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26

artikkel kogumikus

Execution of dataflow process networks on OpenCL platformsLund, Wictor; Kanur, Sudeep; Ersfolk, Johan; Tsiopoulos, Leonidas23rd Euromicro International Conference on Parallel, Distributed, and Network-Based Processing : PDP 2015 : 4-6 March 2015, Turku, Finland : proceedings2015 / p. 618-625 : ill https://doi.org/10.1109/PDP.2015.29

artikkel kogumikus
27

artikkel kogumikus

Experimental analysis of cost optimization for electrical floor heating systems in volatile energy marketsUuemaa, Madis; Uleksin, Taaniel; Tammoja, Heiki2017 International Conference on Control, Artificial Intelligence, Robotics & Optimization (ICCAIRO), 20-22 May 2017 : proceedings2017 / p. 177-181 http://doi.ieeecomputersociety.org/10.1109/ICCAIRO.2017.42

artikkel kogumikus
28

artikkel kogumikus

Explaining the decisions of deep learning models for load disaggregation (NILM) based on XAIMachlev, Ram; Malka, Asaf; Perl, Michael; Levron, Yoash; Belikov, Juri2022 IEEE Power & Energy Society General Meeting (PESGM)2022 / art. 183865 , p. 1-5 : ill https://doi.org/10.1109/PESGM48719.2022.9917049

artikkel kogumikus
29

artikkel kogumikus

Fast test cost calculation for hybrid BIST in digital systemsOrasson, Elmet; Raidma, Rein; Ubar, Raimund-Johannes; Jervan, Gert; Peng, ZeboEuromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings2001 / p. 318-325 : ill https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f

artikkel kogumikus
30

artikkel kogumikus

Fault diagnosis in integrated circuits with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Evartson, Teet; Lensen, Harri10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 604-610 : ill http://dx.doi.org/10.1109/DSD.2007.4341530

artikkel kogumikus
31

artikkel kogumikus

Fault-tolerant scheduling of mixed-critical applications on multi-processor platformsBagheri, Mehrdad; Jervan, Gert2014 International Conference on Embedded and Ubiquitous Computing : EUC 2014 : 26-28 August 2014, Milano, Italy : proceedings2014 / p. 25-32 : ill

artikkel kogumikus
32

artikkel kogumikus

Formalization of finite state machines with data path for the verification of high-level synthesisBorrione, Dominique; Dušina, Julia; Pierre, LaurenceXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 99-102: ill

artikkel kogumikus
33

artikkel kogumikus

FP7 collaborative research project DIAMOND : diagnosis, error modeling and correction for reliable systems designRaik, JaanProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p https://ieeexplore.ieee.org/document/6233052

artikkel kogumikus
34

artikkel kogumikus

Functional built-in self-test for processor cores in SoCUbar, Raimund-Johannes; Indus, Viljar; Kalmend, Oliver; Evartson, Teet; Orasson, Elmet30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 20122012 / p. 1-4 : ill

artikkel kogumikus
35

artikkel kogumikus

Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault modelUbar, Raimund-Johannes; Borrione, DominiqueXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 51-54

artikkel kogumikus
36

artikkel kogumikus

Heuristics for designing and evaluating socio-technical agent-oriented behaviour models with Coloured Petri NetsMahunnah, Msury; Norta, Alexander; Ma, Lixin; Taveter, KuldarIEEE 38th Annual International Computers, Software and Applications Conference Workshops : 27-29 July 2014, Västerås, Sweden : proceedings2014 / p. 438-443 : ill

artikkel kogumikus
37

artikkel kogumikus

Hierarchical analysis of short defects between metal lines in CMOS ICPleskacz, Witold A.; Jenihhin, Maksim; Raik, Jaan; Rakowski, Michal; Ubar, Raimund-Johannes; Kuzmicz, WieslawProceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy2008 / p. 729-734 : ill https://ieeexplore.ieee.org/document/4669309

artikkel kogumikus
38

artikkel kogumikus

Hierarchical calculation of malicious faults for evaluating the fault-toleranceUbar, Raimund-Johannes; Devadze, Sergei; Jenihhin, Maksim; Raik, Jaan; Jervan, Gert; Ellervee, PeeterProceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China2008 / p. 222-227 : ill https://ieeexplore.ieee.org/document/4459544

artikkel kogumikus
39

artikkel kogumikus

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings2000 / p. 69-74 : ill

artikkel kogumikus
40

artikkel kogumikus

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

artikkel kogumikus
41

artikkel kogumikus

High-level decision diagram based fault models for targeting FSMsRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 353-358 : ill http://dx.doi.org/10.1109/DSD.2006.60

artikkel kogumikus
42

artikkel kogumikus

A hybrid BIST architecture and its optimization for SoC testingJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Kruus, HelenaProceedings of the 3rd International Symposium on Quality Electronic Design : ISQED 2002, March 18-21, 2002, San Jose, California2002 / p. 273-279 : ill https://ieeexplore.ieee.org/document/996750

artikkel kogumikus
43

artikkel kogumikus

Hybrid BIST optimization for core-based systems with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboDELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : 28-30 January 2004, Perth, Australia : proceedings2004 / p. 3-8 : ill https://ieeexplore.ieee.org/document/1409808

artikkel kogumikus
44

artikkel kogumikus

Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-Johannes10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 596-603 : ill http://dx.doi.org/10.1109/DSD.2007.4341529

artikkel kogumikus
45

artikkel kogumikus

Hybrid BIST time minimization for core-based systems with STUMPS architectureJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 November 2003, Boston, Massachusetts : proceedings2003 / p. 225-232 : ill https://ieeexplore.ieee.org/document/1250116

artikkel kogumikus
46

artikkel kogumikus

IaaS platforms : how secure are they?Astrova, Irina; Koschel, Arne; Henke, Mats LennartIEEE 30th International Conference on Advanced Information Networking and Applications Workshops : WAINA 2016 : 23-25 March 2016, Crans-Montana, Switzerland : proceedings2016 / p. 843-848 : ill https://doi.org/10.1109/WAINA.2016.22

artikkel kogumikus
47

artikkel kogumikus

Implementation of address-based data sorting on different FPGA platformsSudnitsõn, Aleksander; Mihhailov, Dmitri; Sklyarov, Valery; Skliarova, IouliiaProceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 20122012 / p. 38-41

artikkel kogumikus
48

artikkel kogumikus

Improved fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 72-78 : ill

artikkel kogumikus
49

artikkel kogumikus

Information processing for mass-customized clothing productionElbrecht, Pirjo; Palm, Knut-Joosep2016 IEEE Tenth International Conference on Semantic Computing : 3-5 February 2016, Laguna Hills, California : proceedings2016 / p. 362-365 : ill https://doi.org/10.1109/ICSC.2016.51

artikkel kogumikus
50

artikkel kogumikus

Integrated design and test generation under Internet based environment MOSCITOSchneider, Andre; Ivask, Eero; Ubar, Raimund-JohannesEuromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings2002 / p. 187-194 : ill http://dx.doi.org/10.1109/DSD.2002.1115368

artikkel kogumikus

Kirjeid leitud 85, kuvan 26 - 50

eelmine
1
2
3
4
järgmine

1. ageing society
2. civil society
3. civil-society
4. Community Statistics on Information Society (CSIS)
5. computer
6. computer aided design
7. computer aided diagnosis
8. computer aided diagnostics
9. computer aided instruction
10. computer aided manufacturing
11. computer aided testing
12. computer algebra
13. computer algebra system
14. computer and education
15. computer anxiety
16. computer architecture
17. computer assisted language learning
18. computer based learning
19. computer circuits
20. computer control
21. computer education
22. computer engineering
23. computer engineerng
24. computer game
25. computer graphics
26. computer hardware
27. computer integrated manufacturing
28. computer network management
29. computer network operations
30. computer networks
31. computer pipelines
32. computer programming
33. computer programs
34. computer science
35. computer science basics
36. computer science education
37. computer security
38. computer simulation
39. computer simulation environments
40. computer simulations
41. computer software
42. computer softwaregraph theory
43. computer systems
44. Computer systems organization
45. computer terminals
46. computer vision
47. computer workers
48. computer-aided anthropometry
49. computer-aided architectural design (CAAD)
50. computer‐aided assessment
51. computer-aided design
52. computer-aided detection
53. computer‐aided detection
54. computer-aided diagnosis
55. computer-aided drawing (CAD)
56. computer-aided engineering
57. computer-aided teaching
58. Computer-Aided Tuning
59. computer-aided tuning (CAT)
60. computer-assisted language learning (CALL)
61. computer-oriented technologies
62. computer-supported decision-making
63. computer-use
64. control engineering computer applications
65. digital economy and society index (DESI)
66. digital society
67. distributed computer systems
68. education in computer engineering
69. energy and society
70. European Society of Cardiology
71. European Society of hypertension
72. fifth generation computer
73. gateways (computer networks)
74. harmony society
75. high-performance computer systems
76. human computer interaction
77. human computer interaction (HCI)
78. human-computer interaction
79. Human-Computer Interaction (HCI)
80. human-computer trust
81. Ict and society
82. information society
83. innovative society
84. interactive computer graphics
85. Internet society
86. laptop computer
87. law and society
88. logic in computer science
89. logic in society
90. open society
91. science-policy-society interface
92. single board computer
93. single-board computer
94. society
95. society-in-the-loop framework
96. stateless society
97. structure computer analysis
98. The International Society For Engineering Pedagogy
99. ubiquitous computer technology
100. Web and computer-based learning
101. world society
102. IEEE 1149.1
103. IEEE 1687
104. IEEE 802.15.6
105. IEEE 802156
106. IEEE 9 bus test system
107. IEEE C37.118.1
108. IEEE P1687
109. IEEE Std. 1687
110. 24th IEEE International Conference on Industrial Technology 2023

1. Baltic Atherosclerosis Society
2. Baltic Computer Systems
3. Estonian Summer School on Computer and Systems Science, 2023
4. European Society of Hypertension
5. International Peatland Society
6. International Society for Engineering Pedagogy (IGIP)
7. National Computer Security Incident Response Teams (N-CSIRTs)
8. IEEE

1. IEEE

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