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Short-circuit fault detection and remedial in full-bridge rectifier of series resonant DC-DC converter based on inductor voltage signatureBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings2020 / 6 p. : ill https://doi.org/10.1109/RTUCON51174.2020.9316482

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Seotud publikatsioonid 1

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Special session : approximation and fault resiliency of DNN acceleratorsAhmadilivani, Mohammad Hasan; Barbareschi, Mario; Barone, Salvatore; Bosio, Alberto; Daneshtalab, Masoud; Torca, Salvatore Della; Gavarini, Gabriele; Jenihhin, Maksim; Raik, Jaan; Taheri, MahdiProceedings 2023 IEEE 41st VLSI Test Symposium (VTS)2023 / 10 p. : ill https://doi.org/10.1109/VTS56346.2023.10140043 Conference proceeding at Scopus Article at Scopus Article at WOS

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Special session: reliability assessment recipes for DNN acceleratorsAhmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Dos Santos, Fernando Fernandes; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Sierra, Robert Limas; Raik, Jaan; Taheri, Mahdi42nd IEEE VLSI Test Symposium, VTS 20242024 / 11 p. : ill https://doi.org/10.1109/VTS60656.2024.10538707 Conference proceedings at Scopus Article at Scopus Article at WOS

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Study of MOSFET post-fault operation in fault-tolerant DC-DC convertersBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2022 IEEE 7th International Energy Conference (ENERGYCON)2022 / Code 181231, 5 p https://doi.org/10.1109/ENERGYCON53164.2022.9830216

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Seotud publikatsioonid 1

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Supply chain quality improvement based on customer complianceMaas, Rene; Shevtshenko, Eduard; Karaulova, TatjanaTechnological Innovation for Connected Cyber Physical Spaces : 14th IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2023, Caparica, Portugal, July 5–7, 2023 : proceedings2023 / p. 230 - 242 https://doi.org/10.1007/978-3-031-36007-7_17 Conference Proceedings at Scopus Article at Scopus

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Using STLs for effective in-field test of GPUsRodriguez Condia, Josie E.; Da Silva, Felipe Augusto; Bagbaba, Ahmet Cagrl; Guerrero-Balaguera, Juan-David; Hamdioui, Said; Sauer, Christian; Reorda, Matteo SonzaIEEE Design and Test2023 / p. 109-117 https://doi.org/10.1109/MDAT.2022.3188573 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Wear-out failure analysis of solar optiverter operating with 60- and 72-cell Si crystalline PV modulesLiivik, Liisa; Chub, Andrii; Sangwongwanich, Ariya; Shen, Yanfeng; Vinnikov, Dmitri; Blaabjerg, FredeIECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society : proceedings2018 / p. 6134-6140 : ill https://doi.org/10.1109/IECON.2018.8592925

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