506

artikkel kogumikus

Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill

artikkel kogumikus

99507

artikkel kogumikus

Test generation for digital systemsUbar, Raimund-JohannesDigest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy1983 / p. 374-377

artikkel kogumikus

99508

artikkel kogumikus

Test generation for digital systems at functional levelUbar, Raimund-Johannes; Kuchcinski, Ktzysztof; Peng, Z.Research report LiTH-IDA-R-90-06, Linköping University, Sweden1990 / p. 1-21

artikkel kogumikus

99509

artikkel kogumikus

Test generation for digital systems based on alternative graphsUbar, Raimund-JohannesDependable Computing - EDCC-1 : First European Dependable Computing Conference, Berlin, Germany, October 1994 : proceedings1994 / p. 151-164: ill

artikkel kogumikus

99510

artikkel ajakirjas

Test generation for expert systems with fuzzy truth valuesTepandi, JaakBulletin for studies and exchanges in fuzziness and its applications1989 / p. 83-92

artikkel ajakirjas

99511

artikkel kogumikus

Test generation for finite state machinesUbar, Raimund-Johannes; Brik, MarinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 233-236: ill

artikkel kogumikus

99512

artikkel kogumikus

Test generation for microprocessor control mechanismsLohuaru, Tõnu; Ubar, Raimund-JohannesFTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)1987 / p. 305-311

artikkel kogumikus

99513

artikkel kogumikus

Test generation for microprocessors on alternative graphsAlango, Villem; Kont, Toomas; Ubar, Raimund-Johannes33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik1988 / p. 11-14

artikkel kogumikus

99514

artikkel kogumikus

Test generation for sequential digital systems based on symbolic simulationSkobtsov, Vadim; Skobtsov, Yu.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 341-344: ill

artikkel kogumikus

99515

artikkel kogumikus

Test generation techniques and algorithmsUbar, Raimund-Johannes; Gramatova, Elena; Fisherova, MariaHandbook of testing electronic systems2005 / p. 99-173 : ill

artikkel kogumikus

99516

artikkel kogumikus

Test generation with structurally synthesized BDD modelsRaik, Jaan; Ubar, Raimund-JohannesProceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 19981998 / p. 66-68

artikkel kogumikus

99517

artikkel kogumikus

Test method for determining radiation absorptivity and emissivity coefficients of ACSR conductorsKiitam, Ivar18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]2019 / p. 185-186 : ill https://www.ester.ee/record=b5183874*est

artikkel kogumikus

99518

artikkel ajakirjas

Test method for the total content of non-volatile phenols in wastewaterJohannes, Ille; Mölder, Leevi; Tiikma, LaineOil shale1998 / 3, p. 232-238

artikkel ajakirjas

99519

artikkel ajakirjas

Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocolsBengtsson, Tomas; Kumar, Shashi; Ubar, Raimund-Johannes; Jutman, Artur; Peng, ZeboIET computers and digital techniques2008 / 6, p. 445-460 https://www.diva-portal.org/smash/record.jsf?dswid=-5073&aq2=%5B%5B%5D%5D&c=39&af=%5B%5D&searchType=SIMPLE&sortOrder2=title_sort_asc&language=en&pid=diva2%3A290043&aq=%5B%5B%7B%22personId%22%3A%22authority-person%3A23389%22%7D%5D%5D&sf=all&aqe=%5B%5D&sortOrder=author_sort_asc&onlyFullText=false&noOfRows=50

artikkel ajakirjas

99520

artikkel kogumikus

Test methods for determination of design parameters for fastenersFranke, Steffen; Franke, Bettina; Tuhkanen, EeroDesign of connections in timber structures : a state-of-the-art report by COST action FP1402/WG32018 / p. 33–59 : ill https://www.costfp1402.tum.de/fileadmin/w00btl/www/All_Members/Sandhaas__C.__Munch-Andersen__J._Dietsch__P.__Design_of_Connections_in_Timber_Structures.pdf

artikkel kogumikus

99521

artikkel kogumikus

Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148

artikkel kogumikus

99522

artikkel kogumikus

Test pattern generation for microprocessor systems on the alternative graph modelUbar, Raimund-JohannesProceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 19831985 / p. 403-410

artikkel kogumikus

99523

dissertatsioon

Test program generation for microprocessor systemsDušina, Julia1993 https://www.ester.ee/record=b2090526*est

dissertatsioon

99524

artikkel kogumikus

Test results of practical value-centric business development methodologyRandmaa, Merili; Otto, Tauno; Howard, Thomas J.Proceedings of NordDesign 2014 Conference2014 / p. 642-651 : ill

artikkel kogumikus

99525

artikkel kogumikus

Test scenario generator learning for model-based testing of mobile robotsKanter, Gert; Liibert, Marti IngmarSystem assurances : modeling and management2022 / p. 67-84 https://doi.org/10.1016/B978-0-323-90240-3.00005-9

artikkel kogumikus

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