Otsing - TalTech teadusportaal

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reasta

1

dissertatsioon

AC measurement converters : analog and digital solutionsMärtens, Olev2000 http://www.ester.ee/record=b1707866*est

dissertatsioon

2

artikkel kogumikus

AG-model for design of testable controllersKasirova, LiliaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 303-306: ill

artikkel kogumikus

3

artikkel kogumikus

Algorithms for hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Klüver, B.Proceedings of the 10th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2003 : Lodz, Poland, 26-28 June 20032003 / p. 530-535 : ill

artikkel kogumikus

4

artikkel kogumikus

Alternative graph based test design in digital systemsUbar, Raimund-JohannesProceedings of 11. NORCHIP seminar, Trondheim, Nov. 9-10, 19931993 / p. 48-62

artikkel kogumikus

5

artikkel kogumikus

Alternative graphs and test pattern design in digital systemsUbar, Raimund-JohannesProc. of the 6th Workshop on New Directions for Testing, Montreal, Canada, May 20-22, 19921992

artikkel kogumikus

6

artikkel kogumikus

Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systemsUbar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 285-292: ill

artikkel kogumikus

7

artikkel kogumikus

An educational environment for digital testing : hardware, tools, and web-based runtime platformJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes; Vislogubov, VladislavProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 412-419 : ill https://www.researchgate.net/profile/Artur-Jutman/publication/220880167_An_Educational_Environment_for_Digital_Testing_Hardware_Tools_and_Web-Based_Runtime_Platform/links/02e7e53c3c71b0b2a7000000/An-Educational-Environment-for-Digital-Testing-Hardware-Tools-and-Web-Based-Runtime-Platform.pdf

artikkel kogumikus

8

artikkel kogumikus

Applying FPGA partial reconfiguration for digital system simulationArhipov, Anton; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 145-148 : ill

artikkel kogumikus

9

artikkel kogumikus

Asynchronous e-learning resources for hardware design issuesJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the International Conference on Computer Systems and Technologies (e-learning) : CompSysTech'04 : Rousse, Bulgaria, 17-18 June2004 / p. IV.11-1 - IV.11-6 : ill https://www.researchgate.net/publication/234797327_Asynchronous_e-learning_resources_for_hardware_design_issues

artikkel kogumikus

10

artikkel kogumikus

At-speed on-chip diagnosis of board-level interconnect faultsJutman, ArturNinth IEEE European Test Symposium : ETS 2004 : 23-26 May 2004, Corsica, France : proceedings2004 / p. 2-7 : ill https://www.researchgate.net/publication/4098807_At-speed_on-chip_diagnosis_of_board-level_interconnect_faults

artikkel kogumikus

11

dissertatsioon

At-speed testing and test quality evaluation for high-performance pipelined systems Töökiirusel testimine ja testi kvaliteedi hindamine kõrgjõudlus-konveierarhitektuuriga süsteemideleGorev, Maksim2015 https://digi.lib.ttu.ee/i/?3953

dissertatsioon

12

artikkel kogumikus

Automated correction of design errors by edge redirection on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, Jaan13th International Symposium on Quality Electronic Design (ISQED), 20122012 / p. 686-693 : ill https://ieeexplore.ieee.org/document/6113980

artikkel kogumikus

13

artikkel kogumikus

Automated test bench generation for high-level synthesis flow ABELITEViilukas, Taavi; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Baranov, SamaryProceedings of IEEE East-West Design & Test Symposium (EWDTS'2011) : Sevastopol, Ukraine, September 9-12, 20112011 / p. 13-16 : ill https://ieeexplore.ieee.org/document/6116601

artikkel kogumikus

14

artikkel kogumikus

Back-traced deductive-parallel fault simulation for digital systemsHahanov, Vladimir; Ubar, Raimund-Johannes; Hyduke, StanleyProceedings : Euromicro Symposium on Digital System Design : Belek-Antalya, Turkey, September 1st to 6th, 20032003 / p. 370-377 : ill https://ieeexplore.ieee.org/document/1231969

artikkel kogumikus

15

artikkel kogumikus

Berechnung von tests für die Fehlerdiagnose in DigitalsystemUbar, Raimund-JohannesInternationales wissenschaftliches Kolloquium, 21. 1. November bis 5. November 1976, H. 2: Vortragsreihe A 2: Entwurf, Analyse und Einsatz von informationsverarbeitenden Systemen: IWK1976 / p. [?]

artikkel kogumikus

16

artikkel kogumikus

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

artikkel kogumikus

17

artikkel kogumikus

Built-in self diagnosis with multiple signature analyzers in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 29-34 : ill

artikkel kogumikus

18

artikkel kogumikus

CAD für Digitaltechnik - eine Programmfamilie für den Entwurf von Testmustern zum Test von DigitalschaltungenUbar, Raimund-JohannesIBM Hochschulkongress '92: Offene Grenzen - offene Systeme, Dresden, 30.09-2.10.19921992 / S.IV9 1-14

artikkel kogumikus

19

artikkel ajakirjas EST / artikkel ajakirjas ENG

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

20

artikkel ajakirjas

Combining functional and structural approaches in test generation for digital systemsUbar, Raimund-JohannesMicroelectronics reliability1998 / 3, p. 317-329 : ill

artikkel ajakirjas

21

artikkel kogumikus

Comparison of two approaches to improve functional BIST fault coverageKostin, Sergei; Ubar, Raimund-Johannes; Gorev, Maksim; Mägi, GunnarBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 105-108 : ill

artikkel kogumikus

22

artikkel kogumikus

Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

artikkel kogumikus

23

artikkel kogumikus

A constraint-driven gate-level test generatorRaik, Jaan; Ubar, Raimund-Johannes; Jervan, Gert; Krupnova, HelenaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 237-240: ill

artikkel kogumikus

24

artikkel kogumikus

Constraints analysis in hierarchical test generation for digital systemsUbar, Raimund-Johannes; Krupnova, HelenaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 313-318: ill

artikkel kogumikus

25

artikkel ajakirjas

Decision diagrams - from a mathematical notion to engineering applicationsStankovic, Radomir S.; Ubar, Raimund-Johannes; Astola, JaakkoFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 281-301 : ill http://dx.doi.org/10.2298/FUEE1103281S

artikkel ajakirjas

digitaaltehnika (märksõna)

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